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Results:
1-11
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Results: 11
Authors:
Malac, M
Egerton, RF
Citation: M. Malac et Rf. Egerton, Thin-film regular-array structures with 10-100 nm repeat distance, NANOTECHNOL, 12(1), 2001, pp. 11-13
Authors:
Malac, M
Egerton, RF
Citation: M. Malac et Rf. Egerton, Observations of the microscopic growth mechanism of pillars and helices formed by glancing-angle thin-film deposition, J VAC SCI A, 19(1), 2001, pp. 158-166
Authors:
Gilbert, B
Margaritondo, G
Douglas, S
Nealson, KH
Egerton, RF
Rempfer, GF
De Stasio, G
Citation: B. Gilbert et al., XANES microspectroscopy of biominerals with photoconductive charge compensation, J ELEC SPEC, 114, 2001, pp. 1005-1011
Authors:
Zhu, Y
Egerton, RF
Malac, M
Citation: Y. Zhu et al., Concentration limits for the measurement of boron by electron energy-loss spectroscopy and electron-spectroscopic imaging, ULTRAMICROS, 87(3), 2001, pp. 135-145
Authors:
Dick, B
Brett, MJ
Smy, TJ
Freeman, MR
Malac, M
Egerton, RF
Citation: B. Dick et al., Periodic magnetic microstructures by glancing angle deposition, J VAC SCI A, 18(4), 2000, pp. 1838-1844
Authors:
Malac, M
Egerton, RF
Citation: M. Malac et Rf. Egerton, Calibration specimens for determining energy-dispersive X-ray k-factors ofboron, nitrogen, oxygen, and fluorine, MICROS MICR, 5(1), 1999, pp. 29-38
Authors:
Malac, M
Egerton, RF
Brett, MJ
Dick, B
Citation: M. Malac et al., Fabrication of submicrometer regular arrays of pillars and helices, J VAC SCI B, 17(6), 1999, pp. 2671-2674
Authors:
Rauf, IA
Siemsen, R
Grunwell, M
Egerton, RF
Sayer, M
Citation: Ia. Rauf et al., Gas-phase nucleation during chemical vapor deposition of copper films and its effect on the resistivity of deposited films, J MATER RES, 14(11), 1999, pp. 4345-4350
Authors:
Egerton, RF
Rauf, I
Citation: Rf. Egerton et I. Rauf, Dose-rate dependence of electron-induced mass loss from organic specimens, ULTRAMICROS, 80(4), 1999, pp. 247-254
Authors:
Egerton, RF
Citation: Rf. Egerton, Spatial resolution of nanostructural analysis by electron energy-loss spectroscopy and energy-filtered imaging, J ELEC MICR, 48(6), 1999, pp. 711-716
Authors:
Egerton, RF
Takeuchi, M
Citation: Rf. Egerton et M. Takeuchi, Radiation damage to fullerite (C-60) in the transmission electron microscope, APPL PHYS L, 75(13), 1999, pp. 1884-1886
Risultati:
1-11
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