AAAAAA
Results: 1-25/38
Authors:
Vehkamaki, M
Hanninen, T
Ritala, M
Leskela, M
Sajavaara, T
Rauhala, E
Keinonen, J
Citation: M. Vehkamaki et al., Atomic layer deposition of SrTiO3 thin films from a novel strontium precursor-strontium-bis(tri-isopropylcyclopentadienyl), CHEM VAPOR, 7(2), 2001, pp. 75-80
Authors:
Nordlund, K
Salonen, E
Keinonen, J
Wu, CH
Citation: K. Nordlund et al., Sputtering of hydrocarbons by ion-induced breaking of chemical bonds, NUCL INST B, 180, 2001, pp. 77-84
Authors:
Nordlund, K
Nord, J
Keinonen, J
Citation: K. Nordlund et al., Chemical effects in collision cascades, NUCL INST B, 175, 2001, pp. 31-35
Authors:
Arstila, K
Sajavaara, T
Keinonen, J
Citation: K. Arstila et al., Monte Carlo simulation of multiple and plural scattering in elastic recoildetection, NUCL INST B, 174(1-2), 2001, pp. 163-172
Authors:
Frantz, J
Tarus, J
Nordlund, K
Keinonen, J
Citation: J. Frantz et al., Mechanism of electron-irradiation-induced recrystallization in Si - art. no. 125313, PHYS REV B, 6412(12), 2001, pp. 5313
Authors:
Krasheninnikov, AV
Nordlund, K
Sirvio, M
Salonen, E
Keinonen, J
Citation: Av. Krasheninnikov et al., Formation of ion-irradiation-induced atomic-scale defects on walls of carbon nanotubes - art. no. 245405, PHYS REV B, 6324(24), 2001, pp. 5405
Authors:
Salonen, E
Nordlund, K
Keinonen, J
Wu, CH
Citation: E. Salonen et al., Swift chemical sputtering of amorphous hydrogenated carbon - art. no. 195415, PHYS REV B, 6319(19), 2001, pp. 5415
Authors:
Sillanpaa, J
Peltola, J
Nordlund, K
Keinonen, J
Puska, MJ
Citation: J. Sillanpaa et al., Electronic stopping calculated using explicit phase shift factors - art. no. 134113, PHYS REV B, 6313(13), 2001, pp. 4113
Authors:
Vainonen-Ahlgren, E
Ahlgren, T
Likonen, J
Lehto, S
Sajavaara, T
Rydman, W
Keinonen, J
Wu, CH
Citation: E. Vainonen-ahlgren et al., Deuterium diffusion in silicon-doped diamondlike carbon films - art. no. 045406, PHYS REV B, 6304(4), 2001, pp. 5406
Authors:
Guina, M
Xiang, N
Vainionpaa, A
Okhotnikov, OG
Sajavaara, T
Keinonen, J
Citation: M. Guina et al., Self-starting stretched-pulse fiber laser mode locked and stabilized with slow and fast semiconductor saturable absorbers, OPTICS LETT, 26(22), 2001, pp. 1809-1811
Carbon erosion mechanisms in tokamak divertor materials: insight from molecular dynamics simulations
Authors:
Salonen, E
Nordlund, K
Keinonen, J
Wu, CH
Citation: E. Salonen et al., Carbon erosion mechanisms in tokamak divertor materials: insight from molecular dynamics simulations, J NUCL MAT, 290, 2001, pp. 144-147
Authors:
Vainonen-Ahlgren, E
Ahlgren, T
Khriachtchev, L
Likonen, J
Lehto, S
Keinonen, J
Wu, CH
Citation: E. Vainonen-ahlgren et al., Silicon diffusion in amorphous carbon films, J NUCL MAT, 290, 2001, pp. 216-219
Authors:
Nordlund, K
Peltola, J
Nord, J
Keinonen, J
Averback, RS
Citation: K. Nordlund et al., Defect clustering during ion irradiation of GaAs: Insight from molecular dynamics simulations, J APPL PHYS, 90(4), 2001, pp. 1710-1717
Authors:
Alen, P
Juppo, M
Ritala, M
Sajavaara, T
Keinonen, J
Leskela, M
Citation: P. Alen et al., Atomic layer deposition of Ta(Al)N(C) thin films using trimethylaluminum as a reducing agent, J ELCHEM SO, 148(10), 2001, pp. G566-G571
Authors:
Nordlund, K
Henriksson, KOE
Keinonen, J
Citation: K. Nordlund et al., Melting temperature effects on the size of ion-induced craters, APPL PHYS L, 79(22), 2001, pp. 3624-3626
Authors:
Gustafsson, M
Roccaforte, F
Keinonen, J
Bolse, W
Ziegeler, L
Lieb, KP
Citation: M. Gustafsson et al., Oxygen-activated epitaxial recrystallization of Li-implanted alpha-SiO2, PHYS REV B, 61(5), 2000, pp. 3327-3332
Authors:
Kukli, K
Ritala, M
Schuisky, M
Leskela, M
Sajavaara, T
Keinonen, J
Uustare, T
Harsta, A
Citation: K. Kukli et al., Atomic layer deposition of titanium oxide from TiI4 and H2O2, CHEM VAPOR, 6(6), 2000, pp. 303-310
Authors:
Nordlund, K
Nord, J
Frantz, J
Keinonen, J
Citation: K. Nordlund et al., Strain-induced Kirkendall mixing at semiconductor interfaces, COMP MAT SC, 18(3-4), 2000, pp. 283-294
Authors:
Salonen, E
Nordlund, K
Keinonen, J
Wu, CH
Citation: E. Salonen et al., Bond-breaking mechanism of sputtering, EUROPH LETT, 52(5), 2000, pp. 504-510
Authors:
Roccaforte, F
Gustafsson, MJ
Bolse, W
Keinonen, J
Lieb, KP
Citation: F. Roccaforte et al., Epitaxial recrystallization of alkali-ion implanted alpha-quartz, NUCL INST B, 166, 2000, pp. 148-153
Authors:
Nordlund, K
Tarus, J
Keinonen, J
Ghaly, M
Averback, RS
Citation: K. Nordlund et al., Heat spike effects on ion beam mixing, NUCL INST B, 164, 2000, pp. 441-452
Authors:
Tarus, J
Nordlund, K
Keinonen, J
Averback, RS
Citation: J. Tarus et al., Strain effects in Ge surface cascades, NUCL INST B, 164, 2000, pp. 482-486
Authors:
Sajavaara, T
Arstila, K
Laakso, A
Keinonen, J
Citation: T. Sajavaara et al., Effects of surface roughness on results in elastic recoil detection measurements, NUCL INST B, 161, 2000, pp. 235-239
Authors:
Sillanpaa, J
Nordlund, K
Keinonen, J
Citation: J. Sillanpaa et al., Electronic stopping of Si from a three-dimensional charge distribution, PHYS REV B, 62(5), 2000, pp. 3109-3116
Authors:
Ritala, M
Kukli, K
Rahtu, A
Raisanen, PI
Leskela, M
Sajavaara, T
Keinonen, J
Citation: M. Ritala et al., Atomic layer deposition of oxide thin films with metal alkoxides as oxygensources, SCIENCE, 288(5464), 2000, pp. 319-321