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Results:
1-8
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Results: 8
Authors:
BAERLOCHER C
VANBEKKUM H
KARGE H
Citation: C. Baerlocher et al., DEDICATED TO PROFESSOR REES,LOVAT,V.C. IN RECOGNITION AND APPRECIATION OF HIS LIFELONG DEVOTION TO ZEOLITE SCIENCE AND HIS OUTSTANDING ACHIEVEMENTS IN THIS FIELD - FOREWORD, MICROPOROUS AND MESOPOROUS MATERIALS, 22(1-3), 1998, pp. 6-8
Authors:
WALTHER HG
KARGE H
MURATIKOV KL
SUVOROV AV
USOV IO
Citation: Hg. Walther et al., INVESTIGATION OF IMPLANTED LAYERS IN SILICON-CARBIDE BY A MODULATION PHOTOREFLECTION METHOD, Technical physics letters, 23(7), 1997, pp. 500-503
Authors:
EHLERT A
KERSTAN M
LUNDT H
HUBER A
HELMREICH D
GEILER HD
KARGE H
WAGNER M
Citation: A. Ehlert et al., SELECTED APPLICATIONS OF PHOTOTHERMAL AND PHOTOLUMINESCENCE HETERODYNE TECHNIQUES FOR PROCESS-CONTROL IN SILICON-WAFER MANUFACTURING, Optical engineering, 36(2), 1997, pp. 446-458
Authors:
GEILER HD
KARGE H
WAGNER M
EHLERT A
KERSTAN M
HELMREICH D
Citation: Hd. Geiler et al., ANALYSIS OF SUBSURFACE DAMAGE IN SILICON BY A COMBINED PHOTOTHERMAL AND PHOTOLUMINESCENCE HETERODYNE MEASUREMENT, Journal of applied physics, 81(11), 1997, pp. 7548-7551
Authors:
MURATIKOV KL
USOV IO
WALTHER HG
KARGE H
SUVOROV AV
Citation: Kl. Muratikov et al., PHOTOTHERMAL REFLECTANCE INVESTIGATION OF ION-IMPLANTED 6H-SIC, Applied physics letters, 71(20), 1997, pp. 3001-3003
Authors:
GEILER HD
KARGE H
WAGNER M
EHLERT A
KERSTAN M
HELMREICH D
Citation: Hd. Geiler et al., ANALYSIS OF SUBSURFACE DAMAGE IN SILICON BY PHOTOLUMINESCENCE AND PHOTOTHERMAL HETERODYNE METHODS, Progress in Natural Science, 6, 1996, pp. 498-502
Authors:
WALTHER HG
KARGE H
MURATIKOV K
Citation: Hg. Walther et al., PHOTOTHERMAL CHARACTERIZATION OF ION-IMPLANTED SIC, Progress in Natural Science, 6, 1996, pp. 511-514
Authors:
GEILER HD
KARGE H
KLUGE A
Citation: Hd. Geiler et al., NONDESTRUCTIVE EVALUATION OF ION IMPLANTATION-INDUCED MICROHARDNESS BY PHOTOTHERMAL SPECTROSCOPY, Surface & coatings technology, 66(1-3), 1994, pp. 265-270
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