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Results:
1-17
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Results: 17
Authors:
Oesterschulze, E
Citation: E. Oesterschulze, Recent developments of probes for scanning probe microscopy, ADV IMAG EL, 118, 2001, pp. 129-206
Authors:
Oesterschulze, E
Heisig, S
Steffens, WM
Citation: E. Oesterschulze et al., Cantilever probes for spatio-temporal imaging of voltage pulses with an ultrafast scanning probe microscope, J VAC SCI B, 19(1), 2001, pp. 107-110
Authors:
Mihalcea, C
Holz, A
Kuwahara, A
Tominaga, J
Oesterschulze, E
Atoda, N
Citation: C. Mihalcea et al., Improved anisotropic deep etching in KOH-solutions to fabricate highly specular surfaces, MICROEL ENG, 57-8, 2001, pp. 781-786
Authors:
Rudow, O
Vollkopf, A
Muller-Wiegand, M
Georgiev, G
Oesterschulze, E
Citation: O. Rudow et al., Theoretical investigations of a coaxial probe concept for scanning near-field optical microscopy, OPT COMMUN, 189(4-6), 2001, pp. 187-192
Authors:
Oesterschulze, E
Georgiev, G
Muller-Wiegand, M
Vollkopf, A
Rudow, O
Citation: E. Oesterschulze et al., Transmission line probe based on a bow-tie antenna, J MICROSC O, 202, 2001, pp. 39-44
Authors:
Vollkopf, A
Georgiev, G
Rudow, O
Muller-Wiegand, M
Oesterschulze, E
Citation: A. Vollkopf et al., Technology to reduce the aperture size of microfabricated silicon dioxide aperture tips, J ELCHEM SO, 148(10), 2001, pp. G587-G591
Authors:
Bonin, M
Oberstrass, J
Lukacs, N
Ewert, K
Oesterschulze, E
Kassing, R
Nellen, W
Citation: M. Bonin et al., Determination of preferential binding sites for anti-dsRNA antibodies on double-stranded RNA by scanning force microscopy, RNA, 6(4), 2000, pp. 563-570
Authors:
Heisig, S
Rudow, O
Oesterschulze, E
Citation: S. Heisig et al., Optical active gallium arsenide cantilever probes for combined scanning near-field optical microscopy and scanning force microscopy, J VAC SCI B, 18(3), 2000, pp. 1134-1137
Authors:
Trenkler, T
Hantschel, T
Stephenson, R
De Wolf, P
Vandervorst, W
Hellemans, L
Malave, A
Buchel, D
Oesterschulze, E
Kulisch, W
Niedermann, P
Sulzbach, T
Ohlsson, O
Citation: T. Trenkler et al., Evaluating probes for "electrical" atomic force microscopy, J VAC SCI B, 18(1), 2000, pp. 418-427
Authors:
Mihalcea, C
Vollkopf, A
Oesterschulze, E
Citation: C. Mihalcea et al., Reproducible large-area microfabrication of sub-100 nm apertures on hollowtips, J ELCHEM SO, 147(5), 2000, pp. 1970-1972
Authors:
Heisig, S
Rudow, O
Oesterschulze, E
Citation: S. Heisig et al., Scanning near-field optical microscopy in the near-infrared region using light emitting cantilever probes, APPL PHYS L, 77(8), 2000, pp. 1071-1073
Authors:
Steffens, WM
Heisig, S
Keil, UD
Oesterschulze, E
Citation: Wm. Steffens et al., Spatio-temporal imaging of voltage pulses with a laser-gated photoconductive sampling probe, APP PHYS B, 69(5-6), 1999, pp. 455-458
Authors:
Malave, A
Oesterschulze, E
Kulisch, W
Trenkler, T
Hantschel, T
Vandervorst, W
Citation: A. Malave et al., Diamond tips and cantilevers for the characterization of semiconductor devices, DIAM RELAT, 8(2-5), 1999, pp. 283-287
Authors:
Hantschel, T
Trenkler, T
Vandervorst, W
Malave, A
Buchel, D
Kulisch, W
Oesterschulze, E
Citation: T. Hantschel et al., Tip-on-tip: a novel AFM tip configuration for the electrical characterization of semiconductor devices, MICROEL ENG, 46(1-4), 1999, pp. 113-116
Authors:
Vollkopf, A
Rudow, O
Leinhos, T
Mihalcea, C
Oesterschulze, E
Citation: A. Vollkopf et al., Modified fabrication process for aperture probe cantilevers, J MICROSC O, 194, 1999, pp. 344-348
Authors:
Leinhos, T
Rudow, O
Stopka, M
Vollkopf, A
Oesterschulze, E
Citation: T. Leinhos et al., Coaxial probes for scanning near-field microscopy, J MICROSC O, 194, 1999, pp. 349-352
Authors:
Steffens, WM
Oesterschulze, E
Citation: Wm. Steffens et E. Oesterschulze, Scanning force microscope cantilever for voltage sampling with ultrafast time resolution, ELECTR LETT, 35(13), 1999, pp. 1106-1108
Risultati:
1-17
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