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Results: 1-14 |
Results: 14
Extraction of coupling ratios for Fowler-Nordheim programming conditions
Authors: Duane, R Concannon, A O'Sullivan, P O'Shea, M Mathewson, A
Citation: R. Duane et al., Extraction of coupling ratios for Fowler-Nordheim programming conditions, SOL ST ELEC, 45(2), 2001, pp. 235-242
A physical compact model for direct tunneling from NMOS inversion layers
Authors: Clerc, R O'Sullivan, P McCarthy, KG Ghibaudo, G Pananakakis, G Mathewson, A
Citation: R. Clerc et al., A physical compact model for direct tunneling from NMOS inversion layers, SOL ST ELEC, 45(10), 2001, pp. 1705-1716
Thermomechanical stress analysis of Cu/low-k dielectric interconnect schemes
Authors: Mathewson, A De Oca, CGM Foley, S
Citation: A. Mathewson et al., Thermomechanical stress analysis of Cu/low-k dielectric interconnect schemes, MICROEL REL, 41(9-10), 2001, pp. 1637-1641
Direct tunnelling models for circuit simulation
Authors: O'Sullivan, P Clerc, R McCarthy, KG Mathewson, A Ghibaudo, G
Citation: P. O'Sullivan et al., Direct tunnelling models for circuit simulation, MICROEL REL, 41(7), 2001, pp. 951-957
Scaling embedded EEPROMs for the integration in deep submicron technologies
Authors: Duffy, R Concannon, A Mathewson, A Lane, B
Citation: R. Duffy et al., Scaling embedded EEPROMs for the integration in deep submicron technologies, MICROELEC J, 32(1), 2001, pp. 35-42
ICMTS 1999
Authors: Jeppson, KO Mathewson, A
Citation: Ko. Jeppson et A. Mathewson, ICMTS 1999, IEEE SEMIC, 13(2), 2000, pp. 117-118
An evaluation of test methods for the detection and control of interconnect reliability
Authors: Foley, S Molyneaux, J Mathewson, A
Citation: S. Foley et al., An evaluation of test methods for the detection and control of interconnect reliability, IEEE SEMIC, 13(2), 2000, pp. 127-135
Design for reliability
Authors: Minehane, S Duane, R O'Sullivan, P McCarthy, KG Mathewson, A
Citation: S. Minehane et al., Design for reliability, MICROEL REL, 40(8-10), 2000, pp. 1285-1294
Interface properties of the Si(100)-SiO2 system formed by rapid thermal oxidation
Authors: O'Sullivan, BJ Hurley, PK Mathewson, A Das, JH Daniel, AD
Citation: Bj. O'Sullivan et al., Interface properties of the Si(100)-SiO2 system formed by rapid thermal oxidation, MICROEL REL, 40(4-5), 2000, pp. 645-648
A novel fast technique for detecting voiding damage in IC interconnects
Authors: Foley, S Floyd, L Mathewson, A
Citation: S. Foley et al., A novel fast technique for detecting voiding damage in IC interconnects, MICROEL REL, 40(1), 2000, pp. 87-97
Modelling and simulation of reliability for design
Authors: Mathewson, A O'Sullivan, P Concannon, A Foley, S Minehane, S Duane, R Palser, K
Citation: A. Mathewson et al., Modelling and simulation of reliability for design, MICROEL ENG, 49(1-2), 1999, pp. 95-117
Analysis of external latch-up protection test structure design using numerical simulation
Authors: Palser, K Concannon, A Duffy, R Mathewson, A
Citation: K. Palser et al., Analysis of external latch-up protection test structure design using numerical simulation, MICROEL REL, 39(5), 1999, pp. 647-659
Long term noise measurements and median time to failure test for the characterization of electromigration in metal lines
Authors: Ciofi, C Dattilo, V Neri, B Foley, S Mathewson, A
Citation: C. Ciofi et al., Long term noise measurements and median time to failure test for the characterization of electromigration in metal lines, MICROEL REL, 39(11), 1999, pp. 1691-1696
An evaluation of fast wafer level test methods for interconnect reliability control
Authors: Foley, S Molyneaux, J Mathewson, A
Citation: S. Foley et al., An evaluation of fast wafer level test methods for interconnect reliability control, MICROEL REL, 39(11), 1999, pp. 1707-1714
Risultati: 1-14 |