Authors:
BUIJS M
HABERERN KW
MARSHALL T
GAINES JM
LAW KK
BAUDE PF
MILLER TJ
HAASE MA
HAUGEN GM
Citation: M. Buijs et al., DEVICE CHARACTERISTICS OF GREEN II-VI SEMICONDUCTOR-LASERS, Materials science & engineering. B, Solid-state materials for advanced technology, 43(1-3), 1997, pp. 49-54
Authors:
CHAO LL
CARGILL GS
KOTHANDARAMAN C
MARSHALL T
SNOEKS E
BUIJS M
HABERERN K
PETRUZZELLO J
HAUGEN GM
LAW KK
Citation: Ll. Chao et al., ACTIVATION-ENERGY OF NONRADIATIVE PROCESSES IN DEGRADED II-VI LASER-DIODES, Applied physics letters, 70(5), 1997, pp. 535-537
Citation: Ms. Goorsky et al., NONDESTRUCTIVE ANALYSIS OF STRUCTURAL DEFECTS IN WIDE BANDGAP II-VI HETEROSTRUCTURES, Journal of electronic materials, 25(2), 1996, pp. 235-238
Authors:
LAW KK
BAUDE PF
MILLER TJ
HAASE MA
HAUGEN GM
SMEKALIN K
Citation: Kk. Law et al., ROOM-TEMPERATURE CONTINUOUS-WAVE OPERATION OF BLUE-GREEN CDZNSSE ZNSSE QUANTUM-WELL LASER-DIODES/, Electronics Letters, 32(4), 1996, pp. 345-346
Authors:
BUIJS M
HABERERN K
MARSHALL T
LAW KK
BAUDE PF
MILLER TJ
HAASE MA
HAUGEN GM
HORIKX J
Citation: M. Buijs et al., DEPENDENCE OF LIFETIME OF II-VI SEMICONDUCTOR-LASERS ON OUTPUT POWER FOR DIFFERENT MOUNTING CONFIGURATIONS, Electronics Letters, 32(14), 1996, pp. 1290-1291
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BAUDE PF
HAASE MA
HAUGEN GM
LAW KK
MILLER TJ
SMEKALIN K
PHILLIPS J
BHATTACHARYA P
Citation: Pf. Baude et al., CONDUCTION-BAND OFFSETS IN CDZNSSE ZNSSE SINGLE QUANTUM-WELLS MEASURED BY DEEP-LEVEL TRANSIENT SPECTROSCOPY/, Applied physics letters, 68(25), 1996, pp. 3591-3593
Authors:
WU BJ
HAUGEN GM
DEPUYDT JM
KUO LH
SALAMANCARIBA L
Citation: Bj. Wu et al., MOLECULAR-BEAM EPITAXY OF LOW DEFECT DENSITY (LESS-THAN-OR-EQUAL-TO-1X10(4)CM(-2)) ZNSSE ON GAAS, Applied physics letters, 68(20), 1996, pp. 2828-2830
Authors:
KUO LH
SALAMANCARIBA L
WU BJ
HAUGEN GM
DEPUYDT JM
HOFLER G
CHENG H
Citation: Lh. Kuo et al., GENERATION OF DEGRADATION DEFECTS, STACKING-FAULTS, AND MISFIT DISLOCATIONS IN ZNSE-BASED FILMS GROWN ON GAAS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(4), 1995, pp. 1694-1704
Authors:
UREN GD
HAUGEN GM
BAUDE PF
HAASE MA
LAW KK
MILLER TJ
WU BJ
Citation: Gd. Uren et al., TRANSMISSION ELECTRON-MICROSCOPY OF (100) DARK LINE DEFECTS IN CDZNSEQUANTUM-WELL STRUCTURES, Applied physics letters, 67(26), 1995, pp. 3862-3864