Citation: T. Lacoste et al., CONTRAST ENHANCEMENT USING POLARIZATION-MODULATION SCANNING NEAR-FIELD OPTICAL MICROSCOPY (PM-SNOM), Ultramicroscopy, 71(1-4), 1998, pp. 333-340
Authors:
HUSER T
LACOSTE T
HEINZELMANN H
KITZEROW HS
Citation: T. Huser et al., SCANNING NEAR-FIELD OPTICAL MICROSCOPY OF CHOLESTERIC LIQUID-CRYSTALS, The Journal of chemical physics, 108(18), 1998, pp. 7876-7880
Authors:
FREYLAND JM
ECKERT R
HUSER T
RODRIGUESHERZOG R
HEINZELMANN H
Citation: Jm. Freyland et al., A COMBINED CONFOCAL AND SCANNING NEAR-FIELD OPTICAL MICROSCOPE AS AN ANALYSIS TOOL IN LIFE SCIENCES, Helvetica Physica Acta, 71, 1998, pp. 19-20
Authors:
POHL DW
BACH H
BOPP MA
DECKERT V
DESCOUTS P
ECKERT R
GUNTHERODT HJ
HAFNER C
HECHT B
HEINZELMANN H
HUSER T
JOBIN M
KELLER U
LACOSTE T
LAMBELET P
MARQUISWEIBLE F
MARTIN OJF
MEIXNER AJ
NECHAY B
NOVOTNY L
PFEIFFER M
PHILIPONA C
PLAKHOTNIK T
RENN A
SAYAH A
SEGURA JM
SICK B
SIEGNER U
TARRACH G
VAHLDIECK R
WILD UP
ZEISEL D
ZENOBI R
Citation: Dw. Pohl et al., OPTICAL MICROSCOPY IN THE NANO-WORLD, Chimia, 51(10), 1997, pp. 760-767
Authors:
HEINZELMANN H
LACOSTE T
HUSER T
GUNTHERODT HJ
HECHT B
POHL DW
Citation: H. Heinzelmann et al., INSTRUMENTAL DEVELOPMENTS AND RECENT EXPERIMENTS IN NEAR-FIELD OPTICAL MICROSCOPY, Thin solid films, 273(1-2), 1996, pp. 149-153
Citation: Dw. Pohl et al., RADIATION COUPLING AND IMAGE-FORMATION IN SCANNING NEAR-FIELD OPTICALMICROSCOPY, Thin solid films, 273(1-2), 1996, pp. 161-167
Authors:
HEINZELMANN H
HUSER T
LACOSTE T
GUNTHERODT HJ
POHL DW
HECHT B
NOVOTNY L
MARTIN OJF
HAFNER CV
BAGGENSTOS H
WILD UP
RENN A
Citation: H. Heinzelmann et al., SCANNING NEAR-FIELD OPTICAL MICROSCOPY IN BASEL, RUSCHLIKON, AND ZURICH, Optical engineering, 34(8), 1995, pp. 2441-2454
Authors:
GUTMANNSBAUER W
HUSER T
LACOSTE T
HEINZELMANN H
GUNTHERODT HJ
Citation: W. Gutmannsbauer et al., SCANNING NEAR-FIELD OPTICAL MICROSCOPY (SNOM) AND ITS APPLICATION IN MINERALOGY, Schweizerische Mineralogische und Petrographische Mitteilungen, 75(2), 1995, pp. 259-264
Citation: Gm. Mcclelland et al., THE FEMTOSECOND FIELD-EMISSION CAMERA, A DEVICE FOR CONTINUOUS OBSERVATION OF THE MOTION OF INDIVIDUAL ADSORBED ATOMS AND MOLECULES, IBM journal of research and development, 39(6), 1995, pp. 669-680
Citation: H. Heinzelmann et al., OBSERVING THE MOTION OF A SINGLE ADSORBED ATOM WITH PICOSECOND AND SUBNANOMETER RESOLUTION, Physical review letters, 70(23), 1993, pp. 3611-3614