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Citation: M. Sambi et G. Granozzi, POLARIZATION EFFECTS TO ENHANCE SURFACE SENSITIVITY OF ANGLE-SCANNED X-RAY PHOTOELECTRON DIFFRACTION IN SYNCHROTRON-RADIATION-BASED EXPERIMENTS, Surface science, 415(3), 1998, pp. 1007-1015
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Citation: M. Sambi et al., GROWTH AND THE STRUCTURE OF EPITAXIAL VO2 AT THE TIO2(110) SURFACE, Physical review. B, Condensed matter, 55(12), 1997, pp. 7850-7858
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Citation: A. Glisenti et al., AN X-RAY PHOTOELECTRON-SPECTROSCOPY STUDY OF THE SURFACE-COMPOSITION OF COXFE80-XSI10B10 METALLIC GLASSES, Journal of alloys and compounds, 226(1-2), 1995, pp. 213-221
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Citation: R. Bertoncello et al., ANGLE-RESOLVED X-RAY PHOTOELECTRON-SPECTROSCOPY CONTRIBUTION TO ELUCIDATION OF THE MECHANISM OF CATHODIC DEPOSITION OF AS-SB ALLOYS, Journal of electroanalytical chemistry [1992], 374(1-2), 1994, pp. 37-43
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Citation: M. Sambi et al., ANGLE-SCANNED PHOTOELECTRON DIFFRACTION CHEMISORPTION STUDY OF C(2X2)-O ON NI(1-ML) CU(100), Surface science, 321(3), 1994, pp. 214-218
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Citation: M. Sambi et al., AN ANGLE-SCANNED PHOTOELECTRON DIFFRACTION STUDY ON THE SURFACE RELAXATION OF ZNO(0001), Surface science, 319(1-2), 1994, pp. 149-156
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Citation: M. Sambi et al., AN ANGLE-SCANNED PHOTOELECTRON DIFFRACTION STUDY ON THE SURFACE RELAXATION OF ZNO(0001), Surface science, 319(1-2), 1994, pp. 149-156
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