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Results:
1-19
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Results: 19
Authors:
Brambilla, G
Buiarelli, F
Cartoni, GP
Coccioli, F
Colamonici, C
Fagiolo, A
Giannini, C
Neri, B
Citation: G. Brambilla et al., Determination of flumethasone in calf urine and serum by liquid chromatography-tandem mass spectrometry, J CHROMAT B, 755(1-2), 2001, pp. 265-278
Authors:
Crupi, F
Ciofi, C
Iannaccone, G
Neri, B
Lombardo, S
Citation: F. Crupi et al., Current noise at the oxide hard-breakdown, MICROEL ENG, 59(1-4), 2001, pp. 43-47
Authors:
Hessner, MJ
Dinauer, DM
Kwiatkowski, R
Neri, B
Raife, TJ
Citation: Mj. Hessner et al., Age-dependent prevalence of vascular disease-associated polymorphisms among 2689 volunteer blood donors, CLIN CHEM, 47(10), 2001, pp. 1879-1884
Authors:
Neri, B
Cini, G
Andreoli, F
Boffi, B
Francesconi, D
Mazzanti, R
Medi, F
Mercatelli, A
Romano, S
Siliani, L
Tarquini, R
Moretti, R
Citation: B. Neri et al., Randomized trial of adjuvant chemotherapy versus central after curative resection for gastric cancer: 5-year follow-up, BR J CANC, 84(7), 2001, pp. 878-880
Authors:
Pacini, P
Rinaldini, M
Algeri, R
Guarneri, A
Tucci, E
Barsanti, G
Neri, B
Bastiani, P
Marzano, S
Fallai, C
Citation: P. Pacini et al., FEC (5-fluorouracil, epidoxorubicin and cyclophosphamide) versus EM (epidoxorubicin and mitomycin-C) with or without lonidamine as first-line treatment for advanced breast cancer. A multicentric randomised study. Final results, EUR J CANC, 36(8), 2000, pp. 966-975
Authors:
Crupi, F
Neri, B
Lombardo, S
Citation: F. Crupi et al., Pre-breakdown in thin SiO2 films, IEEE ELEC D, 21(6), 2000, pp. 319-321
Authors:
Dattilo, V
Neri, B
Ciofi, C
Citation: V. Dattilo et al., Low frequency noise evolution during lifetime tests of lines and vias subjected to electromigration, MICROEL REL, 40(8-10), 2000, pp. 1323-1327
Authors:
Crupi, F
Iannaccone, G
Neri, B
Ciofi, C
Lombardo, S
Citation: F. Crupi et al., Short noise partial suppression in the SILC regime, MICROEL REL, 40(8-10), 2000, pp. 1605-1608
Authors:
Ciofi, C
Neri, B
Citation: C. Ciofi et B. Neri, Low-frequency noise measurements as a characterization tool for degradation phenomena in solid-state devices, J PHYS D, 33(21), 2000, pp. R199-R216
Authors:
Ciofi, C
Ciofi, I
Di Pascoli, S
Neri, B
Citation: C. Ciofi et al., Temperature controlled oven for low noise measurement systems, IEEE INSTR, 49(3), 2000, pp. 546-549
Authors:
Iannaccone, G
Crupi, F
Neri, B
Lombardo, S
Citation: G. Iannaccone et al., Suppressed shot noise in trap-assisted tunneling of metal-oxide-semiconductor capacitors, APPL PHYS L, 77(18), 2000, pp. 2876-2878
Authors:
Lombardo, S
Crupi, F
Spinella, C
Neri, B
Citation: S. Lombardo et al., Transients during pre-breakdown and hard breakdown of thin gate oxides in metal-SiO2-Si capacitors, MAT SC S PR, 2(4), 1999, pp. 359-367
Authors:
Kwiatkowski, RW
Lyamichev, V
de Arruda, M
Neri, B
Citation: Rw. Kwiatkowski et al., Clinical, genetic, and pharmacogenetic applications of the invader assay, MOL DIAGN, 4(4), 1999, pp. 353-364
Authors:
Sander, T
Olson, S
Hall, J
Siebert, M
Grooms, K
Heisler, L
de Arruda, M
Neri, B
Citation: T. Sander et al., Comparison of detection platforms and post-polymerase chain reaction DNA purification methods for use in conjunction with Cleavase fragment length polymorphism analysis, ELECTROPHOR, 20(6), 1999, pp. 1131-1140
Authors:
Ciofi, C
Dattilo, V
Neri, B
Foley, S
Mathewson, A
Citation: C. Ciofi et al., Long term noise measurements and median time to failure test for the characterization of electromigration in metal lines, MICROEL REL, 39(11), 1999, pp. 1691-1696
Authors:
Kaiser, MW
Lyamicheva, N
Ma, WP
Miller, C
Neri, B
Fors, L
Lyamichev, VI
Citation: Mw. Kaiser et al., A comparison of eubacterial and archaeal structure-specific 5 '-exonucleases, J BIOL CHEM, 274(30), 1999, pp. 21387-21394
Authors:
Lombardi, G
Neri, B
Citation: G. Lombardi et B. Neri, Criteria for the evaluation of unconditional stability of microwave lineartwo-ports: A critical review and new proof, IEEE MICR T, 47(6), 1999, pp. 746-751
Authors:
D'Angelo, G
Fanucci, L
Monorchio, A
Monterastelli, A
Neri, B
Citation: G. D'Angelo et al., High-quality active inductors, ELECTR LETT, 35(20), 1999, pp. 1727-1728
True constant temperature measurement system for lifetime tests of metallic interconnections of IC's
Authors:
Ciofi, C
Giannetti, R
Neri, B
Citation: C. Ciofi et al., True constant temperature measurement system for lifetime tests of metallic interconnections of IC's, IEEE INSTR, 47(5), 1998, pp. 1187-1190
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