Authors:
Holst, J
Kaschner, A
Gfug, U
Hoffmann, A
Thomsen, C
Bertram, F
Riemann, T
Rudloff, D
Christen, J
Averbeck, R
Riechert, H
Heuken, M
Schwambera, M
Schon, O
Citation: J. Holst et al., Comparison of the mechanism of optical amplification in InGaN/GaN heterostructures grown by molecular beam epitaxy and MOCVD, PHYS ST S-A, 180(1), 2000, pp. 327-332
Authors:
Kaschner, A
Hoffmann, A
Thomsen, C
Bertram, F
Riemann, T
Christen, J
Hiramatsu, K
Sone, H
Sawaki, N
Citation: A. Kaschner et al., Micro-Raman and cathodoluminescence studies of epitaxial laterally overgrown GaN with tungsten masks: A method to map the free-carrier concentration of thick GaN samples, APPL PHYS L, 76(23), 2000, pp. 3418-3420
Authors:
Kaczmarczyk, G
Kaschner, A
Reich, S
Hoffmann, A
Thomsen, C
As, DJ
Lima, AP
Schikora, D
Lischka, K
Averbeck, R
Riechert, H
Citation: G. Kaczmarczyk et al., Lattice dynamics of hexagonal and cubic InN: Raman-scattering experiments and calculations, APPL PHYS L, 76(15), 2000, pp. 2122-2124
Authors:
Bertram, F
Riemann, T
Christen, J
Kaschner, A
Hoffmann, A
Hiramatsu, K
Shibata, T
Sawaki, N
Citation: F. Bertram et al., Epitaxial lateral overgrowth of GaN structures: spatially resolved characterization by cathodoluminescence microscopy and micro-Raman spectroscopy, MAT SCI E B, 59(1-3), 1999, pp. 117-121
Authors:
Hoffmann, A
Holst, J
Kaschner, A
Siegle, H
Christen, J
Fischer, P
Bertram, F
Hiramatsu, K
Citation: A. Hoffmann et al., Impact of the ZnO buffer on the optical properties of GaN: time resolved micro-photoluminescence, MAT SCI E B, 59(1-3), 1999, pp. 163-167
Authors:
Bertram, F
Riemann, T
Christen, J
Kaschner, A
Hoffmann, A
Thomsen, C
Hiramatsu, K
Shibata, T
Sawaki, N
Citation: F. Bertram et al., Strain relaxation and strong impurity incorporation in epitaxial laterallyovergrown GaN: Direct imaging of different growth domains by cathodoluminescence microscopy and micro-Raman spectroscopy, APPL PHYS L, 74(3), 1999, pp. 359-361
Authors:
Kaschner, A
Hoffmann, A
Thomsen, C
Bertram, F
Riemann, T
Christen, J
Hiramatsu, K
Shibata, T
Sawaki, N
Citation: A. Kaschner et al., Optical microscopy of electronic and structural properties of epitaxial laterally overgrown GaN, APPL PHYS L, 74(22), 1999, pp. 3320-3322
Authors:
Siegle, H
Kaschner, A
Hoffmann, A
Broser, I
Thomsen, C
Einfeldt, S
Hommel, D
Citation: H. Siegle et al., Raman scattering from defects in GaN: The question of vibrational or electronic scattering mechanism, PHYS REV B, 58(20), 1998, pp. 13619-13626