Citation: C. Wagner et G. Krotz, THERMAL-PROPERTIES OF BETA-SIC EPITAXIAL LAYERS BETWEEN 150-DEGREES-CAND 500-DEGREES-C MEASURED BY USING MICROSTRUCTURES, DIAMOND AND RELATED MATERIALS, 6(10), 1997, pp. 1338-1341
Authors:
RICHTER C
ESPERTSHUBER K
WAGNER C
EICKHOFF M
KROTZ G
Citation: C. Richter et al., RAPID PLASMA-ETCHING OF CUBIC SIC USING NF3 O-2 GAS-MIXTURES/, Materials science & engineering. B, Solid-state materials for advanced technology, 46(1-3), 1997, pp. 160-163
Citation: C. Ammer et G. Krotz, ECOLOGICAL LIGHT MEASUREMENT IN FORESTS USING THE LIGHT DEGRADATION EFFECT IN HYDROGENATED AMORPHOUS-SILICON (A-SI-H), Annales des Sciences Forestieres, 54(6), 1997, pp. 539-551
Authors:
MULLER G
HELLMICH W
KROTZ G
KALBITZER S
GREAVES GN
DERST G
DENT AJ
DOBSON BR
Citation: G. Muller et al., DOPANT DEFECT INTERACTIONS IN HYDROGEN-FREE AMORPHOUS-SILICON, Philosophical magazine. B. Physics of condensed matter. Statistical mechanics, electronic, optical and magnetic, 73(2), 1996, pp. 245-259
Authors:
HELLMICH W
MULLER G
KROTZ G
DERST G
KALBITZER S
Citation: W. Hellmich et al., OPTICAL-ABSORPTION AND ELECTRONIC TRANSPORT IN ION-IMPLANTATION-DOPEDPOLYCRYSTALLINE SIC FILMS, Applied physics A: Materials science & processing, 61(2), 1995, pp. 193-201
Authors:
CHALKER PR
JOHNSTON C
ROMANI S
AYRES CF
BUCKLEYGOLDER IM
KROTZ G
ANGERER H
MULLER G
VEPREK S
KUNSTMANN T
LEGNER W
SMITH LM
LEESE AB
JONES AC
RUSHWORTH SA
Citation: Pr. Chalker et al., FORMATION OF EPITAXIAL DIAMOND SILICON-CARBIDE HETEROJUNCTIONS, DIAMOND AND RELATED MATERIALS, 4(5-6), 1995, pp. 632-636
Authors:
HELLMICH W
MULLER G
KROTZ G
DERST G
KALBITZER S
Citation: W. Hellmich et al., ELECTRONIC TRANSPORT IN THERMALLY CRYSTALLIZED SIC FILMS ON SAPPHIRE, Materials science & engineering. B, Solid-state materials for advanced technology, 29(1-3), 1995, pp. 147-150
Authors:
KROTZ G
LEGNER W
MULLER G
GRUENINGER HW
SMITH L
LEESE B
JONES A
RUSHWORTH S
Citation: G. Krotz et al., STRUCTURAL AND ELECTRONIC CHARACTERIZATION OF BETA-SIC FILMS ON SI GROWN FROM MONO-METHYLSILANE PRECURSORS, Materials science & engineering. B, Solid-state materials for advanced technology, 29(1-3), 1995, pp. 154-159
Citation: G. Muller et al., REVERSIBLE AND IRREVERSIBLE STRUCTURAL-CHANGES IN AMORPHOUS-SILICON, Philosophical magazine. B. Physics of condensed matter. Structural, electronic, optical and magnetic properties, 69(2), 1994, pp. 177-196
Authors:
STOLK PA
SARIS FW
BERNTSEN AJM
VANDERWEG WF
SEALY LT
BARKLIE RC
KROTZ G
MULLER G
Citation: Pa. Stolk et al., CONTRIBUTION OF DEFECTS TO ELECTRONIC, STRUCTURAL, AND THERMODYNAMIC PROPERTIES OF AMORPHOUS-SILICON, Journal of applied physics, 75(11), 1994, pp. 7266-7286
Citation: B. Ruttensperger et al., DENSITY-OF-STATE DISTRIBUTION AND VARIABLE-RANGE-HOPPING TRANSPORT INAMORPHOUS-SILICON PREPARED BY ION-BOMBARDMENT, Philosophical magazine. B. Physics of condensed matter. Structural, electronic, optical and magnetic properties, 68(2), 1993, pp. 203-214
Authors:
KROTZ G
HELLMICH W
MULLER G
DERST G
KALBITZER S
Citation: G. Krotz et al., ION-IMPLANTATION DOPING OF POLYCRYSTALLINE SIC THIN-FILMS PREPARED BYPECVD, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 80-1, 1993, pp. 927-930