Authors:
Muto, S
Yamanaka, T
Lee, HN
Johnson, DR
Inui, H
Yamaguchi, M
Citation: S. Muto et al., Directional solidification of TiAl-based alloys and properties of directionally solidified ingots, ADV ENG MAT, 3(6), 2001, pp. 391-394
Citation: Hn. Lee et al., Epitaxial growth of non-c-oriented ferroelectric SrBi2Ta2O9 thin films on SrTiO3 substrates, J EUR CERAM, 21(10-11), 2001, pp. 1565-1568
Authors:
Kim, MY
Seok, WK
Lee, HN
Han, SH
Dong, YK
Yun, H
Citation: My. Kim et al., Structural characterization of Rh(III) complexes containing the polypyridyl ligands and some properties of their derivatives, Z NATURFO B, 56(8), 2001, pp. 747-752
Citation: Hn. Lee et al., Two cases of reactive perforating collagenosis arising at the site of healed herpes tester, INT J DERM, 40(3), 2001, pp. 191-192
Authors:
Lee, SY
Lee, JH
Lee, JH
Ryu, JS
Lim, J
Moon, SH
Lee, HN
Kim, HG
Oh, B
Citation: Sy. Lee et al., Significant reduction of the microwave surface resistance of MgB2 films bysurface ion milling, APPL PHYS L, 79(20), 2001, pp. 3299-3301
Authors:
Lee, HN
Zakharov, DN
Senz, S
Pignolet, A
Hesse, D
Citation: Hn. Lee et al., Epitaxial growth of ferroelectric SrBi2Ta2O9 thin films of mixed (100) and(116) orientation on SrLaGaO4(110), APPL PHYS L, 79(18), 2001, pp. 2961-2963
Citation: Ws. Kim et al., Fabrication and characterization of Pt-oxide electrode for ferroelectric random access memory application, JPN J A P 1, 39(12B), 2000, pp. 7097-7099
Authors:
Lee, HN
Johnson, DR
Inui, H
Oh, MH
Wee, DM
Yamaguchi, M
Citation: Hn. Lee et al., Microstructural control through seeding and directional solidification of TiAl alloys containing Mo and C, ACT MATER, 48(12), 2000, pp. 3221-3233
Authors:
Lee, HN
Senz, S
Visinoiu, A
Pignolet, A
Hesse, D
Gosele, U
Citation: Hn. Lee et al., Epitaxial growth of non-c-oriented ferroelectric SrBi2Ta2O9 thin films on Si(100) substrates, APPL PHYS A, 71(1), 2000, pp. 101-104
Citation: Wk. Seok et al., Synthesis, spectroscopic investigation, and theoretical study of the ruthenium diazide complex [Ru(tpy)(PPh3)(N-3)(2)], Z NATURFO B, 55(6), 2000, pp. 462-466
Citation: Hn. Lee et al., Monte Carlo simulation of microstructure evolution based on grain boundarycharacter distribution, MAT SCI E A, 281(1-2), 2000, pp. 176-188
Authors:
Rasch, PJ
Feichter, J
Law, K
Mahowald, N
Penner, J
Benkovitz, C
Genthon, C
Giannakopoulos, C
Kasibhatla, P
Koch, D
Levy, H
Maki, T
Prather, M
Roberts, DL
Roelofs, GJ
Stevenson, D
Stockwell, Z
Taguchi, S
Kritz, M
Chipperfield, M
Baldocchi, D
McMurry, P
Barrie, L
Balkansi, Y
Chatfield, R
Kjellstrom, E
Lawrence, M
Lee, HN
Lelieveld, J
Noone, KJ
Seinfeld, J
Stenchikov, G
Schwartz, S
Walcek, C
Williamson, D
Citation: Pj. Rasch et al., A comparison of scavenging and deposition processes in global models: results from the WCRP Cambridge Workshop of 1995, TELLUS B, 52(4), 2000, pp. 1025-1056
Authors:
Lee, HN
Visinoiu, A
Senz, S
Harnagea, C
Pignolet, A
Hesse, D
Gosele, U
Citation: Hn. Lee et al., Structural and electrical anisotropy of (001)-, (116)-, and (103)-orientedepitaxial SrBi2Ta2O9 thin films on SrTiO3 substrates grown by pulsed laserdeposition, J APPL PHYS, 88(11), 2000, pp. 6658-6664
Authors:
Lee, HN
Senz, S
Zakharov, ND
Harnagea, C
Pignolet, A
Hesse, D
Gosele, U
Citation: Hn. Lee et al., Growth and characterization of non-c-oriented epitaxial ferroelectric SrBi2Ta2O9 films on buffered Si(100), APPL PHYS L, 77(20), 2000, pp. 3260-3262
Citation: Hn. Lee et al., Comparison of memory effect between YMnO3 and SrBi2Ta2O9 ferroelectric thin films deposited on Si substrates, APPL PHYS L, 76(8), 2000, pp. 1066-1068
Citation: Hn. Lee et Ag. Marshall, Theoretical maximal precision for mass-to-charge ratio, amplitude, and width measurements in ion-counting mass analysers, ANALYT CHEM, 72(10), 2000, pp. 2256-2260
Citation: Hn. Lee et al., Oxidation behavior and mechanical properties of yttrium-doped L1(2) (Al,Cr)(3)Ti coating on TiAl alloys, SCR MATER, 41(10), 1999, pp. 1073-1078