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Results: 1-25/32
Authors:
LIOU SH
LI R
CAI Q
CHANDRASEKHAR M
LUO H
CHEN M
YELON WB
VASILIEV AL
KVAM EP
Citation: Sh. Liou et al., NEUTRON AND RAMAN-SCATTERING STUDIES OF HGBA2CUO4+DELTA, Journal of superconductivity, 11(1), 1998, pp. 59-62
Authors:
LINEHAN DS
KVAM EP
HOU L
MCELFRESH MW
Citation: Ds. Linehan et al., CONTROL OF EPITAXIAL-GROWTH ORIENTATION IN YBA2CU3O7-DELTA FILMS ON VICINAL (110)SRTIO3 SUBSTRATES, Journal of materials research, 13(10), 1998, pp. 2791-2799
Authors:
ROGENSKI RB
SANDHAGE KH
VASILIEV AL
KVAM EP
Citation: Rb. Rogenski et al., THE EFFECT OF EXCESS NEODYMIA ON THE GRAIN-GROWTH OF ND1-XCU3OY SOLID-SOLUTIONS(XBA2), Journal of materials research, 13(10), 1998, pp. 2819-2832
Authors:
GOPAL V
KVAM EP
CHIN TP
WOODALL JM
Citation: V. Gopal et al., EVIDENCE FOR MISFIT DISLOCATION-RELATED CARRIER ACCUMULATION AT THE INAS GAP HETEROINTERFACE/, Applied physics letters, 72(18), 1998, pp. 2319-2321
Authors:
ELSNER JH
KVAM EP
GRANDT AF
Citation: Jh. Elsner et al., MODELING AND MICROSTRUCTURE ANALYSIS OF FATIGUE INITIATION LIFE EXTENSION BY REDUCTIONS IN MICROPOROSITY, Metallurgical and materials transactions. A, Physical metallurgy andmaterials science, 28(5), 1997, pp. 1157-1167
Authors:
WANG WC
DENTON JP
NEUDECK GW
LEE IM
TAKOUDIS CG
KOH MTK
KVAM EP
Citation: Wc. Wang et al., SELECTIVE EPITAXIAL-GROWTH OF SI1-XGEX SI STRAINED-LAYERS IN A TUBULAR HOT-WALL LOW-PRESSURE CHEMICAL-VAPOR-DEPOSITION SYSTEM/, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 15(1), 1997, pp. 138-141
Authors:
KIM JS
KVAM EP
Citation: Js. Kim et Ep. Kvam, STUDY ON THE POSSIBLE STRUCTURAL TRANSITION IN ND2-XCEXCUO4-DELTA, Physica. C, Superconductivity, 292(3-4), 1997, pp. 203-210
Authors:
VASILIEV AL
LINEHAN DS
KVAM EP
HOU L
MCELFRESH MW
Citation: Al. Vasiliev et al., SINGLE VARIANT ORIENTATIONAL GROWTH OF YBA2CU3O7-X ON VICINAL(011) SRTIO3 SUBSTRATES OBSERVED BY ELECTRON-MICROSCOPY, Physica. C, Superconductivity, 289(3-4), 1997, pp. 243-250
Authors:
KVAM EP
CHASON EH
YALISOV SM
Citation: Ep. Kvam et al., SPECIAL ISSUE ON EVOLUTION AND ADVANCED CHARACTERIZATION OF THIN-FILMMICROSTRUCTURES - FOREWORD, Journal of electronic materials, 26(9), 1997, pp. 959-959
Authors:
GOLINKIN IA
RUFF DD
KVAM EP
MCCABE GP
GRANDT AF
Citation: Ia. Golinkin et al., APPLICATION OF ANALYSIS OF VARIANCE (ANOVA) STATISTICAL-METHODS TO BREAKING LOAD CORROSION TEST, Journal of testing and evaluation, 25(6), 1997, pp. 565-570
Authors:
LEE IM
TAKOUDIS CG
WANG WC
DENTON JP
NEUDECK GW
KOH MTK
KVAM EP
Citation: Im. Lee et al., PROCESS IMPROVEMENTS IN THE SELECTIVE EPITAXIAL-GROWTH OF SI1-XGEX SISTRAINED LAYERS IN A CONVENTIONAL HOT-WALL LPCVD SYSTEM/, Journal of the Electrochemical Society, 144(3), 1997, pp. 1095-1099
Authors:
LINEHAN DS
KVAM EP
HOU LF
MCELFRESH M
Citation: Ds. Linehan et al., BIAXIALLY ALIGNED (013) YBA2CU3O7-DELTA FILMS ON VICINAL (011) SRTIO3, Superconductor science and technology, 9(9), 1996, pp. 739-742
Authors:
VASILIEV AL
KVAM EP
FOONG F
LIOU SH
Citation: Al. Vasiliev et al., THE MICROSTRUCTURE OF (HG,TL)-BASED HIGH-TEMPERATURE SUPERCONDUCTING FILMS ON LAALO3 SUBSTRATES, Physica. C, Superconductivity, 269(3-4), 1996, pp. 181-192
Authors:
ANDERSON LE
GULATI M
WESTGATE PJ
KVAM EP
BOWMAN K
LADISCH MR
Citation: Le. Anderson et al., SYNTHESIS AND OPTIMIZATION OF A NEW STARCH-BASED ADSORBENT FOR DEHUMIDIFICATION OF AIR IN A PRESSURE-SWING DRYER, Industrial & engineering chemistry research, 35(4), 1996, pp. 1180-1187
Authors:
BASHIR R
NEUDECK GW
HAW Y
KVAM EP
DENTON JP
Citation: R. Bashir et al., CHARACTERIZATION OF SIDEWALL DEFECTS IN SELECTIVE EPITAXIAL-GROWTH OFSILICON, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(3), 1995, pp. 923-927
Authors:
BASHIR R
NEUDECK GW
HAW Y
KVAM EP
Citation: R. Bashir et al., CHARACTERIZATION AND MODELING OF SIDEWALL DEFECTS IN SELECTIVE EPITAXIAL-GROWTH OF SILICON, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(3), 1995, pp. 928-935
Authors:
VARANASI C
MCGINN PJ
PAVATE V
KVAM EP
Citation: C. Varanasi et al., EFFECTS OF PROCESSING PARAMETERS ON THE LEVITATION FORCE OF MELT-PROCESSED YBA2CU3OX, Journal of materials research, 10(9), 1995, pp. 2251-2256
Authors:
KVAM EP
PAVATE V
VARANASI C
MCGINN PJ
Citation: Ep. Kvam et al., RELATIONSHIPS BETWEEN DISLOCATIONS, 2ND-PHASE, AND PINNING IN Y-BA-CU-O, Journal of electronic materials, 24(12), 1995, pp. 1955-1959
Authors:
SAMAVEDAM SB
KVAM EP
KABIR AE
NEUDECK GW
Citation: Sb. Samavedam et al., DEFECT STRUCTURES IN SILICON MERGED EPITAXIAL LATERAL OVERGROWTH, Journal of electronic materials, 24(11), 1995, pp. 1747-1751
Authors:
KVAM EP
SAMAVEDAM SB
Citation: Ep. Kvam et Sb. Samavedam, DISLOCATIONS IN STRAINED LAYERS - THE GE-SI SYSTEM, JOM, 46(3), 1994, pp. 47-51
Authors:
DAWLEY JT
DORRIS SE
LANAGAN MT
KVAM EP
POEPPEL RB
Citation: Jt. Dawley et al., THE FABRICATION AND THERMOMECHANICAL PROCESSING OF AG-BI-2223 JELLY-ROLL WIRES, Superconductor science and technology, 7(8), 1994, pp. 587-591
Authors:
KVAM EP
Citation: Ep. Kvam, DISLOCATION-INDUCED FLUX-PINNING INTERACTIONS IN YBA2CU3O7, Physica. C, Superconductivity, 229(1-2), 1994, pp. 90-98
Authors:
VARANASI C
MCGINN PJ
PAVATE V
KVAM EP
Citation: C. Varanasi et al., CRITICAL-CURRENT DENSITY AND MICROSTRUCTURE OF MELT-PROCESSED YBA2CU3OX WITH PTO2 ADDITIONS, Physica. C, Superconductivity, 221(1-2), 1994, pp. 46-52
Authors:
PAVATE V
WILLIAMS LB
KVAM EP
VARANASI C
MCGINN PJ
Citation: V. Pavate et al., EFFECTS OF PLATINUM AND OXYGENATION ON MICROSTRUCTURE IN YBA2CU3O7-DELTA Y2BACUO5 BULK MATERIALS, Journal of electronic materials, 23(11), 1994, pp. 1131-1134
Authors:
KVAM EP
PAVATE V
LINEHAN DS
Citation: Ep. Kvam et al., DISLOCATIONS AND FLUX-PINNING IN YBA2CU3O7, Journal of electronic materials, 23(11), 1994, pp. 1183-1189