Authors:
LALINSKY T
OSVALD J
MACHAJDIK D
MOZOLOVA Z
SISOLAK J
CONSTANTINIDIS G
KOBZEV AP
Citation: T. Lalinsky et al., HIGH-TEMPERATURE STABLE IR-AL N-GAAS SCHOTTKY DIODES - EFFECT OF THE BARRIER HEIGHT CONTROLLING/, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(2), 1996, pp. 657-661
Citation: J. Osvald et E. Dobrocka, GENERALIZED-APPROACH TO THE PARAMETER EXTRACTION FROM I-V CHARACTERISTICS OF SCHOTTKY DIODES, Semiconductor science and technology, 11(8), 1996, pp. 1198-1202
Citation: E. Dobrocka et J. Osvald, INFLUENCE OF BARRIER HEIGHT DISTRIBUTION ON THE PARAMETERS OF SCHOTTKY DIODES - RESPONSE, Applied physics letters, 66(22), 1995, pp. 3069-3069
Authors:
ARISTOV VY
LELAY G
HRICOVINI K
TALEBIBRAHIMI A
DUMAS P
GUNTHER R
OSVALD J
INDLEKOFER G
Citation: Vy. Aristov et al., NEARLY COMPLETE TUNING OF THE FERMI-LEVEL POSITION AT A PROTOTYPICAL METAL-SILICON INTERFACE - LEAD ON UNPINNED SI(111)1X1-H, Journal of electron spectroscopy and related phenomena, 68, 1994, pp. 419-426
Citation: E. Dobrocka et J. Osvald, INFLUENCE OF BARRIER HEIGHT DISTRIBUTION ON THE PARAMETERS OF SCHOTTKY DIODES, Applied physics letters, 65(5), 1994, pp. 575-577
Citation: J. Osvald et T. Lalinsky, BARRIER HEIGHT ENHANCEMENT IN WSIX GAAS SCHOTTKY DIODES BY RAPID THERMAL ANNEALING/, Journal of materials science. Materials in electronics, 4(4), 1993, pp. 267-270