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Results: 1-8 |
Results: 8
REDUCED EXPRESSION OF HEAT-SHOCK PROTEIN IN THE PRIMARY BILIARY-CIRRHOSIS (PBC) LIVER AFTER UROSDEOXYCHOLIC ACID TREATMENT
Authors: SAKISAKA S KOGA H KUBOYAMA S UCHIMURA Y SATA M TANIKAWA K
Citation: S. Sakisaka et al., REDUCED EXPRESSION OF HEAT-SHOCK PROTEIN IN THE PRIMARY BILIARY-CIRRHOSIS (PBC) LIVER AFTER UROSDEOXYCHOLIC ACID TREATMENT, Hepatology, 22(4), 1995, pp. 1508-1508
EFFECTS OF OMEPRAZOLE AND LANSOPRAZOLE ON FASTING AND POSTPRANDIAL SERUM GASTRIN AND SERUM PEPSINOGEN-A AND PEPSINOGEN-C
Authors: IWAO T TOYONAGA A KUBOYAMA S TANIKAWA K
Citation: T. Iwao et al., EFFECTS OF OMEPRAZOLE AND LANSOPRAZOLE ON FASTING AND POSTPRANDIAL SERUM GASTRIN AND SERUM PEPSINOGEN-A AND PEPSINOGEN-C, Hepato-gastroenterology, 42(5), 1995, pp. 677-682
IDENTIFICATION OF SOFT-ERROR SENSITIVE JUNCTION IN SRAMS USING A SINGLE-ION MICROPROBE
Authors: MATSUKAWA T KISHIDA A KOH M HARA K HORITA K GOTO M MATSUDA S KUBOYAMA S OHDOMARI I
Citation: T. Matsukawa et al., IDENTIFICATION OF SOFT-ERROR SENSITIVE JUNCTION IN SRAMS USING A SINGLE-ION MICROPROBE, IEEE electron device letters, 15(6), 1994, pp. 199-201
DEVELOPMENT OF MOS-TRANSISTORS FOR RADIATION-HARDENED LARGE-SCALE INTEGRATED-CIRCUITS AND ANALYSIS OF RADIATION-INDUCED DEGRADATION
Authors: KAMIMURA H YOSHIOKA S AKIYAMA M NAKAMURA M TAMURA T KUBOYAMA S
Citation: H. Kamimura et al., DEVELOPMENT OF MOS-TRANSISTORS FOR RADIATION-HARDENED LARGE-SCALE INTEGRATED-CIRCUITS AND ANALYSIS OF RADIATION-INDUCED DEGRADATION, Journal of Nuclear Science and Technology, 31(1), 1994, pp. 24-33
TOTAL-DOSE DEPENDENCE OF SOFT-ERROR HARDNESS IN 64KBIT SRAMS EVALUATED BY SINGLE-ION MICROPROBE TECHNIQUE
Authors: MATSUKAWA T KISHIDA A TANII T KOH M HORITA K HARA K SHIGETA B GOTO M MATSUDA S KUBOYAMA S OHDOMARI I
Citation: T. Matsukawa et al., TOTAL-DOSE DEPENDENCE OF SOFT-ERROR HARDNESS IN 64KBIT SRAMS EVALUATED BY SINGLE-ION MICROPROBE TECHNIQUE, IEEE transactions on nuclear science, 41(6), 1994, pp. 2071-2076
SINGLE EVENT BURNOUT OF POWER MOSFETS CAUSED BY NUCLEAR-REACTIONS WITH HEAVY-IONS
Authors: KUBOYAMA S MATSUDA S KANNO T HIROSE T
Citation: S. Kuboyama et al., SINGLE EVENT BURNOUT OF POWER MOSFETS CAUSED BY NUCLEAR-REACTIONS WITH HEAVY-IONS, IEEE transactions on nuclear science, 41(6), 1994, pp. 2210-2215
A RADIATION-HARDENED 32-BIT MICROPROCESSOR-BASED ON THE COMMERCIAL CMOS PROCESS
Authors: YOSHIOKA S KAMIMURA H AKIYAMA M NAKAMURA M TAMURA T KUBOYAMA S
Citation: S. Yoshioka et al., A RADIATION-HARDENED 32-BIT MICROPROCESSOR-BASED ON THE COMMERCIAL CMOS PROCESS, IEEE transactions on nuclear science, 41(6), 1994, pp. 2481-2486
NUMERICAL-ANALYSIS OF SINGLE EVENT BURNOUT OF POWER MOSFETS
Authors: KUBOYAMA S MATSUDA S NAKAJIMA M KANNO T ISHII T
Citation: S. Kuboyama et al., NUMERICAL-ANALYSIS OF SINGLE EVENT BURNOUT OF POWER MOSFETS, IEEE transactions on nuclear science, 40(6), 1993, pp. 1872-1879
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