Citation: A. Crosland et J. Kai, THEY THINK THEY CAN TALK TO NURSES - PRACTICE NURSES VIEWS OF THEIR ROLES IN CARING FOR MENTAL-HEALTH PROBLEMS, British journal of general practice, 48(432), 1998, pp. 1383-1386
Authors:
MIKAMO H
KAWAZOE K
SATO Y
HAYASAKI Y
SATOH M
KAI J
TAMAYA T
Citation: H. Mikamo et al., IN-VITRO BACTERICIDAL ACTIVITIES AND MORPHOLOGIC CHANGES IN ESCHERICHIA-COLI AND BACTEROIDES-FRAGILIS BY CEPHALOSPORINS, Chemotherapy, 44(3), 1998, pp. 157-163
Authors:
YASUDA H
ARAI S
KAI J
OOAE Y
ABE T
MARUYAMA S
KIUCHI T
Citation: H. Yasuda et al., MULTIELECTRON BEAM BLANKING APERTURE ARRAY SYSTEM SYNAPSE-2000, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(6), 1996, pp. 3813-3820
Citation: J. Kai, WHAT WORRIES PARENTS WHEN THEIR PRESCHOOL-CHILDREN ARE ACUTELY ILL, AND WHY - A QUALITATIVE STUDY, BMJ. British medical journal, 313(7063), 1996, pp. 983-986
Citation: J. Kai, PARENTS DIFFICULTIES AND INFORMATION NEEDS IN COPING WITH ACUTE ILLNESS IN PRESCHOOL-CHILDREN - A QUALITATIVE STUDY, BMJ. British medical journal, 313(7063), 1996, pp. 987-990
Authors:
KAI J
NAKAMURA K
MASUDA T
UEDA I
FUJIWARA H
Citation: J. Kai et al., THERMODYNAMIC ASPECTS OF HYDROPHOBICITY AND THE BLOOD-BRAIN-BARRIER PERMEABILITY STUDIES WITH A GEL-FILTRATION CHROMATOGRAPHY, Journal of medicinal chemistry, 39(13), 1996, pp. 2621-2624
Citation: T. Tsuchiya et al., HOT-CARRIER-INJECT OXIDE REGION IN FRONT AND BACK INTERFACES IN ULTRA-THIN (50 NM), FULLY DEPLETED, DEEP-SUBMICRON NMOS AND PMOSFETS SIMOX AND THEIR HOT-CARRIER IMMUNITY/, I.E.E.E. transactions on electron devices, 41(12), 1994, pp. 2351-2356
Citation: M. Itsumi et J. Kai, IN-SITU OBSERVATION SYSTEM FOR SILICON-WAFER TRANSIENT DEFORMATION DURING INSERTION WITHDRAWAL INTO FROM HORIZONTAL FURNACES, Journal of the Electrochemical Society, 141(5), 1994, pp. 1299-1303
Authors:
SAKAMOTO K
FUEKI S
YAMAZAKI S
ABE T
KOBAYASHI K
NISHINO H
SATOH T
TAKEMOTO A
OOKURA A
OHNO M
SAGOH S
OAE Y
YAMADA A
KAI J
YASUDA H
Citation: K. Sakamoto et al., ELECTRON-BEAM BLOCK EXPOSURE SYSTEM FOR 256M DYNAMIC RANDOM-ACCESS MEMORY LITHOGRAPHY, JPN J A P 1, 32(12B), 1993, pp. 6006-6011
Authors:
YASUDA H
ARAI S
KAI J
OOAE Y
ABE T
TAKAHASHI Y
HUEKI S
MARUYAMA S
SAGO S
BETSUI K
Citation: H. Yasuda et al., FAST-ELECTRON BEAM LITHOGRAPHY SYSTEM WITH 1024 BEAMS INDIVIDUALLY CONTROLLED BY BLANKING APERTURE ARRAY, JPN J A P 1, 32(12B), 1993, pp. 6012-6017
Citation: M. Itsumi et J. Kai, 4 TYPES AND ORIGINS OF TRANSIENT SI WAFER DEFORMATION WITH FURNACE INSERTION AND WITHDRAWAL, JPN J A P 1, 32(12A), 1993, pp. 5468-5472
Authors:
KIUCHI T
YAMADA A
TAKAHASHI Y
OAE Y
NAKANO M
KAI J
YASUDA H
KAWASHIMA K
Citation: T. Kiuchi et al., ACCURACY OF EXPOSURE DURING CONTINUOUS STAGE MOVEMENT IN A VARIABLE SHAPED VECTOR SCANNING EB LITHOGRAPHY SYSTEM, Microelectronic engineering, 21(1-4), 1993, pp. 149-152