Authors:
Bolch, WE
Farfan, EB
Huh, C
Huston, TE
Bolch, WE
Citation: We. Bolch et al., Influences of parameter uncertainties within the ICRP 66 respiratory tractmodel: Particle deposition, HEALTH PHYS, 81(4), 2001, pp. 378-394
Authors:
Huh, C
Kim, SW
Kim, HS
Kim, HM
Hwang, H
Park, SJ
Citation: C. Huh et al., Effects of sulfur treatment on electrical and optical performance of InGaN/GaN multiple-quantum-well blue light-emitting diodes, APPL PHYS L, 78(12), 2001, pp. 1766-1768
Authors:
Kim, MH
Lee, SN
Huh, C
Park, SY
Han, JY
Seo, JM
Park, SJ
Citation: Mh. Kim et al., Interfacial reaction and Fermi level movement induced by sequentially deposited metals on GaN: Au/Ni/GaN, PHYS REV B, 61(16), 2000, pp. 10966-10971
Citation: C. Huh et Sj. Park, Atomic force microscope tip-induced anodization of titanium film for nanofabrication of oxide patterns, J VAC SCI B, 18(1), 2000, pp. 55-59
Authors:
Huh, C
Kim, HS
Kim, SW
Lee, JM
Kim, DJ
Lee, IH
Park, SJ
Citation: C. Huh et al., InGaN/GaN multiple quantum well light-emitting diodes with highly transparent Pt thin film contact on p-GaN, J APPL PHYS, 87(9), 2000, pp. 4464-4466
Citation: C. Huh et al., Effective sulfur passivation of an n-type GaN surface by an alcohol-based sulfide solution, J APPL PHYS, 87(9), 2000, pp. 4591-4593
Authors:
Huh, C
Kang, CH
Lee, HW
Nakamura, H
Mishima, M
Tsuno, Y
Yamataka, H
Citation: C. Huh et al., Thermodynamic stabilities and resonance demand of aromatic radical anions in the gas phase, B CHEM S J, 72(5), 1999, pp. 1083-1091