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Results:
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Results: 22
Authors:
Durand, O
Berger, V
Bisaro, R
Bouchier, A
De Rossi, A
Marcadet, X
Prevot, I
Citation: O. Durand et al., Determination of thicknesses and interface roughnesses of GaAs-based and InAs/AlSb-based heterostructures by X-ray reflectometry, MAT SC S PR, 4(1-3), 2001, pp. 327-330
Authors:
Prevot, I
Marcadet, X
Durand, O
Bisaro, R
Julien, FH
Citation: I. Prevot et al., Optical and structural investigation of InAs/AlSb/GaSb heterostructures, OPT MATER, 17(1-2), 2001, pp. 193-195
Authors:
Maurice, JL
Durand, O
Bouzehouane, K
Contour, JP
Citation: Jl. Maurice et al., XRD and TEM characterization of cuprate thin films epitaxially grown on SrTiO3 (001) vicinal surfaces, PHYSICA C, 351(1), 2001, pp. 5-8
Authors:
Defives, D
Durand, O
Wyczisk, F
Noblanc, O
Brylinski, C
Meyer, F
Citation: D. Defives et al., Electrical behaviour and microstructural analysis of metal Schottky contacts on 4H-SiC, MICROEL ENG, 55(1-4), 2001, pp. 369-374
Authors:
Berger, S
Crete, DG
Contour, JP
Bouzehouane, K
Maurice, JL
Durand, O
Citation: S. Berger et al., Relative pinning strength of twin boundaries and outgrowths in YBa2Cu3O7 thin films and superlattices - art. no. 144506, PHYS REV B, 6314(14), 2001, pp. 4506
Authors:
Prevot, I
Marcadet, X
Durand, O
Bisaro, R
Bouchier, A
Julien, FH
Citation: I. Prevot et al., Characterisation and optimisation of MBE grown arsenide/antimonide interfaces, J CRYST GR, 227, 2001, pp. 566-570
Authors:
Couvert, C
Contour, JP
Durand, O
Lemaitre, Y
Marcilhac, B
Woodall, P
Citation: C. Couvert et al., Effect of ultra-thin SrTiO3 seed layer on the microwave surface resistanceof YBa2Cu3O7 films deposited on (100) MgO, J ELECTROCE, 4(2-3), 2000, pp. 319-325
Authors:
Lyonnet, R
Khodan, A
Barthelemy, A
Contour, JP
Durand, O
Maurice, JL
Michel, D
De Teresa, J
Citation: R. Lyonnet et al., Pulsed laser deposition of Zr1-xCexO2 and Ce1-xLaxO2-x/2 for buffer layersand insulating barrier in oxide heterostructures, J ELECTROCE, 4(2-3), 2000, pp. 369-377
Authors:
Khodan, AN
Contour, JP
Michel, D
Durand, O
Akimov, AG
Kazansky, LP
Citation: An. Khodan et al., Heteroepitaxial growth of ZrO2-CeO2 thin films on Si (001) substrates, EPJ-APPL PH, 9(2), 2000, pp. 97-104
Authors:
Durand, O
Grolier-Mazza, V
Frey, R
Citation: O. Durand et al., Nonlinear scattering of light induced by carbon black in pulsed systems ....., J PHYS IV, 10(P8), 2000, pp. 79-86
Authors:
Durand, O
Olivier, J
Bisaro, R
Galtier, P
Kruger, JK
Citation: O. Durand et al., X-ray diffraction analysis of the residual stresses in self-supported CVD diamond films, J PHYS IV, 10(P10), 2000, pp. 171-183
Authors:
Durand, O
Bisaro, R
Brierley, CJ
Galtier, P
Kennedy, GR
Kruger, JK
Olivier, J
Citation: O. Durand et al., Residual stresses in chemical vapor deposition free-standing diamond filmsby X-ray diffraction analyses, MAT SCI E A, 288(2), 2000, pp. 217-222
Authors:
Khodan, AN
Contour, JP
Michel, D
Durand, O
Lyonnet, R
Mihet, M
Citation: An. Khodan et al., ZrO2-CeO2 and CeO2-La2O3 film growth on oxide substrates and their applications in oxide heterostructures, J CRYST GR, 209(4), 2000, pp. 828-841
Authors:
Kruger, JK
Embs, JP
Lukas, S
Hartmann, U
Brierley, CJ
Beck, CM
Jimenez, R
Alnot, P
Durand, O
Citation: Jk. Kruger et al., Spatial and angle distribution of internal stresses in nano- and microstructured chemical vapor deposited diamond as revealed by Brillouin spectroscopy, J APPL PHYS, 87(1), 2000, pp. 74-77
Authors:
Leo, G
Caldarella, C
Masini, G
De Rossi, A
Assanto, G
Durand, O
Calligaro, M
Marcadet, X
Berger, V
Citation: G. Leo et al., X-ray and optical characterization of multilayer AlGaAs waveguides, APPL PHYS L, 77(24), 2000, pp. 3884-3886
Authors:
Contour, JP
Couvert, C
Durand, O
Lemaitre, Y
Lyonnet, R
Marcilhac, B
Citation: Jp. Contour et al., Suppression of the "notch effect" in microwave surface resistance in YBa2Cu3O7 films on MgO (100) substrate by deposition of ultra-thin SrTiO3 seed layers (vol 5, pg 3, 1999), EPJ-APPL PH, 5(2), 1999, pp. 215-215
Authors:
Contour, JP
Couvert, C
Durand, O
Lemaitre, Y
Lyonnet, R
Marcilhac, B
Citation: Jp. Contour et al., Suppression of the "notch effect" in microwave surface resistance in YBa2Cu3O7 films on MgO (100) substrate by deposition of ultra-thin SrTiO3 seed layers, EPJ-APPL PH, 5(1), 1999, pp. 3-8
Authors:
Durand, O
Grolier-Mazza, V
Citation: O. Durand et V. Grolier-mazza, Temporal and angular analysis of nonlinear scattering in carbon-black suspensions in water and ethanol, J OPT SOC B, 16(9), 1999, pp. 1431-1438
Authors:
Bliard, C
Durand, O
Massiot, G
Citation: C. Bliard et al., Comparative reactivity of the three glucosyl -OH positions 2-, 3-, and 6-,during esterification and saponification of starch by NMR spectroscopy of partially deutero-acetylated material, COLLOQ INRA, (91), 1999, pp. 93-98
Authors:
Farber, E
Djordjevic, S
Bontemps, N
Durand, O
Contour, JP
Deutscher, G
Citation: E. Farber et al., Penetration depth variation in high quality YBaCuO thin films, J L TEMP PH, 117(3-4), 1999, pp. 515-519
Authors:
Durand, O
Olivier, J
Bisaro, R
Galtier, P
Kruger, JK
Brierley, CJ
Kennedy, GR
Citation: O. Durand et al., Macroscopic residual stress in chemical-vapor-deposition free-standing diamond films by x-ray diffraction analyses, APPL PHYS L, 75(13), 1999, pp. 1881-1883
Authors:
Durand, O
Brochard, P
Grolier-Mazza, V
Citation: O. Durand et al., Nonlinear scattering by suspended carbon particles applied to optical breakdown, ANN PHYSIQ, 23, 1998, pp. 157-158
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