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Results: 1-12 |
Results: 12
STUDY ON OPTICAL-EFFICIENCY OF ALTERNATING-CURRENT THIN-FILM ELECTROLUMINESCENT DEVICES
Authors: YE YH ZHANG JY GU PF TANG JF
Citation: Yh. Ye et al., STUDY ON OPTICAL-EFFICIENCY OF ALTERNATING-CURRENT THIN-FILM ELECTROLUMINESCENT DEVICES, Thin solid films, 315(1-2), 1998, pp. 251-256
STUDY ON THE WO3 DRY LITHIATION FOR ALL-SOLID-STATE ELECTROCHROMIC DEVICES
Authors: YE YH ZHANG JY GU PF TANG JF
Citation: Yh. Ye et al., STUDY ON THE WO3 DRY LITHIATION FOR ALL-SOLID-STATE ELECTROCHROMIC DEVICES, Solar energy materials and solar cells, 46(4), 1997, pp. 349-355
ELECTROCHROMISM OF TITANIUM-OXIDE THIN-FILMS
Authors: YE YH ZHANG JY GU PF LIU X TANG JF
Citation: Yh. Ye et al., ELECTROCHROMISM OF TITANIUM-OXIDE THIN-FILMS, Thin solid films, 298(1-2), 1997, pp. 197-199
LOW-VOLTAGE THIN-FILM ELECTROLUMINESCENT DEVICES WITH LOW-RESISTIVITYSTACKED INSULATORS
Authors: ZHANG JY GU PF LIU X TANG JF
Citation: Jy. Zhang et al., LOW-VOLTAGE THIN-FILM ELECTROLUMINESCENT DEVICES WITH LOW-RESISTIVITYSTACKED INSULATORS, Applied optics, 36(3), 1997, pp. 545-550
OPTICAL MODIFIED SIGNED-DIGIT ADDITION MODULE BASED ON BOOLEAN POLARIZATION-ENCODED LOGIC ALGEBRA
Authors: WANG B YU FH LIU X GU PF TANG JF
Citation: B. Wang et al., OPTICAL MODIFIED SIGNED-DIGIT ADDITION MODULE BASED ON BOOLEAN POLARIZATION-ENCODED LOGIC ALGEBRA, Optical engineering, 35(10), 1996, pp. 2989-2994
ESTIMATION OF OPTICAL-CONSTANTS OF THIN-FILM BY THE USE OF ARTIFICIALNEURAL NETWORKS
Authors: MA YS LIU X GU PF TANG JF
Citation: Ys. Ma et al., ESTIMATION OF OPTICAL-CONSTANTS OF THIN-FILM BY THE USE OF ARTIFICIALNEURAL NETWORKS, Applied optics, 35(25), 1996, pp. 5035-5039
THIN-FILM POLARIZATION COLOR-SELECTIVE BEAMSPLITTER
Authors: GU PF LIU X LI HF ZHENG ZD TANG JF
Citation: Pf. Gu et al., THIN-FILM POLARIZATION COLOR-SELECTIVE BEAMSPLITTER, Thin solid films, 268(1-2), 1995, pp. 137-139
ANTIREFLECTION COATINGS ON KC1 SINGLE-CRYSTAL WINDOWS WITH LOW OPTICAL LOSS
Authors: ATANASSOV G POPOV D GU PF
Citation: G. Atanassov et al., ANTIREFLECTION COATINGS ON KC1 SINGLE-CRYSTAL WINDOWS WITH LOW OPTICAL LOSS, Thin solid films, 261(1-2), 1995, pp. 256-262
LASER-INDUCED DAMAGE RESISTANCE OF THIN-FILM POLARIZERS PREPARED BY ION-ASSISTED DEPOSITION
Authors: GU PF TANG JF
Citation: Pf. Gu et Jf. Tang, LASER-INDUCED DAMAGE RESISTANCE OF THIN-FILM POLARIZERS PREPARED BY ION-ASSISTED DEPOSITION, Optics letters, 19(2), 1994, pp. 81-83
SPECTROPHOTOMETER FOR MEASURING SPECTRAL REFLECTANCE AND TRANSMITTANCE
Authors: WU PY GU PF TANG JF
Citation: Py. Wu et al., SPECTROPHOTOMETER FOR MEASURING SPECTRAL REFLECTANCE AND TRANSMITTANCE, Applied optics, 33(10), 1994, pp. 1975-1979
SIMULATION OF THIN-FILM GROWTH
Authors: XIA MH LIU X GU PF
Citation: Mh. Xia et al., SIMULATION OF THIN-FILM GROWTH, Applied optics, 32(28), 1993, pp. 5443-5446
INFRARED OPTICAL-ABSORPTION LOSS OF ANTIREFLECTION COATINGS ON GERMANIUM AND POTASSIUM-CHLORIDE SUBSTRATES AT THE 10-MU-M WAVELENGTH BY THEPHOTOTHERMAL DEFLECTION TECHNIQUE
Authors: LIU X ATANASSOV G GU PF SAO Q TANG JF
Citation: X. Liu et al., INFRARED OPTICAL-ABSORPTION LOSS OF ANTIREFLECTION COATINGS ON GERMANIUM AND POTASSIUM-CHLORIDE SUBSTRATES AT THE 10-MU-M WAVELENGTH BY THEPHOTOTHERMAL DEFLECTION TECHNIQUE, Applied optics, 32(28), 1993, pp. 5645-5648
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