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Results:
1-14
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Results: 14
Authors:
BORN A
OLBRICH A
MAYWALD M
WIESENDANGER R
Citation: A. Born et al., ANALYSIS OF ELECTRICAL BREAKDOWN FAILURES BY MEANS OF SFM-BASED METHODS, Applied physics A: Materials science & processing, 66, 1998, pp. 1063-1065
Authors:
FIEGE GBM
FEIGE V
PHANG JCH
MAYWALD M
GORLICH S
BALK LJ
Citation: Gbm. Fiege et al., FAILURE ANALYSIS OF INTEGRATED DEVICES BY SCANNING THERMAL MICROSCOPY(STHM), Microelectronics and reliability, 38(6-8), 1998, pp. 957-961
Authors:
BAE S
SCHLENSOG A
MERTIN W
KUBALEK E
MAYWALD M
Citation: S. Bae et al., A NEW TEST METHOD FOR CONTACTLESS QUANTITATIVE CURRENT MEASUREMENT VIA SCANNING MAGNETO-RESISTIVE PROBE MICROSCOPY, Microelectronics and reliability, 38(6-8), 1998, pp. 969-974
Authors:
DOUBLE KL
MAYWALD M
SCHMITTEL M
RIEDERER P
GERLACH M
Citation: Kl. Double et al., IN-VITRO STUDIES OF FERRITIN IRON RELEASE AND NEUROTOXICITY, Journal of neurochemistry, 70(6), 1998, pp. 2492-2499
Authors:
SCHMITTEL M
MAYWALD M
STRITTMATTER M
Citation: M. Schmittel et al., SYNTHESIS OF NOVEL ENYNE-ALLENES, THEIR THERMAL C-2-C-6 CYCLIZATION, AND THE IMPORTANCE OF A BENZOFULVENE BIRADICAL IN THE DNA STRAND CLEAVAGE, Synlett, (2), 1997, pp. 165
Authors:
MULLERZULOW B
MAYWALD M
CRAMER RM
SPRENGEPIEL J
GEHRING S
Citation: B. Mullerzulow et al., METROLOGICAL, ELECTRICAL AND THERMAL-ANALYSIS OF SEMICONDUCTOR STRUCTURES USING SCANNING FORCE MICROSCOPY, Materials science & engineering. B, Solid-state materials for advanced technology, 44(1-3), 1997, pp. 74-77
Authors:
SCHMITTEL M
STEFFEN JP
AUER D
MAYWALD M
Citation: M. Schmittel et al., RING STRAIN EFFECTS IN ENYNE-ALLENE THERMOLYSIS - SWITCH FROM THE MYERS-SAITO REACTION TO THE C-2-C-6 BIRADICAL CYCLIZATION, Tetrahedron letters, 38(35), 1997, pp. 6177-6180
Authors:
MAYWALD M
PYLKKI RJ
REINEKE FJ
BALK LJ
Citation: M. Maywald et al., MODULATED THERMAL PROFILING ON DEVICES, Progress in Natural Science, 6, 1996, pp. 103-106
Authors:
MAYWALD M
BALK LJ
Citation: M. Maywald et Lj. Balk, EVALUATION OF LOCAL THERMOELASTIC FEATURES BY MEANS OF SCANNING FORCEMICROSCOPY BASED TECHNIQUES, Progress in Natural Science, 6, 1996, pp. 107-110
Authors:
BALK LJ
HEIDERHOFF R
KOSCHINSKI P
MAYWALD M
Citation: Lj. Balk et al., NANOSCOPIC EVALUATION OF SEMICONDUCTOR PROPERTIES BY SCANNING PROBE MICROSCOPIES, Microelectronics and reliability, 36(11-12), 1996, pp. 1767-1774
Authors:
HEIDERHOFF R
KOSCHINSKI P
MAYWALD M
BALK LJ
BACHMANN PK
Citation: R. Heiderhoff et al., CORRELATION OF THE ELECTRICAL, THERMAL, AND OPTICAL-PROPERTIES OF CVDDIAMOND FILMS BY SCANNING MICROSCOPY TECHNIQUES, DIAMOND AND RELATED MATERIALS, 4(5-6), 1995, pp. 645-651
Authors:
BALK LJ
MAYWALD M
Citation: Lj. Balk et M. Maywald, SCANNING FORCE MICROSCOPY OF SEMICONDUCTOR-MATERIALS AND DEVICES, Materials science & engineering. B, Solid-state materials for advanced technology, 24(1-3), 1994, pp. 203-208
Authors:
MAYWALD M
PYLKKI RJ
BALK LJ
Citation: M. Maywald et al., IMAGING OF LOCAL THERMAL AND ELECTRICAL-CONDUCTIVITY WITH SCANNING FORCE MICROSCOPY, Scanning microscopy, 8(2), 1994, pp. 181-188
Authors:
MAYWALD M
STEPHAN RE
BALK LJ
Citation: M. Maywald et al., EVALUATION OF AN EPITAXIAL LAYER STRUCTURE BY LATERAL FORCE AND CONTACT CURRENT MEASUREMENTS IN A SCANNING FORCE MICROSCOPE, Microelectronic engineering, 24(1-4), 1994, pp. 99-106
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1-14
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