Authors:
King, WP
Kenny, TW
Goodson, KE
Cross, G
Despont, M
Durig, U
Rothuizen, H
Binnig, GK
Vettiger, P
Citation: Wp. King et al., Atomic force microscope cantilevers for combined thermomechanical data writing and reading, APPL PHYS L, 78(9), 2001, pp. 1300-1302
Authors:
Schirmeisen, A
Cross, G
Stalder, A
Grutter, P
Durig, U
Citation: A. Schirmeisen et al., Metallic adhesion forces and tunneling between atomically defined tip and sample, APPL SURF S, 157(4), 2000, pp. 274-279
Authors:
Shubeita, GT
Sekatskii, SK
Riedo, B
Dietler, G
Durig, U
Citation: Gt. Shubeita et al., Scanning near-field optical microscopy based on the heterodyne phase-controlled oscillator method, J APPL PHYS, 88(5), 2000, pp. 2921-2927
Authors:
Jarvis, SP
Lantz, MA
Durig, U
Tokumoto, H
Citation: Sp. Jarvis et al., Off resonance ac mode force spectroscopy and imaging with an atomic force microscope, APPL SURF S, 140(3-4), 1999, pp. 309-313
Citation: U. Durig, Relations between interaction force and frequency shift in large-amplitudedynamic force microscopy, APPL PHYS L, 75(3), 1999, pp. 433-435