Citation: Fz. Liu et al., The transition from Eu3+ to Eu2+ in SiO2(Eu) thin films prepared by ion implantation and co-sputtering, ACT PHY C E, 50(3), 2001, pp. 532-535
Citation: Bc. Li et R. Gupta, Transient state model of optical saturation of pulsed photothermal signalswith broadband laser excitation, ANAL SCI, 17, 2001, pp. S35-S38
Citation: Zm. Wu et al., Analytical expressions of the various derivatives of the output power of the semiconductor optical amplifiers with respect to the input power, FIBER IN OP, 20(6), 2001, pp. 565-570
Citation: Bc. Li et R. Gupta, Simultaneous measurement of absorption coefficient, thermal diffusivity, and flow velocity in a gas jet with pulsed photothermal deflection spectroscopy, J APPL PHYS, 89(2), 2001, pp. 859-868
Citation: Bc. Li et R. Gupta, Optical saturation in continuous-wave photothermal deflection spectroscopy: quantitative investigation of fundamental and harmonic components, APPL OPTICS, 40(9), 2001, pp. 1563-1569
Citation: Sf. Dai et al., Components of sulfur isotopes and characteristics of sulfur evolution in Wuda Coalfield, Inner Mongolia., ACTA PETR S, 16(2), 2000, pp. 269-274
Authors:
Li, BC
Pottier, L
Roger, JP
Fournier, D
Welsch, E
Citation: Bc. Li et al., Thermal characterization of film-on-substrate systems with modulated thermoreflectance microscopy, REV SCI INS, 71(5), 2000, pp. 2154-2160
Citation: Bc. Li et R. Gupta, Effect of optical saturation on pulsed photothermal deflection signals in flowing media, J APPL PHYS, 88(10), 2000, pp. 5515-5526
Authors:
Broothaerts, W
McPherson, J
Li, BC
Randall, E
Lane, WD
Wiersma, PA
Citation: W. Broothaerts et al., Fast apple (Malus x domestica) and tobacco (Nicotiana tobacum) leaf polyphenol oxidase activity assay for screening transgenic plants, J AGR FOOD, 48(12), 2000, pp. 5924-5928
Citation: Bc. Li et al., In situ measurement on ultraviolet dielectric components by a pulsed top-hat beam thermal lens, APPL OPTICS, 39(25), 2000, pp. 4690-4697
Authors:
Li, BC
Pottier, L
Roger, JP
Fournier, D
Watari, K
Hirao, K
Citation: Bc. Li et al., Measuring the anisotropic thermal diffusivity of silicon nitride grains bythermoreflectance microscopy, J EUR CERAM, 19(8), 1999, pp. 1631-1639
Authors:
Huang, Y
Li, BC
Bryant, C
Bol, R
Eglinton, G
Citation: Y. Huang et al., Radiocarbon dating of aliphatic hydrocarbons: A new approach for dating passive-fraction carbon in soil horizons, SOIL SCI SO, 63(5), 1999, pp. 1181-1187
Citation: Bc. Li et al., Thermal characterization of thin superconducting films by modulated thermoreflectance microscopy, THIN SOL FI, 352(1-2), 1999, pp. 91-96
Citation: Bc. Li et al., Complete thermal characterization of film-on-substrate system by modulatedthermoreflectance microscopy and multiparameter fitting, J APPL PHYS, 86(9), 1999, pp. 5314-5316
Citation: Bc. Li et E. Welsch, Probe-beam diffraction in a pulsed top-hat beam thermal lens with a mode-mismatched configuration, APPL OPTICS, 38(24), 1999, pp. 5241-5249