Citation: F. Adams et al., MICROSCOPIC X-RAY-FLUORESCENCE ANALYSIS AND RELATED METHODS WITH LABORATORY AND SYNCHROTRON-RADIATION SOURCES - PLENARY LECTURE, Journal of analytical atomic spectrometry, 13(5), 1998, pp. 319-331
Authors:
JANSSENS K
VINCZE L
VEKEMANS B
ADAMS F
HALLER M
KNOCHEL A
Citation: K. Janssens et al., USE OF LEAD-GLASS CAPILLARIES FOR MICRO-FOCUSING OF HIGHLY-ENERGETIC (O-60 KEV) SYNCHROTRON-RADIATION, Journal of analytical atomic spectrometry, 13(5), 1998, pp. 339-350
Authors:
VINCZE L
JANSSENS K
ADAMS F
RINDBY A
ENGSTROM P
Citation: L. Vincze et al., INTERPRETATION OF CAPILLARY GENERATED SPATIAL AND ANGULAR-DISTRIBUTIONS OF X-RAYS - THEORETICAL MODELING AND EXPERIMENTAL-VERIFICATION USING THE EUROPEAN SYNCHROTRON-RADIATION FACILITY OPTICAL BEAM LINE, Review of scientific instruments, 69(10), 1998, pp. 3494-3503
Citation: A. Rindby et al., THE USE OF A SCANNING-X-RAY MICROPROBE FOR SIMULTANEOUS XRF XRD STUDIES OF FLY-ASH PARTICLES/, Journal of synchrotron radiation, 4, 1997, pp. 228-235
Authors:
ADAMS F
ADRIAENS A
AERTS A
DERAEDT I
JANSSENS K
SCHALM O
Citation: F. Adams et al., MICRO AND SURFACE-ANALYSIS IN ART AND ARCHAEOLOGY - PLENARY LECTURE, Journal of analytical atomic spectrometry, 12(3), 1997, pp. 257-265
Citation: A. Rindby et al., MICRODISTRIBUTION OF HEAVY-ELEMENTS IN HIGHLY INHOMOGENEOUS PARTICLESGENERATED FROM MU-BEAM XRF XRD ANALYSIS/, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 124(4), 1997, pp. 591-604
Authors:
JANSSENS K
VEKEMANS B
VINCZE L
ADAMS F
RINDBY A
Citation: K. Janssens et al., A MICRO-XRF SPECTROMETER BASED ON A ROTATING ANODE GENERATOR AND CAPILLARY OPTICS, Spectrochimica acta, Part B: Atomic spectroscopy, 51(13), 1996, pp. 1661-1678
Authors:
JANSSENS K
VEKEMANS B
ADAMS F
VANESPEN P
MUTSAERS P
Citation: K. Janssens et al., ACCURATE EVALUATION OF MU-PIXE AND MU-XRF SPECTRAL DATA THROUGH ITERATIVE LEAST-SQUARES FITTING, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 109, 1996, pp. 179-185
Authors:
JANSSENS K
AERTS A
VINCZE L
ADAMS F
YANG C
UTUI R
MALMQVIST K
JONES KW
RADTKE M
GARBE S
LECHTENBERG F
KNOCHEL A
WOUTERS H
Citation: K. Janssens et al., CORROSION PHENOMENA IN ELECTRON, PROTON AND SYNCHROTRON X-RAY MICROPROBE ANALYSIS OF ROMAN GLASS FROM QUMRAN, JORDAN, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 109, 1996, pp. 690-695
Authors:
VINCZE L
JANSSENS K
ADAMS F
RIVERS ML
JONES KW
Citation: L. Vincze et al., A GENERAL MONTE-CARLO SIMULATION OF ED-XRF SPECTROMETERS .2. POLARIZED MONOCHROMATIC RADIATION, HOMOGENEOUS SAMPLES, Spectrochimica acta, Part B: Atomic spectroscopy, 50(2), 1995, pp. 127-147
Authors:
VEKEMANS B
JANSSENS K
VINCZE L
ADAMS F
VANESPEN P
Citation: B. Vekemans et al., COMPARISON OF SEVERAL BACKGROUND COMPENSATION METHODS USEFUL FOR EVALUATION OF ENERGY-DISPERSIVE X-RAY-FLUORESCENCE SPECTRA, Spectrochimica acta, Part B: Atomic spectroscopy, 50(2), 1995, pp. 149-169
Citation: L. Vincze et al., A GENERAL MONTE-CARLO SIMULATION OF ENERGY-DISPERSIVE X-RAY-FLUORESCENCE SPECTROMETERS .3. POLARIZED POLYCHROMATIC RADIATION, HOMOGENEOUS SAMPLES, Spectrochimica acta, Part B: Atomic spectroscopy, 50(12), 1995, pp. 1481-1500
Authors:
JANSSENS K
VINCZE L
RUBIO J
ADAMS F
BERNASCONI G
Citation: K. Janssens et al., MICROSCOPIC X-RAY-FLUORESCENCE ANALYSIS INVITED LECTURE, Journal of analytical atomic spectrometry, 9(3), 1994, pp. 151-157
Authors:
VEKEMANS B
JANSSENS K
VINCZE L
ADAMS F
VANESPEN P
Citation: B. Vekemans et al., ANALYSIS OF X-RAY-SPECTRA BY ITERATIVE LEAST-SQUARES (AXIL) - NEW DEVELOPMENTS, X-ray spectrometry, 23(6), 1994, pp. 278-285
Citation: L. Vincze et al., A GENERAL MONTE-CARLO SIMULATION OF ENERGY-DISPERSIVE X-RAY-FLUORESCENCE SPECTROMETERS .1. UNPOLARIZED RADIATION, HOMOGENEOUS SAMPLES, Spectrochimica acta, Part B: Atomic spectroscopy, 48(4), 1993, pp. 553-573
Citation: K. Janssens et al., MONTE-CARLO SIMULATION OF CONVENTIONAL AND SYNCHROTRON ENERGY-DISPERSIVE X-RAY SPECTROMETERS, X-ray spectrometry, 22(4), 1993, pp. 234-243