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Results: 1-10 |
Results: 10
Transition between regular and Mach reflection of shock waves: new numerical and experimental results
Authors: Ivanov, MS Vandromme, D Fomin, VM Kudryavtsev, AN Hadjadj, A Khotyanovsky, DV
Citation: Ms. Ivanov et al., Transition between regular and Mach reflection of shock waves: new numerical and experimental results, SHOCK WAVES, 11(3), 2001, pp. 199-207
Crystallization of nanostructured silicon films deposited under a low-pressure argon-silane pulsed-glow discharge: Correlation with the plasma duration
Authors: Hadjadj, A Beorchia, A Boufendi, L Huet, S Cabarrocas, PRI
Citation: A. Hadjadj et al., Crystallization of nanostructured silicon films deposited under a low-pressure argon-silane pulsed-glow discharge: Correlation with the plasma duration, J VAC SCI A, 19(1), 2001, pp. 124-129
Effects of the substrate temperature on the growth and properties of hydrogenated nanostructured silicon thin films
Authors: Hadjadj, A Beorchia, A Cabarrocas, PRI Boufendi, L Huet, S Bubendorff, JL
Citation: A. Hadjadj et al., Effects of the substrate temperature on the growth and properties of hydrogenated nanostructured silicon thin films, J PHYS D, 34(5), 2001, pp. 690-699
Fowler-Nordheim conduction in polysilicon (n(+))-oxide-silicon (p) structures: Limit of the classical treatment in the barrier height determination
Authors: Hadjadj, A Salace, G Petit, C
Citation: A. Hadjadj et al., Fowler-Nordheim conduction in polysilicon (n(+))-oxide-silicon (p) structures: Limit of the classical treatment in the barrier height determination, J APPL PHYS, 89(12), 2001, pp. 7994-8001
Role of the surface roughness in laser induced crystallization of nanostructured silicon films
Authors: Hadjadj, A Boufendi, L Huet, S Schelz, S Cabarrocas, PRI Estrade-Szwarckopf, H Rousseau, B
Citation: A. Hadjadj et al., Role of the surface roughness in laser induced crystallization of nanostructured silicon films, J VAC SCI A, 18(2), 2000, pp. 529-535
The image force effect on the barrier height in MOS structures: correlation of the corrected barrier height with temperature and the oxide thickness
Authors: Salace, G Hadjadj, A Petit, C Ziane, D
Citation: G. Salace et al., The image force effect on the barrier height in MOS structures: correlation of the corrected barrier height with temperature and the oxide thickness, MICROEL REL, 40(4-5), 2000, pp. 763-766
Influence of vaporization by a water reservoir on flows through a corrugated duct
Authors: Maamir, S Zeghmati, B Hadjadj, A Rondot, D
Citation: S. Maamir et al., Influence of vaporization by a water reservoir on flows through a corrugated duct, CAN J CH EN, 78(2), 2000, pp. 293-303
Effect of two sinusoidal protuberances on natural convection in a verticalconcentric annulus
Authors: Hadjadj, A El Kyal, M
Citation: A. Hadjadj et M. El Kyal, Effect of two sinusoidal protuberances on natural convection in a verticalconcentric annulus, NUM HEAT A, 36(3), 1999, pp. 273-289
A new study of laminar natural convection in two concentric vertical cylinders
Authors: Hadjadj, A Maamir, S Zeghmati, B
Citation: A. Hadjadj et al., A new study of laminar natural convection in two concentric vertical cylinders, HEAT MASS T, 35(2), 1999, pp. 113-121
Temperature dependence of the electron affinity difference between Si and SiO2 in polysilicon (n(+))-oxide-silicon (p) structures: Effect of the oxide thickness
Authors: Salace, G Hadjadj, A Petit, C Jourdain, M
Citation: G. Salace et al., Temperature dependence of the electron affinity difference between Si and SiO2 in polysilicon (n(+))-oxide-silicon (p) structures: Effect of the oxide thickness, J APPL PHYS, 85(11), 1999, pp. 7768-7773
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