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Results: 1-25/36
Authors:
Goken, M
Kempf, M
Nix, WD
Citation: M. Goken et al., Hardness and modulus of the lamellar microstructure in PST-TiAl studied bynanoindentations and AFM, ACT MATER, 49(5), 2001, pp. 903-911
Authors:
Qiu, X
Huang, Y
Nix, WD
Hwang, KC
Gao, H
Citation: X. Qiu et al., Effect of intrinsic lattice resistance in strain gradient plasticity, ACT MATER, 49(19), 2001, pp. 3949-3958
Authors:
Huang, Y
Aziz, MJ
Hutchinson, JW
Evans, AG
Saha, R
Nix, WD
Citation: Y. Huang et al., Comparison of mechanical properties of Ni3Al thin films in disordered FCC and ordered L1(2) phases, ACT MATER, 49(14), 2001, pp. 2853-2861
Authors:
Wright, WJ
Saha, R
Nix, WD
Citation: Wj. Wright et al., Deformation mechanisms of the Zr40Ti14Ni10Cu12Be24 bulk metallic glass, MATER TRANS, 42(4), 2001, pp. 642-649
Authors:
Uchic, MD
Nix, WD
Citation: Md. Uchic et Wd. Nix, Sigmoidal creep of Ni-3(Al, Ta), INTERMETALL, 9(12), 2001, pp. 1053-1061
Authors:
Uchic, MD
Chrzan, DC
Nix, WD
Citation: Md. Uchic et al., Primary creep of Ni-3(Al, Ta) in the anomalous flow regime, INTERMETALL, 9(10-11), 2001, pp. 963-969
Authors:
Saha, R
Xue, ZY
Huang, Y
Nix, WD
Citation: R. Saha et al., Indentation of a soft metal film on a hard substrate: strain gradient hardening effects, J MECH PHYS, 49(9), 2001, pp. 1997-2014
Authors:
Kim, DK
Nix, WD
Vinci, RP
Deal, MD
Plummer, JD
Citation: Dk. Kim et al., Study of the effect of grain boundary migration on hillock formation in Althin films, J APPL PHYS, 90(2), 2001, pp. 781-788
Authors:
Chrzan, DC
Uchic, MD
Nix, WD
Citation: Dc. Chrzan et al., Self-immobilization of superdislocations in Ll(2) alloys: a simple statistical analysis (vol 79, pg 2397, 1999), PHIL MAG A, 80(10), 2000, pp. 2467-2467
Authors:
Brennan, S
Munkholm, A
Leung, OS
Nix, WD
Citation: S. Brennan et al., X-ray measurements of the depth dependence of stress in gold films, PHYSICA B, 283(1-3), 2000, pp. 125-129
Authors:
Kim, D
Nix, WD
Deal, MD
Plummer, JD
Citation: D. Kim et al., Creep-controlled diffusional hillock formation in blanket aluminum thin films as a mechanism of stress relaxation, J MATER RES, 15(8), 2000, pp. 1709-1718
Authors:
Huang, Y
Xue, Z
Gao, H
Nix, WD
Xia, ZC
Citation: Y. Huang et al., A study of microindentation hardness tests by mechanism-based strain gradient plasticity, J MATER RES, 15(8), 2000, pp. 1786-1796
Authors:
Phillips, MA
Ramaswamy, V
Clemens, BM
Nix, WD
Citation: Ma. Phillips et al., Stress and microstructure evolution during initial growth of Pt on amorphous substrates, J MATER RES, 15(11), 2000, pp. 2540-2546
Authors:
Holloway, BC
Kraft, O
Shuh, DK
Nix, WD
Kelly, M
Pianetta, P
Hagstrom, S
Citation: Bc. Holloway et al., Role of delocalized nitrogen in determining the local atomic arrangement and mechanical properties of amorphous carbon nitride thin films, J VAC SCI A, 18(6), 2000, pp. 2964-2971
Authors:
Berding, MA
Nix, WD
Rhiger, DR
Sen, S
Sher, A
Citation: Ma. Berding et al., Critical thickness in the HgCdTe/CdZnTe system, J ELEC MAT, 29(6), 2000, pp. 676-679
Authors:
Kim, D
Heiland, B
Nix, WD
Arzt, E
Deal, MD
Plummer, JD
Citation: D. Kim et al., Microstructure of thermal hillocks on blanket Al thin films, THIN SOL FI, 371(1-2), 2000, pp. 278-282
Authors:
Huang, Y
Gao, H
Nix, WD
Hutchinson, JW
Citation: Y. Huang et al., Mechanism-based strain gradient plasticity - II. Analysis, J MECH PHYS, 48(1), 2000, pp. 99-128
Authors:
Leung, OS
Munkholm, A
Brennan, S
Nix, WD
Citation: Os. Leung et al., A search for strain gradients in gold thin films on substrates using x-raydiffraction, J APPL PHYS, 88(3), 2000, pp. 1389-1396
Authors:
Clemens, BM
Nix, WD
Ramaswamy, V
Citation: Bm. Clemens et al., Surface-energy-driven intermixing and its effect on the measurement of interface stress, J APPL PHYS, 87(6), 2000, pp. 2816-2820
Authors:
Schulze, M
Nix, WD
Citation: M. Schulze et Wd. Nix, Finite element analysis of the wedge delamination test, INT J SOL S, 37(7), 2000, pp. 1045-1063
Authors:
Gao, H
Ozkan, CS
Nix, WD
Zimmerman, JA
Freund, LB
Citation: H. Gao et al., Atomistic models of dislocation formation at crystal surface ledges in Si1-xGex/Si(100) heteroepitaxial thin films, PHIL MAG A, 79(2), 1999, pp. 349-370
Authors:
Chrzan, DC
Uchic, MD
Nix, WD
Citation: Dc. Chrzan et al., Self-immobilization of superdislocations in L1(2) alloys: a simple statistical analysis, PHIL MAG A, 79(10), 1999, pp. 2397-2412
Authors:
Gao, H
Zhang, L
Nix, WD
Thompson, CV
Arzt, E
Citation: H. Gao et al., Crack-like grain-boundary diffusion wedges in thin metal films, ACT MATER, 47(10), 1999, pp. 2865-2878
Authors:
Kitabjian, PH
Garg, A
Noebe, RD
Nix, WD
Citation: Ph. Kitabjian et al., High-temperature deformation behavior of NiAl(Ti) solid-solution single crystals, MET MAT T A, 30(3), 1999, pp. 587-600
Authors:
Ozkan, CS
Nix, WD
Gao, HJ
Citation: Cs. Ozkan et al., Stress-driven surface evolution in heteroepitaxial thin films: Anisotropy of the two-dimensional roughening mode, J MATER RES, 14(8), 1999, pp. 3247-3256