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Results:
1-10
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Results: 10
Authors:
VAVRA I
LOBOTKA P
DERER J
GAZI S
HOLY V
KUBENA J
SOBOTA J
Citation: I. Vavra et al., STACKED JOSEPHSON-JUNCTION BASED ON NB SI SUPERLATTICE/, Journal of low temperature physics, 106(3-4), 1997, pp. 373-379
Authors:
VAVRA I
LOBOTKA P
GAZI S
DERER J
KUBENA J
HOLY V
BOCHNICEK Z
SOBOTA J
Citation: I. Vavra et al., THERMAL-STABILITY OF SIS TUNNEL JUNCTION WITH SILICON BARRIER, Czechoslovak journal of Physics, 46, 1996, pp. 675-676
Authors:
HOLY V
KUBENA J
VANDENHOOGENHOF WW
VAVRA I
Citation: V. Holy et al., EFFECT OF INTERFACIAL-ROUGHNESS REPLICATION ON THE DIFFUSE-X-RAY REFLECTION FROM PERIODICAL MULTILAYERS, Applied physics A: Materials science & processing, 60(1), 1995, pp. 93-96
Authors:
LIBEZNY M
CAYMAX M
BRABLEC A
KUBENA J
HOLY V
POORTMANS J
NIJS J
VANHELLEMONT J
Citation: M. Libezny et al., SPECTROELLIPSOMETRIC CHARACTERIZATION OF THIN EPITAXIAL SI(1-X)GE(X)LAYERS, Materials science and technology, 11(10), 1995, pp. 1065-1070
Authors:
MIKULIK P
HOLY V
KUBENA J
PLOOG K
Citation: P. Mikulik et al., X-RAY-DIFFRACTION ON FIBONACCI SUPERLATTICES, Acta crystallographica. Section A, Foundations of crystallography, 51, 1995, pp. 825-830
Authors:
VAVRA I
LOBOTKA P
MACHAJDIK D
POCHABA I
WALLENBERG LR
SENDERAK R
JERGEL M
HOLY V
KUBENA J
Citation: I. Vavra et al., THE INFLUENCE OF THERMAL-PROCESSING ON STRUCTURAL AND ELECTRICAL-PROPERTIES OF WXSI1-X SI MULTILAYERS/, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 350(1-2), 1994, pp. 379-390
Authors:
HOLY V
KUBENA J
OHLIDAL I
LISCHKA K
PLOTZ W
Citation: V. Holy et al., X-RAY REFLECTION FROM ROUGH LAYERED SYSTEMS, Physical review. B, Condensed matter, 47(23), 1993, pp. 15896-15903
Authors:
LIBEZNY M
POORTMANS J
CAYMAX M
VANAMMEL A
KUBENA J
HOLY V
VANHELLEMONT J
Citation: M. Libezny et al., SPECTROSCOPIC ELLIPSOMETRY OF STRAINED SI1-XGEX LAYERS, Thin solid films, 233(1-2), 1993, pp. 158-161
Authors:
HOLY V
KUBENA J
ABRAMOF E
PESEK A
KOPPENSTEINER E
Citation: V. Holy et al., X-RAY-DIFFRACTOMETRY OF SMALL DEFECTS IN LAYERED SYSTEMS, Journal of physics. D, Applied physics, 26(4A), 1993, pp. 146-150
Authors:
HOLY V
KUBENA J
ABRAMOF E
LISCHKA K
PESEK A
KOPPENSTEINER E
Citation: V. Holy et al., X-RAY DOUBLE AND TRIPLE-CRYSTAL DIFFRACTOMETRY OF MOSAIC STRUCTURE INHETEROEPITAXIAL LAYERS, Journal of applied physics, 74(3), 1993, pp. 1736-1743
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