Authors:
AHLGREN T
VAINONEN E
LIKONEN J
KEINONEN J
Citation: T. Ahlgren et al., CONCENTRATION-DEPENDENT DEUTERIUM DIFFUSION IN DIAMOND-LIKE CARBON-FILMS, Physical review. B, Condensed matter, 57(16), 1998, pp. 9723-9726
Authors:
ALBERS WM
LIKONEN J
PELTONEN J
TELEMAN O
LEMMETYINEN H
Citation: Wm. Albers et al., STRUCTURAL ASPECTS OF SELF-ASSEMBLY OF THIENOVIOLOGEN MOLECULAR CONDUCTORS ON GOLD SUBSTRATES, Thin solid films, 330(2), 1998, pp. 114-119
Authors:
RAUHALA E
AHLGREN T
VAKEVAINEN K
RAISANEN J
KEINONEN J
SAARINEN K
LAINE T
LIKONEN J
Citation: E. Rauhala et al., DEFECT FORMATION AND ANNEALING BEHAVIOR OF INP IMPLANTED BY LOW-ENERGY N-15 IONS, Journal of applied physics, 83(2), 1998, pp. 738-746
Authors:
UUSIMAA P
RAKENNUS K
SALOKATVE A
PESSA M
LIKONEN J
Citation: P. Uusimaa et al., MOLECULAR-BEAM EPITAXY OF P-TYPE ZNSSE USING A NITRIC-OXIDE PLASMA SOURCE, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 15(4), 1997, pp. 2426-2427
Authors:
AHLGREN T
LIKONEN J
SLOTTE J
RAISANEN J
RAJATORA M
KEINONEN J
Citation: T. Ahlgren et al., CONCENTRATION-DEPENDENT AND INDEPENDENT SI DIFFUSION IN ION-IMPLANTEDGAAS, Physical review. B, Condensed matter, 56(8), 1997, pp. 4597-4603
Authors:
EHRNSTEN UM
LIKONEN J
CARPEN LI
VARJONEN OA
Citation: Um. Ehrnsten et al., STUDYING LOCALIZED CORROSION IN STAINLESS-STEELS WITH SURFACE-SENSITIVE METHODS, Materials characterization, 36(4-5), 1996, pp. 279-289
Authors:
LIKONEN J
VAKEVAINEN K
AHLGREN T
RAISANEN J
RAUHALA E
KEINONEN J
Citation: J. Likonen et al., ANNEALING BEHAVIOR OF HIGH-DOSE-IMPLANTED NITROGEN IN INP, Applied physics A: Materials science & processing, 62(5), 1996, pp. 463-468
Authors:
RONKAINEN H
LIKONEN J
KOSKINEN J
VARJUS S
Citation: H. Ronkainen et al., EFFECT OF TRIBOFILM FORMATION ON THE TRIBOLOGICAL PERFORMANCE OF HYDROGENATED CARBON COATINGS, Surface & coatings technology, 79(1-3), 1996, pp. 87-94
Citation: M. Hautala et al., FLUCTUATIONS IN COLLISION CASCADES - ION-BEAM MIXING, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 115(1-4), 1996, pp. 493-496
Authors:
MAKINEN J
LAINE T
PARTANEN J
SAARINEN K
HAUTOJARVI P
TAPPURA K
HAKKARAINEN T
ASONEN H
PESSA M
KAUPPINEN JP
VANTTINEN K
PAALANEN MA
LIKONEN J
Citation: J. Makinen et al., DONOR LEVELS AND THE MICROSCOPIC STRUCTURE OF THE DX CENTER IN N-TYPESI-DOPED ALXGA0.51-IN0.49P GROWN BY MOLECULAR-BEAM EPITAXY, Physical review. B, Condensed matter, 53(12), 1996, pp. 7851-7862
Authors:
RONKAINEN H
KOSKINEN J
LIKONEN J
VARJUS S
VIHERSALO J
Citation: H. Ronkainen et al., CHARACTERIZATION OF WEAR SURFACES IN DRY SLIDING OF STEEL AND ALUMINAON HYDROGENATED AND HYDROGEN-FREE CARBON-FILMS, DIAMOND AND RELATED MATERIALS, 3(11-12), 1994, pp. 1329-1336
Authors:
ZILLIACUS R
LIKONEN J
RONKAINEN H
HIRVONEN JP
Citation: R. Zilliacus et al., CHARACTERIZATION OF INTERFACES BETWEEN TIN OR HARD CARBON COATING ANDSUBSTRATE BY SIMS, Applied surface science, 75, 1994, pp. 175-179
Citation: J. Likonen et al., ION-BEAM MIXING OF AU MARKER IN PT AND PT MARKER IN AU BY 7 MEV AG IONS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 90(1-4), 1994, pp. 429-432
Authors:
SAASTAMOINEN S
LIKONEN J
NEIMO L
PAULAPURO H
STENIUS P
Citation: S. Saastamoinen et al., SIMS STUDY OF THE ADSORPTION OF CALCIUM AND ALUMINUM IONS ON UNBLEACHED AND HYDROGEN-PEROXIDE BLEACHED PRESSURIZED GROUNDWOOD, Paperi ja puu, 76(1-2), 1994, pp. 74-80
Authors:
LEHTO S
SOININEN P
NIINISTO L
LIKONEN J
LAPPALAINEN R
Citation: S. Lehto et al., CHARACTERIZATION OF DOPED STRONTIUM SULFIDE THIN-FILMS BY SECONDARY-ION MASS-SPECTROMETRY, RUTHERFORD BACKSCATTERING SPECTROMETRY AND X-RAY-FLUORESCENCE SPECTROMETRY, Analyst, 119(8), 1994, pp. 1725-1729
Authors:
HIRVONEN JP
KOSKINEN J
KOPONEN I
LIKONEN J
KATTELUS H
Citation: Jp. Hirvonen et al., MODIFICATION OF INTERFACIAL CHARACTERISTICS BETWEEN DIAMOND-LIKE CARBON-FILMS AND SUBSTRATES BY USING ION-BOMBARDMENT, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 80-1, 1993, pp. 1472-1476
Citation: J. Likonen et al., THE ULTIMATE DEPTH RESOLUTION IN SIMS PROFILING - LOW-ENERGY ION-BEAMMIXING OF AU-PT INTERFACE, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 80-1, 1993, pp. 151-155
Citation: J. Saarilahti et al., COMPARISON OF ANODIZATION SPECTROSCOPY WITH SIMS AND RBS MEASUREMENTSFOR THE CHARACTERIZATION OF NB AL-ALOX/NB JOSEPHSON-JUNCTION STRUCTURES/, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 79(1-4), 1993, pp. 474-477