Authors:
Kita, K
Wen, CJ
Otomo, J
Yamada, K
Komiyama, H
Takahashi, H
Citation: K. Kita et al., Study on the lateral growth of silicon films from metal solutions with temperature gradient, J CRYST GR, 234(1), 2002, pp. 153-158
Citation: H. Hamamura et al., TiN films prepared by flow modulation chemical vapor deposition using TiCl4 and NH3, JPN J A P 1, 40(3A), 2001, pp. 1517-1521
Citation: Xd. Liu et al., Internal microstructure and formation mechanism of surface protrusions in Pb-Ti-Nb-O thin films prepared by MOCVD, CHEM VAPOR, 7(6), 2001, pp. 253-259
Authors:
Hu, MH
Noda, S
Okubo, T
Yamaguchi, Y
Komiyama, H
Citation: Mh. Hu et al., Structure and morphology of self-assembled 3-mercaptopropyltrimethoxysilane layers on silicon oxide, APPL SURF S, 181(3-4), 2001, pp. 307-316
Citation: Yk. Chae et H. Komiyama, Nucleation and growth of Cu films during the initial stage of chemical vapor deposition, J APPL PHYS, 90(7), 2001, pp. 3610-3613
Citation: Xd. Liu et al., Influence of deposition temperature on the microstructure of Pb-Ti-Nb-O thin films by metallorganic chemical vapor deposition, J ELCHEM SO, 148(3), 2001, pp. C227-C230
Authors:
Ihara, M
Yokoyama, S
Yokoyama, C
Izumi, K
Komiyama, H
Citation: M. Ihara et al., Fabrication of silicon thin films with defects below detection limit of electron spin resonance for solar cells by high-speed zone-melting crystallization of amorphous silicon, APPL PHYS L, 79(23), 2001, pp. 3809-3811
Authors:
Sugiyama, M
Feron, O
Sudo, S
Nakano, Y
Tada, K
Komiyama, H
Shimogaki, Y
Citation: M. Sugiyama et al., Kinetics of GaAs metalorganic chemical vapor deposition studied by numerical analysis based on experimental reaction data, JPN J A P 1, 39(4A), 2000, pp. 1642-1649
Authors:
Sugiyama, M
Itoh, H
Aoyama, J
Komiyama, H
Shimogaki, Y
Citation: M. Sugiyama et al., Reaction analysis of aluminum chemical vapor deposition from dimethyl-aluminum-hydride using tubular reactor and Fourier-transform infrared spectroscopy: Theoretical process optimization procedure (1), JPN J A P 1, 39(3A), 2000, pp. 1074-1079
Authors:
Sugiyama, M
Nakajima, T
Tanaka, T
Itoh, H
Aoyama, J
Egashira, Y
Yamashita, K
Komiyama, H
Shimogaki, Y
Citation: M. Sugiyama et al., Elementary surface reaction simulation of aluminum chemical vapor deposition from dimethylaluminumhydride based on ab initio calculations: Theoretical process optimization procedure (2), JPN J A P 1, 39(12A), 2000, pp. 6501-6512
Authors:
Lim, SW
Shimogaki, Y
Nakano, Y
Tada, K
Komiyama, H
Citation: Sw. Lim et al., Decrease in deposition rate and improvement of step coverage by CF4 addition to plasma-enhanced chemical vapor deposition of silicon oxide films, JPN J A P 1, 39(1), 2000, pp. 330-336
Citation: Dy. Li et al., Case studies of the impact of landscape changes on weather modification inwestern Australia in summer, J GEO RES-A, 105(D10), 2000, pp. 12303-12315
Authors:
Kunishige, M
Sugawara, K
Chae, YK
Shimogaki, Y
Komiyama, H
Egashira, Y
Citation: M. Kunishige et al., CVD reactor design using three-dimensional computer simulation - Gas outlet effect, KAG KOG RON, 26(6), 2000, pp. 758-762
Citation: K. Nishioka et al., A model for predicting preferential orientation of chemical-vapor-deposited films, J ELCHEM SO, 147(4), 2000, pp. 1440-1442
Authors:
Tsukamoto, K
Cheng, DG
Komiyama, H
Nishimoto, Y
Tokumasu, N
Maeda, K
Citation: K. Tsukamoto et al., Morphology evolution of SiO2 films deposited by tetraethylorthosilicate/O-3 atmospheric-pressure chemical vapor deposition on thermal SiO2, JPN J A P 2, 38(1AB), 1999, pp. L68-L70
Authors:
Sugiyama, M
Iino, T
Itoh, H
Aoyama, J
Komiyama, H
Shimogaki, Y
Citation: M. Sugiyama et al., Effect of underlayers on the morphology and orientation of aluminum films prepared by chemical vapor deposition using dimethylaluminumhydride, JPN J A P 2, 38(12B), 1999, pp. L1528-L1531
Authors:
Kraines, SB
Suzuki, A
Yanagi, T
Isobe, M
Guo, XY
Komiyama, H
Citation: Sb. Kraines et al., Rapid water exchange between the lagoon and the open ocean at Majuro Atolldue to wind, waves, and tide, J GEO RES-O, 104(C7), 1999, pp. 15635-15653
Authors:
Tsukamoto, K
Cheng, DG
Komiyama, H
Nishimoto, Y
Tokumasu, N
Maeda, K
Citation: K. Tsukamoto et al., Tetraethylorthosilicate vapor treatment for eliminating surface sensitivity in tetraethylorthosilicate/O-3 atmospheric-pressure chemical vapor deposition, EL SOLID ST, 2(1), 1999, pp. 24-26
Authors:
Chae, YK
Egashira, Y
Shimogaki, Y
Sugawara, K
Komiyama, H
Citation: Yk. Chae et al., Experimental and numerical analysis of rapid reaction to initiate the radical chain reactions in WSix CVD (vol 320, pg 151, 1998), THIN SOL FI, 340(1-2), 1999, pp. 317-317
Authors:
Cheng, DG
Tsukamoto, K
Komiyama, H
Nishimoto, Y
Tokumasu, N
Maeda, K
Citation: Dg. Cheng et al., Thermal desorption spectra of SiO2 films deposited on Si and on thermal SiO2 by tetraethylorthosilicate/O-3 atmospheric-pressure chemical vapor deposition, J APPL PHYS, 85(10), 1999, pp. 7140-7145
Authors:
Ihara, M
Yokoyama, C
Abudula, A
Kato, R
Komiyama, H
Yamada, K
Citation: M. Ihara et al., Effect of the steam-methane ratio on reactions occurring on Ni/yttria-stabilized zirconia cermet anodes used in solid-oxide fuel cells, J ELCHEM SO, 146(7), 1999, pp. 2481-2487