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Results: 1-23 |
Results: 23
Dislocation structure of a defective near-surface skin layer in V2H - art.no. 214101
Authors: Trenkler, J Barabash, R Dosch, H Moss, SC
Citation: J. Trenkler et al., Dislocation structure of a defective near-surface skin layer in V2H - art.no. 214101, PHYS REV B, 6421(21), 2001, pp. 4101
X-ray diffraction from CuPt-ordered III-V ternary semiconductor alloy films - art. no. 155310
Authors: Li, JH Kulik, J Holy, V Zhong, Z Moss, SC Zhang, Y Ahrenkiel, SP Mascarenhas, A Bai, JM
Citation: Jh. Li et al., X-ray diffraction from CuPt-ordered III-V ternary semiconductor alloy films - art. no. 155310, PHYS REV B, 6315(15), 2001, pp. 5310
Quadruple-period ordering along [110] in a GaAs0.87Sb0.13 alloy - art. no.033314
Authors: Zhong, ZY Li, JH Kulik, J Chow, PC Norman, AG Mascarenhas, A Bai, J Golding, TD Moss, SC
Citation: Zy. Zhong et al., Quadruple-period ordering along [110] in a GaAs0.87Sb0.13 alloy - art. no.033314, PHYS REV B, 6303(3), 2001, pp. 3314
X-ray and neutron scattering study of Si-rich Si-Ge single crystals - art.no. 035204
Authors: Le Bolloc'h, D Robertson, JL Reichert, H Moss, SC Crow, ML
Citation: D. Le Bolloc'H et al., X-ray and neutron scattering study of Si-rich Si-Ge single crystals - art.no. 035204, PHYS REV B, 6303(3), 2001, pp. 5204-NIL_199
X-ray study of antiphase boundaries in the quadruple-period ordered GaAs0.87Sb0.13 alloy
Authors: Zhong, ZY Holy, V Li, JH Kulik, J Bai, J Golding, TD Moss, SC
Citation: Zy. Zhong et al., X-ray study of antiphase boundaries in the quadruple-period ordered GaAs0.87Sb0.13 alloy, J APPL PHYS, 90(2), 2001, pp. 644-649
Evolution of island-pit surface morphologies of InAs epilayers grown on GaAs (001) substrates
Authors: Li, JH Moss, SC Han, BS Mai, ZH
Citation: Jh. Li et al., Evolution of island-pit surface morphologies of InAs epilayers grown on GaAs (001) substrates, J APPL PHYS, 89(7), 2001, pp. 3700-3705
Lost flights
Authors: Moss, SC
Citation: Sc. Moss, Lost flights, COMMENTARY, 112(3), 2001, pp. 17-18
X-ray analysis of spontaneous lateral modulation in (InAs)(n)/(AlAs)(m) short-period superlattices
Authors: Li, JH Holy, V Zhong, Z Kulik, J Moss, SC Norman, AG Mascarenhas, A Reno, JL Follstaedt, DM
Citation: Jh. Li et al., X-ray analysis of spontaneous lateral modulation in (InAs)(n)/(AlAs)(m) short-period superlattices, APPL PHYS L, 78(2), 2001, pp. 219-221
Change from a bulk discontinuous phase transition in V2H to a continuous transition in a defective near-surface skin layer
Authors: Trenkler, J Abe, H Wochner, P Haeffner, D Bai, J Carstanjen, HD Moss, SC
Citation: J. Trenkler et al., Change from a bulk discontinuous phase transition in V2H to a continuous transition in a defective near-surface skin layer, MODEL SIM M, 8(3), 2000, pp. 269-275
Anomalous-X-ray scattering associated with short-range order in an Al70Ni15Co15 decagonal quasicrystal
Authors: Abe, H Tamura, N Le Bolloc'h, D Moss, SC Matsuo, Y Ishii, Y Bai, JM
Citation: H. Abe et al., Anomalous-X-ray scattering associated with short-range order in an Al70Ni15Co15 decagonal quasicrystal, MAT SCI E A, 294, 2000, pp. 299-302
Bose-Einstein condensation in atomic hydrogen
Authors: Greytak, TJ Kleppner, D Fried, DG Killian, TC Willmann, L Landhuis, D Moss, SC
Citation: Tj. Greytak et al., Bose-Einstein condensation in atomic hydrogen, PHYSICA B, 280(1-4), 2000, pp. 20-26
X-ray diffraction and transmission electron microscopy analysis of ordering and structure in Al1-xInxAs thin films
Authors: Forrest, RL Kulik, J Golding, TD Moss, SC
Citation: Rl. Forrest et al., X-ray diffraction and transmission electron microscopy analysis of ordering and structure in Al1-xInxAs thin films, J MATER RES, 15(1), 2000, pp. 45-55
Martensitic relief formation on an electropolished Ni-37 at.% Al (001) surface by diffuse X-ray scattering under grazing angles
Authors: Aspelmeyer, M Klemradt, U Abe, H Moss, SC Peisl, J
Citation: M. Aspelmeyer et al., Martensitic relief formation on an electropolished Ni-37 at.% Al (001) surface by diffuse X-ray scattering under grazing angles, MAT SCI E A, 275, 1999, pp. 286-290
High-resolution x-ray diffraction study of In0.25Ga0.75Sb/InAs superlattice
Authors: Vigliante, A Homma, H Zborowski, JT Golding, TD Moss, SC
Citation: A. Vigliante et al., High-resolution x-ray diffraction study of In0.25Ga0.75Sb/InAs superlattice, J MATER RES, 14(5), 1999, pp. 1744-1751
Electrochemical synthesis and characterization of La2CuO4+delta single crystals
Authors: Scarfe, DP Xiong, X Zhu, WJ Hor, PH Moss, SC Jacobson, AJ
Citation: Dp. Scarfe et al., Electrochemical synthesis and characterization of La2CuO4+delta single crystals, J MATER RES, 14(4), 1999, pp. 1221-1226
High-energy x-ray diffraction study of pure amorphous silicon
Authors: Laaziri, K Kycia, S Roorda, S Chicoine, M Robertson, JL Wang, J Moss, SC
Citation: K. Laaziri et al., High-energy x-ray diffraction study of pure amorphous silicon, PHYS REV B, 60(19), 1999, pp. 13520-13533
The science wars continue, with debate on 'Fashionable Nonsense'
Authors: Moss, SC
Citation: Sc. Moss, The science wars continue, with debate on 'Fashionable Nonsense', PHYS TODAY, 52(10), 1999, pp. 13
High resolution radial distribution function of pure amorphous silicon
Authors: Laaziri, K Kycia, S Roorda, S Chicoine, H Robertson, JL Wang, J Moss, SC
Citation: K. Laaziri et al., High resolution radial distribution function of pure amorphous silicon, PHYS REV L, 82(17), 1999, pp. 3460-3463
Time-dependent aspects of the athermal martensitic transformation: First observation of incubation time in Ni-Al
Authors: Aspelmeyer, M Klemradt, U Wood, LT Moss, SC Peisl, J
Citation: M. Aspelmeyer et al., Time-dependent aspects of the athermal martensitic transformation: First observation of incubation time in Ni-Al, PHYS ST S-A, 174(1), 1999, pp. R9-R10
Quantitative treatment for extracting coherent elastic scattering from X-ray scattering experiments
Authors: Laaziri, K Roberson, JL Roorda, S Chicoine, M Kycia, S Wang, J Moss, SC
Citation: K. Laaziri et al., Quantitative treatment for extracting coherent elastic scattering from X-ray scattering experiments, J APPL CRYS, 32, 1999, pp. 322-326
Metastable surface ordering in strain relaxed Si0.5Ge0.5 epitaxial layers grown at high temperature
Authors: Reichert, H Moss, SC Imperatori, P Evans-Lutterodt, K
Citation: H. Reichert et al., Metastable surface ordering in strain relaxed Si0.5Ge0.5 epitaxial layers grown at high temperature, APPL PHYS L, 74(4), 1999, pp. 531-533
X-ray diffraction and excitation photoluminescence analysis of ordered GaInP
Authors: Forrest, RL Golding, TD Moss, SC Zhang, Z Geisz, JF Olson, JM Mascarenhas, A Ernst, P Geng, C
Citation: Rl. Forrest et al., X-ray diffraction and excitation photoluminescence analysis of ordered GaInP, PHYS REV B, 58(23), 1998, pp. 15355-15358
X-ray absorption fine-structure spectroscopy studies of Fe sites in natural human neuromelanin and synthetic analogues
Authors: Kropf, AJ Bunker, BA Eisner, M Moss, SC Zecca, L Stroppolo, A Crippa, PR
Citation: Aj. Kropf et al., X-ray absorption fine-structure spectroscopy studies of Fe sites in natural human neuromelanin and synthetic analogues, BIOPHYS J, 75(6), 1998, pp. 3135-3142
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