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Results: 1-21 |
Results: 21

Authors: THOMANN AL BRAULT P LAURE C ROUSSEAU B ESTRADESZWARCKOPF H ANDREAZZAVIGNOLLE C ANDREAZZA P NAUDON A
Citation: Al. Thomann et al., PLASMA-ASSISTED DEPOSITION OF PD THIN-FILMS, Surface & coatings technology, 98(1-3), 1998, pp. 1228-1232

Authors: NAUDON A BABONNEAU D PETROFF F VAURES A
Citation: A. Naudon et al., MORPHOLOGICAL-STUDY OF COBALT AGGREGATES IN MAGNETIC MULTILAYERS BY GRAZING-INCIDENCE SMALL-ANGLE X-RAY-SCATTERING, Thin solid films, 319(1-2), 1998, pp. 81-83

Authors: BABONNEAU D CABIOCH T NAUDON A GIRARD JC DENANOT MF
Citation: D. Babonneau et al., SILVER NANOPARTICLES ENCAPSULATED IN CARBON CAGES OBTAINED BY COSPUTTERING OF THE METAL AND GRAPHITE, Surface science, 409(2), 1998, pp. 358-371

Authors: MOTTE L BILLOUDET F THIAUDIERE D NAUDON A PILENI MP
Citation: L. Motte et al., CHARACTERIZATION OF ORDERED 3D ARRAYS OF AG2S NANOCRYSTALLITES, Journal de physique. III, 7(3), 1997, pp. 517-527

Authors: NAUDON A BABONNEAU D
Citation: A. Naudon et D. Babonneau, CHARACTERIZATION OF AGGREGATES IN VERY THIN-LAYERS BY SMALL-ANGLE X-RAY-SCATTERING USING GRAZING-INCIDENCE, Zeitschrift fur Metallkunde, 88(8), 1997, pp. 596-600

Authors: NAUDON A THIAUDIERE D
Citation: A. Naudon et D. Thiaudiere, GRAZING-INCIDENCE SMALL-ANGLE SCATTERING - MORPHOLOGY OF DEPOSITED CLUSTERS AND NANOSTRUCTURE OF THIN-FILMS, Journal of applied crystallography, 30(2), 1997, pp. 822-827

Authors: GOUDEAU P BADAWI KF NAUDON A JAULIN M DURAND N BIMBAULT L BRANGER V
Citation: P. Goudeau et al., NEW X-RAY-DIFFRACTION EQUIPMENT FOR ANALY SIS OF MECHANICAL STATES (STRESS AND MICRODEFORMATION) OF THIN NANOCRYSTALLINE FILMS, Journal de physique. IV, 6(C4), 1996, pp. 187-196

Authors: THIAUDIERE D NAUDON A
Citation: D. Thiaudiere et A. Naudon, GRAZING-INCIDENCE X-RAY-SCATTERING - ANAL YSIS OF AGGREGATE MORPHOLOGY, Journal de physique. IV, 6(C4), 1996, pp. 553-560

Authors: NAUDON A THIAUDIERE D
Citation: A. Naudon et D. Thiaudiere, DETERMINATION OF THE MORPHOLOGY OF DEPOSITED ISLANDS BY GRAZING-INCIDENCE SMALL-ANGLE SCATTERING, Surface & coatings technology, 79(1-3), 1996, pp. 103-107

Authors: GOUDEAU P NAUDON A VEZIN V HALIMAOUI A BOMCHIL G LAMBERT B
Citation: P. Goudeau et al., CORRELATION BETWEEN THE POROUS SILICON MORPHOLOGY AND THE PHOTOLUMINESCENCE EFFICIENCY - A SAXS STUDY, Physica status solidi. b, Basic research, 190(1), 1995, pp. 63-68

Authors: MATHE EL NAUDON A REPPLINGER F FOGARASSY E
Citation: El. Mathe et al., MORPHOLOGY OF SI1-XGEX THIN CRYSTALLINE FILMS OBTAINED BY PULSED-EXCIMER-LASER ANNEALING OF HEAVILY GE-IMPLANTED SI, Applied surface science, 86(1-4), 1995, pp. 338-345

Authors: DURAND N BADAWI KF GOUDEAU P NAUDON A
Citation: N. Durand et al., RESIDUAL-STRESS EVOLUTION IN TUNGSTEN THI N-FILMS UNDER IRRADIATION, Journal de physique. III, 4(1), 1994, pp. 25-34

Authors: GLADYSZEWSKI G PACAUD J GOUDEAU P JAOUEN C NAUDON A GRILHE J
Citation: G. Gladyszewski et al., INTERFACE OF THE CU-W MULTILAYERS, Vacuum, 45(2-3), 1994, pp. 285-287

Authors: NAUDON A GOUDEAU P HALIMAOUI A LAMBERT B BOMCHIL G
Citation: A. Naudon et al., SMALL-ANGLE X-RAY-SCATTERING STUDY OF ANODICALLY OXIDIZED POROUS SILICON LAYERS, Journal of applied physics, 75(2), 1994, pp. 780-784

Authors: SLIMANI T THOFT NB NAUDON A
Citation: T. Slimani et al., PRECIPITATION STUDY IN THIN-LAYERS BY GRAZING SMALL-ANGLE SCATTERING OF X-RAYS, Journal de physique. IV, 3(C8), 1993, pp. 303-306

Authors: NAUDON A GOUDEAU P HALIMAOUI A BOMCHIL G
Citation: A. Naudon et al., SMALL-ANGLE X-RAY-SCATTERING STUDY OF THE MICROSTRUCTURE OF HIGHLY POROUS SILICON, Journal de physique. IV, 3(C8), 1993, pp. 349-352

Authors: CHIHAB J ALLAIN J NAUDON A
Citation: J. Chihab et al., LOCAL THICKNESS MEASUREMENTS USING REFLECTIVITY OF X-RAYS IN THE DISPERSIVE ANGLE MODE, Journal de physique. IV, 3(C8), 1993, pp. 467-470

Authors: NAUDON A THIAUDIERE D ARNAULT JJ DELAFOND J TEMPLIER C
Citation: A. Naudon et al., GRAZING-INCIDENCE SMALL-ANGLE X-RAY-SCATT ERING - A SUITABLE METHOD FOR THE STUDY OF AGGREGATES, Comptes rendus de l'Academie des sciences. Serie 2, Mecanique, physique, chimie, sciences de l'univers, sciences de la terre, 317(10), 1993, pp. 1275-1278

Authors: FOGARASSY E PREVOT B DEUNAMUNO S ELLIQ M PATTYN H MATHE EL NAUDON A
Citation: E. Fogarassy et al., PULSED LASER CRYSTALLIZATION OF HYDROGEN-FREE A-SI THIN-FILMS FOR HIGH-MOBILITY POLY-SI TFT FABRICATION, Applied physics. A, Solids and surfaces, 56(4), 1993, pp. 365-373

Authors: BADAWI KF GOUDEAU P PACAUD J JAOUEN C DELAFOND J NAUDON A GLADYSZEWSKI G
Citation: Kf. Badawi et al., X-RAY-DIFFRACTION STUDY OF RESIDUAL-STRESS MODIFICATION IN CU W SUPERLATTICES IRRADIATED BY LIGHT AND HEAVY-IONS/, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 80-1, 1993, pp. 404-407

Authors: GOUDEAU P NAUDON A HALIMAOUI A BOMCHIL G
Citation: P. Goudeau et al., SAXS STUDY OF THE INFLUENCE OF THE POROUS SILICON MORPHOLOGY ON THE PHOTOLUMINESCENCE EFFICIENCY, Journal of luminescence, 57(1-6), 1993, pp. 141-145
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