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Results: 1-21 |
Results: 21

Authors: Grivickas, P Galeckas, A Linnros, J Syvajarvi, M Yakimova, R Grivickas, V Tellefsen, JA
Citation: P. Grivickas et al., Carrier lifetime investigation in 4H-SiC grown by CVD and sublimation epitaxy, MAT SC S PR, 4(1-3), 2001, pp. 191-194

Authors: Valenta, J Lalic, N Linnros, J
Citation: J. Valenta et al., Electroluminescence microscopy and spectroscopy of silicon nanocrystals inthin SiO2 layers, OPT MATER, 17(1-2), 2001, pp. 45-50

Authors: Grivickas, P Linnros, J Grivickas, V
Citation: P. Grivickas et al., Carrier diffusion characterization in epitaxial 4H-SiC, J MATER RES, 16(2), 2001, pp. 524-528

Authors: Kleimann, P Linnros, J Frojdh, C Petersson, CS
Citation: P. Kleimann et al., An X-ray imaging pixel detector based on scintillator filled pores in a silicon matrix, NUCL INST A, 460(1), 2001, pp. 15-19

Authors: Galeckas, A Linnros, J Breitholtz, B Bleichner, H
Citation: A. Galeckas et al., Application of optical emission microscopy for reliability studies in 4H-SiC p(+)/n(-)/n(+) diodes, J APPL PHYS, 90(2), 2001, pp. 980-984

Authors: Galeckas, A Linnros, J Frischholz, M Grivickas, V
Citation: A. Galeckas et al., Optical characterization of excess carrier lifetime and surface recombination in 4H/6H-SiC, APPL PHYS L, 79(3), 2001, pp. 365-367

Authors: Kleimann, P Linnros, J Juhasz, R
Citation: P. Kleimann et al., Formation of three-dimensional microstructures by electrochemical etching of silicon, APPL PHYS L, 79(11), 2001, pp. 1727-1729

Authors: Juhasz, R Linnros, J
Citation: R. Juhasz et J. Linnros, Three-dimensionally controlled size-reduction of silicon nanopillars by photoelectrochemical etching, APPL PHYS L, 78(20), 2001, pp. 3118-3120

Authors: Kleimann, P Linnros, J Petersson, S
Citation: P. Kleimann et al., Formation of wide and deep pores in silicon by electrochemical etching, MAT SCI E B, 69, 2000, pp. 29-33

Authors: Grivickas, V Galeckas, A Bikbajevas, V Linnros, J Tellefsen, JA
Citation: V. Grivickas et al., Spatially and time-resolved infrared absorption for optical and electricalcharacterization of indirect band gap semiconductors, THIN SOL FI, 364(1-2), 2000, pp. 181-185

Authors: Kleimann, P Linnros, J Frojdh, C Petersson, CS
Citation: P. Kleimann et al., An x-ray imaging pixel detector based on a scintillating guides screen, IEEE NUCL S, 47(4), 2000, pp. 1483-1486

Authors: Grivickas, V Linnros, J Grivickas, P Galeckas, A
Citation: V. Grivickas et al., Band edge absorption, carrier recombination and transport measurements in 4H-SiC epilayers, MAT SCI E B, 61-2, 1999, pp. 197-201

Authors: Galeckas, A Linnros, J Frischholz, M Rottner, K Nordell, N Karlsson, S Grivickas, V
Citation: A. Galeckas et al., Investigation of surface recombination and carrier lifetime in 4H/6H-SiC, MAT SCI E B, 61-2, 1999, pp. 239-243

Authors: Galeckas, A Tornblad, O Linnros, J Breitholtz, B
Citation: A. Galeckas et al., Direct observation of excess carrier distribution in 4H-SiC power diodes, IEEE ELEC D, 20(6), 1999, pp. 295-297

Authors: Bikbajevas, V Grivickas, V Linnros, J Tellefsen, JA
Citation: V. Bikbajevas et al., Injection-level dependent surface recombination velocities at the Si-SiO2 interface, PHYS SCR, T79, 1999, pp. 322-326

Authors: Linnros, J Lalic, N Galeckas, A Grivickas, V
Citation: J. Linnros et al., Analysis of the stretched exponential photoluminescence decay from nanometer-sized silicon crystals in SiO2, J APPL PHYS, 86(11), 1999, pp. 6128-6134

Authors: Domeij, M Breitholtz, B Hillkirk, LM Linnros, J Ostling, M
Citation: M. Domeij et al., Dynamic avalanche in 3.3-kV Si power diodes, IEEE DEVICE, 46(4), 1999, pp. 781-786

Authors: Galeckas, A Linnros, J Breitholtz, B
Citation: A. Galeckas et al., Time-resolved imaging of radiative recombination in 4H-SiC p-i-n diode, APPL PHYS L, 74(22), 1999, pp. 3398-3400

Authors: Mou, D Linnros, J Petersson, CS Rao, KV
Citation: D. Mou et al., Electrical properties of epitaxial PbTiO3/YBa2Cu3O7-x heterostructures, PHYSICA C, 308(3-4), 1998, pp. 221-225

Authors: Lalic, N Linnros, J
Citation: N. Lalic et J. Linnros, Light emitting diode structure based on Si nanocrystals formed by implantation into thermal oxide, J LUMINESC, 80(1-4), 1998, pp. 263-267

Authors: Linnros, J Priolo, F Canham, L
Citation: J. Linnros et al., Proceedings of symposium B on light emission from silicon: Progress towards Si-based optoelectronics of the 1998 E-MRS Spring Conference Strasbourg, France, 16-19 June 1998 - Preface, J LUMINESC, 80(1-4), 1998, pp. VII-VII
Risultati: 1-21 |