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Results: 26-36/36
Authors:
LOSCH R
STRATMANN M
VIEFHAUS H
Citation: R. Losch et al., STRUCTURAL STUDY OF POTENTIAL CONTROLLED DEPOSITED LANGMUIR-BLODGETT-FILMS ON METAL SUBSTRATES, Fresenius' journal of analytical chemistry, 346(1-3), 1993, pp. 128-130
Authors:
DINGES HW
BURKHARD H
LOSCH R
NICKEL H
SCHLAPP W
Citation: Hw. Dinges et al., SPECTROSCOPIC ELLIPSOMETRY - A USEFUL TOOL TO DETERMINE THE REFRACTIVE-INDEXES AND INTERFACES OF IN0.52AL0.48AS AND IN0.53ALXGA0.47-XAS LAYERS ON INP IN THE WAVELENGTH RANGE 280-1900 NM, Materials science & engineering. B, Solid-state materials for advanced technology, 21(2-3), 1993, pp. 174-176
Authors:
DINGES HW
BURKHARD H
LOSCH R
NICKEL H
SCHLAPP W
Citation: Hw. Dinges et al., DETERMINATION OF REFRACTIVE-INDEXES OF IN0.52AL0.48AS ON INP IN THE WAVELENGTH RANGE FROM 250 TO 1900 NM BY SPECTROSCOPIC ELLIPSOMETRY, Materials science & engineering. B, Solid-state materials for advanced technology, 20(1-2), 1993, pp. 180-182
Authors:
DIESSEL E
MULLER G
WEISS D
VONKLITZING K
PLOOG K
NICKEL H
SCHLAPP W
LOSCH R
Citation: E. Diessel et al., HUGE PHOTORESPONSE IN THE NONLOCAL TRANSPORT REGIME, Europhysics letters, 24(9), 1993, pp. 785-790
Authors:
AHLERS FJ
HEIN G
SCHERER H
BLIEK L
NICKEL H
LOSCH R
SCHLAPP W
Citation: Fj. Ahlers et al., BISTABILITY IN THE CURRENT-INDUCED BREAKDOWN OF THE QUANTUM HALL-EFFECT, Semiconductor science and technology, 8(12), 1993, pp. 2062-2068
Authors:
DINGES HW
BURKHARD H
LOSCH R
NICKEL H
SCHLAPP W
Citation: Hw. Dinges et al., DETERMINATION OF THE REFRACTIVE-INDEX OF IN0.53AL0.11GA0.36 AS ON INPIN THE WAVELENGTH RANGE FROM 280 TO 1900 NM BY SPECTROSCOPIC ELLIPSOMETRY, Applied surface science, 69(1-4), 1993, pp. 355-358
Authors:
VASILIADOU E
MULLER G
HEITMANN D
WEISS D
VONKLITZING K
NICKEL H
SCHLAPP W
LOSCH R
Citation: E. Vasiliadou et al., COLLECTIVE RESPONSE IN THE MICROWAVE PHOTOCONDUCTIVITY OF HALL BAR STRUCTURES, Physical review. B, Condensed matter, 48(23), 1993, pp. 17145-17148
Authors:
DINGES HW
BURKHARD H
LOSCH R
NICKEL H
SCHLAPP W
Citation: Hw. Dinges et al., SPECTROSCOPIC ELLIPSOMETRY - A USEFUL TOOL TO DETERMINE THE REFRACTIVE-INDEXES AND INTERFACES OF IN0.52AL0.48AS AND IN0.53ALXGA0.47-XAS ON INP IN THE WAVELENGTH RANGE FROM 280 TO 1900 NM, Thin solid films, 233(1-2), 1993, pp. 145-147
Authors:
JENSEN CR
ANDERSEN MN
LOSCH R
Citation: Cr. Jensen et al., THE EFFECT OF POTASSIUM APPLICATION ON LEAF WATER RELATIONS CHARACTERISTICS OF FIELD-GROWN BARLEY PLANTS (HORDEUM-DISTICHUM L), Plant and soil, 156, 1993, pp. 423-426
Authors:
JENSEN CR
SVENDSEN H
ANDERSEN MN
LOSCH R
Citation: Cr. Jensen et al., USE OF THE ROOT CONTACT CONCEPT, AN EMPIRICAL LEAF CONDUCTANCE MODEL AND PRESSURE-VOLUME CURVES IN SIMULATING CROP WATER RELATIONS, Plant and soil, 149(1), 1993, pp. 1-26
Authors:
BRUHL HG
POECKER A
NICKEL H
LOSCH R
SCHLAPP W
Citation: Hg. Bruhl et al., HIGH-RESOLUTION X-RAY-DIFFRACTION OF MOLECULAR-BEAM-EPITAXY-GROWN INALAS INGAAS/INALAS 3-LAYER STRUCTURES ON (001)-ORIENTED INP-SUBSTRATES/, Journal of applied crystallography, 26, 1993, pp. 645-649