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Results: 1-19 |
Results: 19

Authors: POLICICCHIO I PECORA A CARLUCCIO R MARIUCCI L FORTUNATO G PLAIS F PRIBAT D
Citation: I. Policicchio et al., DETERMINATION OF EXCESS CURRENT DUE TO IMPACT IONIZATION IN POLYCRYSTALLINE SILICON THIN-FILM TRANSISTORS, Solid-state electronics, 42(4), 1998, pp. 613-618

Authors: PECORA A MARIUCCI L CARLUCCIO R FORTUNATO G LEGAGNEUX P PLAIS F REITA C PRIBAT D STOEMENOS J
Citation: A. Pecora et al., COMBINED SOLID-PHASE CRYSTALLIZATION AND EXCIMER-LASER ANNEALING PROCESS FOR POLYSILICON THIN-FILM TRANSISTORS, Physica status solidi. a, Applied research, 166(2), 1998, pp. 707-714

Authors: MARIUCCI L FORTUNATO G CARLUCCIO R PECORA A GIOVANNINI S MASSUSSI F COLALONGO L VALDINOCI M
Citation: L. Mariucci et al., DETERMINATION OF HOT-CARRIER-INDUCED INTERFACE STATE DENSITY IN POLYCRYSTALLINE SILICON THIN-FILM TRANSISTORS, Journal of applied physics, 84(4), 1998, pp. 2341-2348

Authors: MARIUCCI L GIACOMETTI F PECORA A MASSUSSI F FORTUNATO G VALDINOCI M COLALONGO L
Citation: L. Mariucci et al., NUMERICAL-ANALYSIS OF ELECTRICAL CHARACTERISTICS OF POLYSILICON THIN-FILM TRANSISTORS FABRICATED BY EXCIMER-LASER CRYSTALLIZATION, Electronics Letters, 34(9), 1998, pp. 924-926

Authors: VALDINOCI M COLALONGO L BACCARANI G PECORA A POLICICCHIO I FORTUNATO G PLAIS F LEGAGNEUX P REITA C PRIBAT D
Citation: M. Valdinoci et al., ANALYSIS OF ELECTRICAL CHARACTERISTICS OF POLYCRYSTALLINE SILICON THIN-FILM TRANSISTORS UNDER STATIC AND DYNAMIC CONDITIONS, Solid-state electronics, 41(9), 1997, pp. 1363-1369

Authors: VALDINOCI M COLALONGO L BACCARANI G FORTUNATO G PECORA A POLICICCHIO I
Citation: M. Valdinoci et al., FLOATING BODY EFFECTS IN POLYSILICON THIN-FILM TRANSISTORS, I.E.E.E. transactions on electron devices, 44(12), 1997, pp. 2234-2241

Authors: GIOVANNINI S MARIUCCI L PECORA A FOGLIETTI V FORTUNATO G REITA C
Citation: S. Giovannini et al., EXCESS NOISE IN POLYSILICON THIN-FILM TRANSISTORS OPERATED IN KINK REGIME, Electronics Letters, 33(24), 1997, pp. 2075-2077

Authors: PRILUTSKAYA M UMIEL T HERZIG RM MEAGHAR R COOPER B KENNEDY MJ MEAGHER R PECORA A COPELAN E LAZARUS HM MOS TJ
Citation: M. Prilutskaya et al., THE PRESENCE OF CLONOGENIC BREAST-CANCER CELLS IN BONE-MARROW (BM) CORRELATES WITH A POOR-PROGNOSIS FOR PATIENTS WITH STAGE-IV DISEASE, Blood, 90(10), 1997, pp. 4574-4574

Authors: GLASPY J LU ZJ WHEELER C BROWN R SHEA T MANGAN K LEMAISTRE C LONG G PECORA A YANOVICH S ERDER MH CHAN W SHPALL EJ
Citation: J. Glaspy et al., ECONOMIC RATIONALE FOR INFUSING OPTIMAL NUMBERS OF CD34(-BLOOD PROGENITOR-CELL TRANSPLANTS (PBPCT)() CELLS IN PERIPHERAL), Blood, 90(10), 1997, pp. 1646-1646

Authors: GIOVANNINI S CARLUCCIO R MARIUCCI L PECORA A FORTUNATO G REITA C PLAIS F PRIBAT D
Citation: S. Giovannini et al., HOT-CARRIER-INDUCED MODIFICATIONS TO THE NOISE PERFORMANCE OF POLYCRYSTALLINE SILICON THIN-FILM TRANSISTORS, Applied physics letters, 71(9), 1997, pp. 1216-1218

Authors: FORTUNATO G PECORA A POLICICCHIO I PLAIS F PRIBAT D
Citation: G. Fortunato et al., KINETICS OF INTERFACE STATE GENERATION INDUCED BY HOT CARRIERS IN N-CHANNEL POLYCRYSTALLINE SILICON THIN-FILM TRANSISTORS, JPN J A P 1, 35(2B), 1996, pp. 1544-1547

Authors: PECORA A SCHILLIZZI M TALLARIDA G FORTUNATO G REITA C MIGLIORATO P
Citation: A. Pecora et al., OFF-CURRENT IN POLYCRYSTALLINE SILICON THIN-FILM TRANSISTORS - AN ANALYSIS OF THE THERMALLY GENERATED COMPONENT, Solid-state electronics, 38(4), 1995, pp. 845-850

Authors: TALLARIDA G PECORA A FORTUNATO G PLAIS F LEGAGNEUX P KRETZ T PRIBAT D
Citation: G. Tallarida et al., LEAKAGE CURRENT REDUCTION DUE TO HOT-CARRIER EFFECTS IN N-CHANNEL POLYCRYSTALLINE SILICON THIN-FILM TRANSISTORS, Journal of non-crystalline solids, 187, 1995, pp. 195-198

Authors: MOSS TJ PECORA A COOPER BW LAZARUS HM KAHN D GLASGOW J
Citation: Tj. Moss et al., THE INCIDENCE OF TUMOR CONTAMINATION IN PERIPHERAL-BLOOD STEM-CELL (PBSC) COLLECTIONS IN PATIENTS WITH SMALL-CELL LUNG-CARCINOMA (SCLC), Blood, 86(10), 1995, pp. 3946-3946

Authors: PECORA A TALLARIDA G FORTUNATO G MARIUCCI L REITA C MIGLIORATO P
Citation: A. Pecora et al., HOT-HOLE-INDUCED DEGRADATION IN POLYCRYSTALLINE SILICON THIN-FILM TRANSISTORS - EXPERIMENTAL AND THEORETICAL-ANALYSIS, IEE proceedings. Part G. Circuits, devices and systems, 141(1), 1994, pp. 33-37

Authors: QUINN M MIGLIORATO P REITA C PECORA A TALLARIDA G FORTUNATO G
Citation: M. Quinn et al., HIGH-FIELD EFFECTS IN POLYSILICON THIN-FILM TRANSISTORS, IEE proceedings. Part G. Circuits, devices and systems, 141(1), 1994, pp. 45-49

Authors: FORTUNATO G PECORA A TALLARIDA G MARIUCCI L REITA C MIGLIORATO P
Citation: G. Fortunato et al., HOT-CARRIER EFFECTS IN N-CHANNEL POLYCRYSTALLINE SILICON THIN-FILM TRANSISTORS - A CORRELATION BETWEEN OFF-CURRENT AND TRANSCONDUCTANCE VARIATIONS, I.E.E.E. transactions on electron devices, 41(3), 1994, pp. 340-346

Authors: KOERNER S CHIESA J MORLEY T CELLUZZI A PECORA A
Citation: S. Koerner et al., THE NATURAL-HISTORY OF GASTROESOPHAGEAL REFLUX (GER) IN HOSPITALIZED-PATIENTS WITH EMPHYSEMA, Gastroenterology, 106(4), 1994, pp. 10000109-10000109

Authors: PECORA A FORTUNATO G CARLUCCIO R SACCO S
Citation: A. Pecora et al., HYDROGENATED AMORPHOUS-SILICON BASED LIGHT-ADDRESSABLE POTENTIOMETRICSENSOR (LAPS) FOR HYDROGEN DETECTION, Journal of non-crystalline solids, 166, 1993, pp. 793-796
Risultati: 1-19 |