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Results: 1-15 |
Results: 15
OPTICAL LOSSES CHARACTERIZATION IN WAVE-GUIDES THROUGH THE PHOTODEFLECTION METHOD
Authors: BERTOLOTTI M LIAKHOU G VOTI RL MATERA A SIBILIA C VALENTINO M
Citation: M. Bertolotti et al., OPTICAL LOSSES CHARACTERIZATION IN WAVE-GUIDES THROUGH THE PHOTODEFLECTION METHOD, Optical engineering, 36(2), 1997, pp. 515-520
NEW PHOTOTHERMAL DEFLECTION METHOD FOR THERMAL-DIFFUSIVITY MEASUREMENT OF SEMICONDUCTOR WAFERS
Authors: BERTOLOTTI M DOROGAN V LIAKHOU G VOTI RL PAOLONI S SIBILIA C
Citation: M. Bertolotti et al., NEW PHOTOTHERMAL DEFLECTION METHOD FOR THERMAL-DIFFUSIVITY MEASUREMENT OF SEMICONDUCTOR WAFERS, Review of scientific instruments, 68(3), 1997, pp. 1521-1526
THERMAL CHARACTERIZATION OF HIGH T-C SUPERCONDUCTORS THROUGH THE PHOTODEFLECTION METHOD
Authors: BERTOLOTTI M LIAKHOU G RICCIARDIELLO FG LIVOTI R PAOLONI S SIBILIA C TAMPIERI A SPARVIERI N
Citation: M. Bertolotti et al., THERMAL CHARACTERIZATION OF HIGH T-C SUPERCONDUCTORS THROUGH THE PHOTODEFLECTION METHOD, Journal of thermal analysis, 47(1), 1996, pp. 67-74
EFFECTS OF NONLINEAR FABRY-PEROT RESONATOR RESPONSE ON Z-SCAN MEASUREMENTS
Authors: MICHELOTTI F CAIAZZA F LIAKHOU G PAOLONI S BERTOLOTTI M
Citation: F. Michelotti et al., EFFECTS OF NONLINEAR FABRY-PEROT RESONATOR RESPONSE ON Z-SCAN MEASUREMENTS, Optics communications, 124(1-2), 1996, pp. 103-110
POROUS SILICON OBTAINED BY ANODIZATION IN THE TRANSITION REGIME
Authors: BERTOLOTTI M FAZIO E FERRARI A LAMONICA S LAZAROUK S LIAKHOU G MAIELLO G PROVERBIO E SCHIRONE L CARASSITI F
Citation: M. Bertolotti et al., POROUS SILICON OBTAINED BY ANODIZATION IN THE TRANSITION REGIME, Thin solid films, 255(1-2), 1995, pp. 152-154
A CRYOSTATIC SETUP FOR THE LOW-TEMPERATURE MEASUREMENT OF THERMAL-DIFFUSIVITY WITH THE PHOTOTHERMAL METHOD
Authors: BERTOLOTTI M LIAKHOU G VOTI RL PAOLONI S SIBILIA C SPARVIERI N
Citation: M. Bertolotti et al., A CRYOSTATIC SETUP FOR THE LOW-TEMPERATURE MEASUREMENT OF THERMAL-DIFFUSIVITY WITH THE PHOTOTHERMAL METHOD, Review of scientific instruments, 66(12), 1995, pp. 5598-5602
THE PHOTOTHERMAL METHOD APPLIED TO LOW THERMAL-DIFFUSIVITY MEASUREMENTS - REPLY
Authors: BERTOLOTTI M VOTI RL LIAKHOU G SIBILIA C
Citation: M. Bertolotti et al., THE PHOTOTHERMAL METHOD APPLIED TO LOW THERMAL-DIFFUSIVITY MEASUREMENTS - REPLY, Review of scientific instruments, 66(1), 1995, pp. 277-277
NUMERICAL-ANALYSIS OF NONHOMOGENEOUS MEDIA THROUGH PHOTOTHERMAL DEFLECTION METHOD
Authors: BERTOLOTTI M FIRPO M FONTANA A LIAKHOU G VOTI RL SIBILIA C DEPORTU G
Citation: M. Bertolotti et al., NUMERICAL-ANALYSIS OF NONHOMOGENEOUS MEDIA THROUGH PHOTOTHERMAL DEFLECTION METHOD, Journal de physique. IV, 4(C7), 1994, pp. 83-86
ON MIRROR TEMPERATURE OF A SEMICONDUCTOR DIODE-LASER STUDIED WITH A PHOTOTHERMAL DEFLECTION METHOD
Authors: BERTOLOTTI M LIAKHOU G VOTI RL WANG RP SIBILIA C SYRBU AV YAKOVLEV VP
Citation: M. Bertolotti et al., ON MIRROR TEMPERATURE OF A SEMICONDUCTOR DIODE-LASER STUDIED WITH A PHOTOTHERMAL DEFLECTION METHOD, Journal de physique. IV, 4(C7), 1994, pp. 211-214
OPTICAL LOSSES CHARACTERIZATION IN CHANNEL WAVE-GUIDE THROUGH THE PHOTODEFLECTION METHOD
Authors: BERTOLOTTI M LIAKHOU G VOTI RL MATERA A SIBILIA C VALENTINO M
Citation: M. Bertolotti et al., OPTICAL LOSSES CHARACTERIZATION IN CHANNEL WAVE-GUIDE THROUGH THE PHOTODEFLECTION METHOD, Journal de physique. IV, 4(C7), 1994, pp. 647-650
THERMAL-DIFFUSIVITY OF POLYETHYLENE CONTAINING CARBON
Authors: BERTOLOTTI M VOTI RL LIAKHOU G EZQUERRA TA
Citation: M. Bertolotti et al., THERMAL-DIFFUSIVITY OF POLYETHYLENE CONTAINING CARBON, Materials letters, 17(3-4), 1993, pp. 171-174
CREATION OF LONG-LIVING ORDERED ELECTRON-HOLE STRUCTURES IN A DISORDERED SYSTEM - SLOW NONLINEAR RESPONSE AND FORMATION OF A BEAM CHANNEL BY WEAK PUMPING
Authors: ANTONYUK BP KISELEV SA BERTOLOTTI M SIBILIA C LIAKHOU G ANDRIESH AM
Citation: Bp. Antonyuk et al., CREATION OF LONG-LIVING ORDERED ELECTRON-HOLE STRUCTURES IN A DISORDERED SYSTEM - SLOW NONLINEAR RESPONSE AND FORMATION OF A BEAM CHANNEL BY WEAK PUMPING, Physical review. B, Condensed matter, 47(16), 1993, pp. 10186-10192
ON THE PHOTODEFLECTION METHOD APPLIED TO LOW THERMAL-DIFFUSIVITY MEASUREMENTS
Authors: BERTOLOTTI M VOTI RL LIAKHOU G SIBILIA C
Citation: M. Bertolotti et al., ON THE PHOTODEFLECTION METHOD APPLIED TO LOW THERMAL-DIFFUSIVITY MEASUREMENTS, Review of scientific instruments, 64(6), 1993, pp. 1576-1583
MIRROR TEMPERATURE OF A SEMICONDUCTOR DIODE-LASER STUDIED WITH A PHOTOTHERMAL DEFLECTION METHOD
Authors: BERTOLOTTI M LIAKHOU G LIVOTI R WANG RP SIBILIA C YAKOVLEV VP
Citation: M. Bertolotti et al., MIRROR TEMPERATURE OF A SEMICONDUCTOR DIODE-LASER STUDIED WITH A PHOTOTHERMAL DEFLECTION METHOD, Journal of applied physics, 74(12), 1993, pp. 7054-7060
METHOD FOR THERMAL-DIFFUSIVITY MEASUREMENTS BASED ON PHOTOTHERMAL DEFLECTION
Authors: BERTOLOTTI M LIAKHOU G LIVOTI R MICHELOTTI F SIBILIA C
Citation: M. Bertolotti et al., METHOD FOR THERMAL-DIFFUSIVITY MEASUREMENTS BASED ON PHOTOTHERMAL DEFLECTION, Journal of applied physics, 74(12), 1993, pp. 7078-7084
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