Citation: Gd. Hu et al., Low-temperature preparation and characterization of SrBi2Ta2O9 thin films on (100)-oriented LaNiO3 electrodes, APPL PHYS L, 76(13), 2000, pp. 1758-1760
Authors:
Xie, Z
Luo, EZ
Peng, HB
Zhao, BR
Hu, GD
Wilson, IH
Xu, JB
Zhao, LH
Citation: Z. Xie et al., Studies of leakage current inhomogeneity of Pb(Zr, Ti)O-3/YBa2Cu3Ox heterostructures on a nanometer scale, J NON-CRYST, 254, 1999, pp. 112-117
Authors:
Hu, GD
Wilson, IH
Xu, JB
Cheung, WY
Wong, SP
Wong, HK
Citation: Gd. Hu et al., Structure control and characterization of SrBi2Ta2O9 thin films by a modified annealing method (vol 74, pg 1221, 1999), APPL PHYS L, 75(14), 1999, pp. 2151-2151
Citation: Gd. Hu et al., Domain imaging and local piezoelectric properties of the (200)-predominantSrBi2Ta2O9 thin film, APPL PHYS L, 75(11), 1999, pp. 1610-1612
Authors:
Hu, GD
Wilson, IH
Xu, JB
Cheung, WY
Wong, SP
Wong, HK
Citation: Gd. Hu et al., Structure control and characterization of SrBi2Ta2O9 thin films by a modified annealing method, APPL PHYS L, 74(9), 1999, pp. 1221-1223
Authors:
Hu, GD
Xu, JB
Wilson, IH
Cheung, WY
Ke, N
Wong, SP
Citation: Gd. Hu et al., Effects of a Bi4Ti3O12 buffer layer on SrBi2Ta2O9 thin films prepared by the metalorganic decomposition, APPL PHYS L, 74(24), 1999, pp. 3711-3713