ACNP - Italian Periodicals Catalogue

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Results: 1-24 |

Results: 24

AN INVESTIGATION OF X-RAY REFLECTIVITY AND DIFFRACTION FROM ELECTROLUMINESCENT SHORT-PERIOD SI-GE SUPERLATTICE STRUCTURES

Authors: PLOTZ WM KOPPENSTEINER E KIBBEL H PRESTING H BAUER G LISCHKA K

Citation: Wm. Plotz et al., AN INVESTIGATION OF X-RAY REFLECTIVITY AND DIFFRACTION FROM ELECTROLUMINESCENT SHORT-PERIOD SI-GE SUPERLATTICE STRUCTURES, Semiconductor science and technology, 10(12), 1995, pp. 1614-1620

DETERMINATION OF THREADING DISLOCATION DENSITY IN HETEROEPITAXIAL LAYERS BY DIFFUSE-X-RAY SCATTERING

Authors: KOPPENSTEINER E SCHUH A BAUER G HOLY V WATSON GP FITZGERALD EA

Citation: E. Koppensteiner et al., DETERMINATION OF THREADING DISLOCATION DENSITY IN HETEROEPITAXIAL LAYERS BY DIFFUSE-X-RAY SCATTERING, Journal of physics. D, Applied physics, 28(4A), 1995, pp. 114-119

STRUCTURAL INVESTIGATIONS OF GAAS ALAS QUANTUM WIRES AND QUANTUM DOTSBY X-RAY RECIPROCAL SPACE MAPPING/

Authors: DARHUBER AA KOPPENSTEINER E BAUER G WANG PD SONG YP TORRES CMS HOLLAND MC

Citation: Aa. Darhuber et al., STRUCTURAL INVESTIGATIONS OF GAAS ALAS QUANTUM WIRES AND QUANTUM DOTSBY X-RAY RECIPROCAL SPACE MAPPING/, Journal of physics. D, Applied physics, 28(4A), 1995, pp. 195-199

X-RAY RECIPROCAL SPACE MAPPING OF SI SI1-XCEX HETEROSTRUCTURES/

Authors: BAUER G LI JH KOPPENSTEINER E

Citation: G. Bauer et al., X-RAY RECIPROCAL SPACE MAPPING OF SI SI1-XCEX HETEROSTRUCTURES/, Journal of crystal growth, 157(1-4), 1995, pp. 61-67

STRUCTURAL INVESTIGATION OF II-VI COMPOUND SEMICONDUCTOR QUANTUM WIRES USING TRIPLE-AXIS X-RAY-DIFFRACTOMETRY

Authors: DARHUBER AA STRAUB H FERREIRA S FASCHINGER W KOPPENSTEINER E BRUNTHALER G BAUER G

Citation: Aa. Darhuber et al., STRUCTURAL INVESTIGATION OF II-VI COMPOUND SEMICONDUCTOR QUANTUM WIRES USING TRIPLE-AXIS X-RAY-DIFFRACTOMETRY, Journal of crystal growth, 150(1-4), 1995, pp. 775-778

EVOLUTION OF STRAIN RELAXATION IN COMPOSITIONALLY GRADED SI1-XGEX FILMS ON SI(001)

Authors: LI JH KOPPENSTEINER E BAUER G HOHNISCH M HERZOG HJ SCHAFFLER F

Citation: Jh. Li et al., EVOLUTION OF STRAIN RELAXATION IN COMPOSITIONALLY GRADED SI1-XGEX FILMS ON SI(001), Applied physics letters, 67(2), 1995, pp. 223-225

X-RAY RECIPROCAL SPACE MAPPING OF GAAS ALAS QUANTUM WIRES AND QUANTUMDOTS/

Authors: DARHUBER AA KOPPENSTEINER E BAUER G WANG PD SONG YP TORRES CMS HOLLAND MC

Citation: Aa. Darhuber et al., X-RAY RECIPROCAL SPACE MAPPING OF GAAS ALAS QUANTUM WIRES AND QUANTUMDOTS/, Applied physics letters, 66(8), 1995, pp. 947-949

HIGH-RESOLUTION X-RAY TRIPLE AXIS DIFFRACTOMETRY OF SHORT-PERIOD SIMGEN SUPERLATTICES

Authors: KOPPENSTEINER E BAUER G HOLY V KASPER E

Citation: E. Koppensteiner et al., HIGH-RESOLUTION X-RAY TRIPLE AXIS DIFFRACTOMETRY OF SHORT-PERIOD SIMGEN SUPERLATTICES, JPN J A P 1, 33(4B), 1994, pp. 2322-2328

INTERSUBBAND ABSORPTION IN MODULATION-DOPED P-TYPE SI SI1-XGEX QUANTUM-WELLS - A SYSTEMATIC STUDY/

Authors: FROMHERZ T KOPPENSTEINER E HELM M BAUER G NUTZEL J ABSTREITER G

Citation: T. Fromherz et al., INTERSUBBAND ABSORPTION IN MODULATION-DOPED P-TYPE SI SI1-XGEX QUANTUM-WELLS - A SYSTEMATIC STUDY/, JPN J A P 1, 33(4B), 1994, pp. 2361-2364

INTERSUBBAND ABSORPTION IN MODULATION-DOPED P-TYPE SI1-XGEX QUANTUM-WELLS - THEORY AND EXPERIMENT

Authors: FROMHERZ T KOPPENSTEINER E HELM M BAUER G NUTZEL JF ABSTREITER G

Citation: T. Fromherz et al., INTERSUBBAND ABSORPTION IN MODULATION-DOPED P-TYPE SI1-XGEX QUANTUM-WELLS - THEORY AND EXPERIMENT, Superlattices and microstructures, 15(3), 1994, pp. 229-232

HOLE ENERGY-LEVELS AND INTERSUBBAND ABSORPTION IN MODULATION-DOPED SISI1-XGEX MULTIPLE-QUANTUM WELLS/

Authors: FROMHERZ T KOPPENSTEINER E HELM M BAUER G NUTZEL JF ABSTREITER G

Citation: T. Fromherz et al., HOLE ENERGY-LEVELS AND INTERSUBBAND ABSORPTION IN MODULATION-DOPED SISI1-XGEX MULTIPLE-QUANTUM WELLS/, Physical review. B, Condensed matter, 50(20), 1994, pp. 15073-15085

QUANTITATIVE-ANALYSIS OF STRAIN RELAXATION AND MOSAICITY IN SHORT-PERIOD SI(M)GE(N) SUPERLATTICES USING RECIPROCAL SPACE MAPPING BY X-RAY-DIFFRACTION

Authors: KOPPENSTEINER E HAMBERGER P BAUER G HOLY V KIBBEL H PRESTING H KASPER E

Citation: E. Koppensteiner et al., QUANTITATIVE-ANALYSIS OF STRAIN RELAXATION AND MOSAICITY IN SHORT-PERIOD SI(M)GE(N) SUPERLATTICES USING RECIPROCAL SPACE MAPPING BY X-RAY-DIFFRACTION, Solid-state electronics, 37(4-6), 1994, pp. 629-634

SYSTEMATIC STUDY OF INTERSUBBAND ABSORPTION IN MODULATION-DOPED P-TYPE SI SI(1-X)GE(X) QUANTUM-WELLS/

Authors: FROMHERZ T KOPPENSTEINER E HELM M BAUER G NUTZEL JF ABSTREITER G

Citation: T. Fromherz et al., SYSTEMATIC STUDY OF INTERSUBBAND ABSORPTION IN MODULATION-DOPED P-TYPE SI SI(1-X)GE(X) QUANTUM-WELLS/, Solid-state electronics, 37(4-6), 1994, pp. 941-944

CONFINED AND PROPAGATING PHONONS IN ATOMIC LAYER EPITAXY-GROWN (CDTE)N(ZNTE)N SUPERLATTICES

Authors: FROMHERZ T OH E RAMDAS AK KOPPENSTEINER E BAUER G FASCHINGER W SITTER H

Citation: T. Fromherz et al., CONFINED AND PROPAGATING PHONONS IN ATOMIC LAYER EPITAXY-GROWN (CDTE)N(ZNTE)N SUPERLATTICES, Journal of crystal growth, 138(1-4), 1994, pp. 580-584

INVESTIGATION OF STRAIN-SYMMETRIZED AND PSEUDOMORPHIC SIMGEN SUPERLATTICES BY X-RAY RECIPROCAL SPACE MAPPING

Authors: KOPPENSTEINER E BAUER G KIBBEL H KASPER E

Citation: E. Koppensteiner et al., INVESTIGATION OF STRAIN-SYMMETRIZED AND PSEUDOMORPHIC SIMGEN SUPERLATTICES BY X-RAY RECIPROCAL SPACE MAPPING, Journal of applied physics, 76(6), 1994, pp. 3489-3501

TRIPLE AXIS X-RAY-INVESTIGATIONS OF SEMICONDUCTOR SURFACE CORRUGATIONS

Authors: DARHUBER AA KOPPENSTEINER E STRAUB H BRUNTHALER G FASCHINGER W BAUER G

Citation: Aa. Darhuber et al., TRIPLE AXIS X-RAY-INVESTIGATIONS OF SEMICONDUCTOR SURFACE CORRUGATIONS, Journal of applied physics, 76(12), 1994, pp. 7816-7823

DIFFUSE-X-RAY SCATTERING FROM P(+) POROUS SILICON BY TRIPLE AXIS DIFFRACTOMETRY

Authors: KOPPENSTEINER E SCHUH A BAUER G HOLY V BELLET D DOLINO G

Citation: E. Koppensteiner et al., DIFFUSE-X-RAY SCATTERING FROM P(+) POROUS SILICON BY TRIPLE AXIS DIFFRACTOMETRY, Applied physics letters, 65(12), 1994, pp. 1504-1506

ANALYSIS OF STRAIN AND MOSAICITY IN A SHORT-PERIOD SI9GE6 SUPERLATTICE BY X-RAY-DIFFRACTION

Authors: KOPPENSTEINER E HAMBERGER P BAUER G HOLY V KASPER E

Citation: E. Koppensteiner et al., ANALYSIS OF STRAIN AND MOSAICITY IN A SHORT-PERIOD SI9GE6 SUPERLATTICE BY X-RAY-DIFFRACTION, Applied physics letters, 64(2), 1994, pp. 172-174

HIGH-RESOLUTION X-RAY-DIFFRACTION INVESTIGATIONS OF SI SIGE QUANTUM-WELL STRUCTURES AND SI/GE SHORT-PERIOD SUPERLATTICES/

Authors: BAUER G KOPPENSTEINER E HAMBERGER P NUTZEL J ABSTREITER G KIBBEL H PRESTING H KASPER E

Citation: G. Bauer et al., HIGH-RESOLUTION X-RAY-DIFFRACTION INVESTIGATIONS OF SI SIGE QUANTUM-WELL STRUCTURES AND SI/GE SHORT-PERIOD SUPERLATTICES/, Acta Physica Polonica. A, 84(3), 1993, pp. 475-489

COMBINING 4-CRYSTAL 7-REFLECTION AND 3-CRYSTAL 5-REFLECTION DIFFRACTOMETRY FOR THE CHARACTERIZATION OF ZNSE LAYERS GROWN ON GAAS BY MOVPE

Authors: KOPPENSTEINER E RYAN TW HEUKEN M SOLLNER J

Citation: E. Koppensteiner et al., COMBINING 4-CRYSTAL 7-REFLECTION AND 3-CRYSTAL 5-REFLECTION DIFFRACTOMETRY FOR THE CHARACTERIZATION OF ZNSE LAYERS GROWN ON GAAS BY MOVPE, Journal of physics. D, Applied physics, 26(4A), 1993, pp. 35-40

X-RAY-DIFFRACTOMETRY OF SMALL DEFECTS IN LAYERED SYSTEMS

Authors: HOLY V KUBENA J ABRAMOF E PESEK A KOPPENSTEINER E

Citation: V. Holy et al., X-RAY-DIFFRACTOMETRY OF SMALL DEFECTS IN LAYERED SYSTEMS, Journal of physics. D, Applied physics, 26(4A), 1993, pp. 146-150

X-RAY DOUBLE AND TRIPLE-CRYSTAL DIFFRACTOMETRY OF MOSAIC STRUCTURE INHETEROEPITAXIAL LAYERS

Authors: HOLY V KUBENA J ABRAMOF E LISCHKA K PESEK A KOPPENSTEINER E

Citation: V. Holy et al., X-RAY DOUBLE AND TRIPLE-CRYSTAL DIFFRACTOMETRY OF MOSAIC STRUCTURE INHETEROEPITAXIAL LAYERS, Journal of applied physics, 74(3), 1993, pp. 1736-1743

MOLECULAR-BEAM EPITAXY OF PBTE EUTE SUPERLATTICES AND THEIR STRUCTURAL INVESTIGATION BY X-RAY-DIFFRACTION USING RECIPROCAL SPACE MAPPING/

Authors: KOPPENSTEINER E SPRINGHOLZ G HAMBERGER P BAUER G

Citation: E. Koppensteiner et al., MOLECULAR-BEAM EPITAXY OF PBTE EUTE SUPERLATTICES AND THEIR STRUCTURAL INVESTIGATION BY X-RAY-DIFFRACTION USING RECIPROCAL SPACE MAPPING/, Journal of applied physics, 74(10), 1993, pp. 6062-6071

TRIPLE-CRYSTAL X-RAY-DIFFRACTOMETRY OF PERIODIC ARRAYS OF SEMICONDUCTOR QUANTUM WIRES

Authors: HOLY V TAPFER L KOPPENSTEINER E BAUER G LAGE H BRANDT O PLOOG K

Citation: V. Holy et al., TRIPLE-CRYSTAL X-RAY-DIFFRACTOMETRY OF PERIODIC ARRAYS OF SEMICONDUCTOR QUANTUM WIRES, Applied physics letters, 63(23), 1993, pp. 3140-3142

Risultati: 1-24 |