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Results: 1-10 |
Results: 10
ELECTRICAL CHARACTERIZATION OF HE-PLASMA PROCESSED N-GAAS
Authors: AURET FD MEYER WE DEENAPANRAY PNK GOODMAN SA MYBURG G MURTAGH M YE SR CREAN GM
Citation: Fd. Auret et al., ELECTRICAL CHARACTERIZATION OF HE-PLASMA PROCESSED N-GAAS, Journal of applied physics, 84(4), 1998, pp. 1973-1976
PHOTOREFLECTANCE CHARACTERIZATION OF AR+ ION ETCHED AND SICL4 REACTIVE ION ETCHED SILICON(100)
Authors: MURTAGH M LYNCH SM KELLY PV HILDEBRANT S HERBERT PAF JEYNES C CREAN GM
Citation: M. Murtagh et al., PHOTOREFLECTANCE CHARACTERIZATION OF AR+ ION ETCHED AND SICL4 REACTIVE ION ETCHED SILICON(100), Materials science and technology, 13(11), 1997, pp. 961-964
ELECTRICAL CHARACTERIZATION OF DEFECTS IN SICL4 PLASMA-ETCHED N-GAAS AND PD SCHOTTKY DIODES FABRICATED ON IT
Authors: AURET FD MYBURG G MEYER WE DEENAPANRAY PNK NORDHOFF H GOODMAN SA MURTAGH M YE SR CREAN GM
Citation: Fd. Auret et al., ELECTRICAL CHARACTERIZATION OF DEFECTS IN SICL4 PLASMA-ETCHED N-GAAS AND PD SCHOTTKY DIODES FABRICATED ON IT, Applied physics letters, 71(5), 1997, pp. 668-670
COMPUTER-ADMINISTERED TESTING WITH THE ROTTER INCOMPLETE SENTENCES BLANK
Authors: RASULIS R SCHULDBERG D MURTAGH M
Citation: R. Rasulis et al., COMPUTER-ADMINISTERED TESTING WITH THE ROTTER INCOMPLETE SENTENCES BLANK, Computers in human behavior, 12(4), 1996, pp. 497-513
ELECTRONIC TRANSPORT-PROPERTIES OF LPCVD SEMIINSULATING POLYCRYSTALLINE SILICON (SIPOS)
Authors: AMOKRANE R LYNCH S MURTAGH M CREAN GM
Citation: R. Amokrane et al., ELECTRONIC TRANSPORT-PROPERTIES OF LPCVD SEMIINSULATING POLYCRYSTALLINE SILICON (SIPOS), Microelectronic engineering, 28(1-4), 1995, pp. 455-458
ANALYSIS OF SYNCHRONOUS PHASE, PUMP POWER, AND PUMP WAVELENGTH-DEPENDENT COMPLEX PR SPECTRA FROM GAAS MBE STRUCTURES
Authors: HILDEBRANDT S MURTAGH M KUZMENKO R KIRCHER W SCHREIBER J
Citation: S. Hildebrandt et al., ANALYSIS OF SYNCHRONOUS PHASE, PUMP POWER, AND PUMP WAVELENGTH-DEPENDENT COMPLEX PR SPECTRA FROM GAAS MBE STRUCTURES, Physica status solidi. a, Applied research, 152(1), 1995, pp. 147-160
COMPARISON OF VIBRIO-CHOLERAE O139 WITH VIBRIO-CHOLERAE O1 CLASSICAL AND EL-TOR BIOTYPES
Authors: CALIA KE MURTAGH M FERRARO MJ CALDERWOOD SB
Citation: Ke. Calia et al., COMPARISON OF VIBRIO-CHOLERAE O139 WITH VIBRIO-CHOLERAE O1 CLASSICAL AND EL-TOR BIOTYPES, Infection and immunity, 62(4), 1994, pp. 1504-1506
MEASUREMENT OF THE CIRCULATING MUON FLUX IN THE FERMILAB DEBUNCHER RING
Authors: BROSS A GORMLEY M HO Y KIM C LEE W MANNEL E MURTAGH M ODAY S PARK H
Citation: A. Bross et al., MEASUREMENT OF THE CIRCULATING MUON FLUX IN THE FERMILAB DEBUNCHER RING, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 332(1-2), 1993, pp. 27-31
ONLINE DETECTION AND MONITORING OF PLASMA ETCH DAMAGE TO SEMIINSULATING GAAS
Authors: HERBERT PAF MURTAGH M KELLY PV CREAN GM KELLY WM
Citation: Paf. Herbert et al., ONLINE DETECTION AND MONITORING OF PLASMA ETCH DAMAGE TO SEMIINSULATING GAAS, Microelectronic engineering, 21(1-4), 1993, pp. 315-320
NONDESTRUCTIVE DEPTH PROFILING OF SILICON ION-IMPLANTATION INDUCED DAMAGE IN SILICON (100) SUBSTRATES
Authors: LYNCH S MURTAGH M CREAN GM KELLY PV OCONNOR M JEYNES C
Citation: S. Lynch et al., NONDESTRUCTIVE DEPTH PROFILING OF SILICON ION-IMPLANTATION INDUCED DAMAGE IN SILICON (100) SUBSTRATES, Thin solid films, 233(1-2), 1993, pp. 199-202
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