Authors:
VERPOORT F
PERSOON P
FIERMANS L
DEDONCKER G
VERDONCK L
Citation: F. Verpoort et al., SIO2 SI(100) MODEL SUPPORT WITH AES AND XPS IN COMBINATION WITH MLCFA/, Journal of the Chemical Society. Faraday transactions, 93(19), 1997, pp. 3555-3562
Authors:
VANDRIESSCHE I
PERSYN F
FIERMANS L
HOSTE S
Citation: I. Vandriessche et al., A STATISTICAL PLACKETT-BURMAN DESIGN OF THE THERMAL-PROCESS IN THE SYNTHESIS OF THE BI-2223 HTSC, Superconductor science and technology, 9(10), 1996, pp. 843-848
Citation: K. Devriendt et al., X-RAY PHOTOELECTRON FORWARD SCATTERING AND SINGLE SCATTERING CLUSTER CALCULATIONS FOR V2O5(001), Solid state communications, 100(7), 1996, pp. 481-485
Authors:
VERCAEMST R
POELMAN D
FIERMANS L
VANMEIRHAEGHE RL
LAFLERE WH
CARDON F
Citation: R. Vercaemst et al., A DETAILED XPS STUDY OF THE RARE-EARTH COMPOUNDS EUS AND EUF3, Journal of electron spectroscopy and related phenomena, 74(1), 1995, pp. 45-56
Authors:
VERPOORT F
DEDONCKER G
BOSSUYT AR
FIERMANS L
VERDONCK L
Citation: F. Verpoort et al., ANGLE-RESOLVED AND DEPTH PROFILING XPS INVESTIGATION OF A MONOLAYER NIOBIUM OXIDE CATALYST, Journal of electron spectroscopy and related phenomena, 73(3), 1995, pp. 271-281
Authors:
VERCAEMST R
POELMAN D
VANMEIRHAEGHE RL
FIERMANS L
LAFLERE WH
CARDON F
Citation: R. Vercaemst et al., AN XPS STUDY OF THE DOPANTS VALENCE STATES AND THE COMPOSITION OF CAS1-XSEXEU AND SRS1-XSEXCE THIN-FILM ELECTROLUMINESCENT DEVICES, Journal of luminescence, 63(1-2), 1995, pp. 19-30
Authors:
VERPOORT F
FIERMANS L
BOSSUYT AR
VERDONCK L
Citation: F. Verpoort et al., OLEFIN METATHESIS CATALYST .1. ANGLE-RESOLVED AND DEPTH PROFILING XPSSTUDY OF TUNGSTEN-OXIDE ON SILICA, Journal of molecular catalysis, 90(1-2), 1994, pp. 43-52
Citation: H. Poelman et L. Fiermans, X-RAY PHOTOELECTRON FORWARD SCATTERING STUDY OF VANADIUM-OXIDES, Solid state communications, 92(8), 1994, pp. 669-673