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Results: 1-20 |
Results: 20

Authors: PITSCHKE W BRUCKNER W
Citation: W. Pitschke et W. Bruckner, PHASE-FORMATION PROCESS OF SPUTTERED NICR(37 63) THIN-FILMS/, Fresenius' journal of analytical chemistry, 361(6-7), 1998, pp. 608-609

Authors: KURT R PITSCHKE W THOMAS J WENDROCK H BRUCKNER W WETZIG K
Citation: R. Kurt et al., INVESTIGATION OF THE MICROSTRUCTURE OF IRSIX THIN-FILMS, Fresenius' journal of analytical chemistry, 361(6-7), 1998, pp. 609-613

Authors: BURKOV AT HEINRICH A GLADUN C PITSCHKE W SCHUMANN J
Citation: At. Burkov et al., EFFECT OF INTERPHASE BOUNDARIES ON RESISTIVITY AND THERMOPOWER OF NANOCRYSTALLINE RE-SI THIN-FILM COMPOSITES, Physical review. B, Condensed matter, 58(15), 1998, pp. 9644-9647

Authors: THOMAS J SCHUMANN J PITSCHKE W
Citation: J. Thomas et al., CHARACTERIZATION OF RHENIUM-SILICON THIN-FILMS, Fresenius' journal of analytical chemistry, 358(1-2), 1997, pp. 325-328

Authors: BEHR G WERNER J OSWALD S KRABBES G DORDOR P ELEFANT D PITSCHKE W
Citation: G. Behr et al., IN2O3 - DIFFERENCES IN THE CHEMICAL AND PHYSICAL BEHAVIOR OF SINGLE-CRYSTALS, CERAMICS AND FINE POWDERS, Solid state ionics, 101, 1997, pp. 1183-1187

Authors: KURT R PITSCHKE W HEINRICH A SCHUMANN J THOMAS J WETZIG K BURKOV A
Citation: R. Kurt et al., PHASE-FORMATION PROCESS OF IRXSI1-X THIN-FILMS STRUCTURE AND ELECTRICAL-PROPERTIES, Thin solid films, 310(1-2), 1997, pp. 8-18

Authors: COLLAZO J HERMANN H PITSCHKE W WETZIG K
Citation: J. Collazo et al., MICROABSORPTION OF X-RAYS IN PLANAR POWDER SAMPLES IN THE NONSYMMETRICAL REFLECTION CASE, Journal of applied crystallography, 30, 1997, pp. 312-319

Authors: BUCHGEISTER M PITSCHKE W
Citation: M. Buchgeister et W. Pitschke, HIGH-TEMPERATURE X-RAY-DIFFRACTION PHASE-ANALYSIS OF YNI2B2C, Physica. C, Superconductivity, 264(3-4), 1996, pp. 250-254

Authors: BURKOV AT GLADUN C HEINRICH A PITSCHKE W SCHUMANN J
Citation: At. Burkov et al., PHASE-FORMATION AND TRANSPORT-PROPERTIES IN AMORPHOUS AND NANOCRYSTALLINE CRXSI1-X AND REXSI1-X THIN-FILMS, Journal of non-crystalline solids, 207, 1996, pp. 737-741

Authors: PITSCHKE W COLLAZO JAL HERMANN H HILDENBRAND VD
Citation: W. Pitschke et al., ABSORPTION CORRECTIONS OF POWDER DIFFRACTION INTENSITIES RECORDED IN TRANSMISSION GEOMETRY, Journal of applied crystallography, 29, 1996, pp. 561-567

Authors: BRUCKNER W SCHUMANN J BAUNACK S PITSCHKE W KNUTH T
Citation: W. Bruckner et al., RESISTANCE BEHAVIOR AND INTERDIFFUSION OF LAYERED CUNI-NICR FILMS, Thin solid films, 258(1-2), 1995, pp. 236-246

Authors: MATTERN N PITSCHKE W DANZIG A DOYLE S
Citation: N. Mattern et al., X-RAY-DIFFRACTION AT HIGH-TEMPERATURES, Fresenius' journal of analytical chemistry, 349(1-3), 1994, pp. 91-96

Authors: PITSCHKE W KOCH M HEINRICH A SCHUMANN J
Citation: W. Pitschke et al., HIGH-TEMPERATURE X-RAY-DIFFRACTION STUDIES OF THE CRYSTALLIZATION PROCESS OF THIN AMORPHOUS FILMS WITH THE CHEMICAL-COMPOSITION CRSI2.57, Fresenius' journal of analytical chemistry, 349(1-3), 1994, pp. 246-247

Authors: SCHUMANN J GLADUN C MONCH JI HEINRICH A THOMAS J PITSCHKE W
Citation: J. Schumann et al., NANODISPERSED CRXSI1-X THIN-FILMS - TRANSPORT-PROPERTIES AND THERMOELECTRIC APPLICATION, Thin solid films, 246(1-2), 1994, pp. 24-29

Authors: DOYLE SE MATTERN N PITSCHKE W WEISE G KRAUT D BAUER HD
Citation: Se. Doyle et al., X-RAY-DIFFRACTION STUDIES OF THE STRUCTURE OF MOLYBDENUM SULFIDE THIN-FILMS, Thin solid films, 245(1-2), 1994, pp. 255-259

Authors: SCHUMANN J ELEFANT D GLADUN C HEINRICH A PITSCHKE W LANGE H HENRION W GROTZSCHEL R
Citation: J. Schumann et al., POLYCRYSTALLINE IRIDIUM SILICIDE FILMS - PHASE-FORMATION, ELECTRICAL AND OPTICAL-PROPERTIES, Physica status solidi. a, Applied research, 145(2), 1994, pp. 429-439

Authors: GLADUN C HEINRICH A SCHUMANN J PITSCHKE W VINZELBERG H
Citation: C. Gladun et al., TRANSPORT-PROPERTIES OF NANODISPERSE CRXSI1-X THIN-FILMS, International journal of electronics, 77(3), 1994, pp. 301-308

Authors: HU BP WENDHAUSEN PAP ECKERT D PITSCHKE W HANDSTEIN A MULLER KH
Citation: Bp. Hu et al., DEVELOPMENT OF COERCIVITY ON NDFE12-XMOXN0.9 NITRIDES WITH LOW MO CONCENTRATION, IEEE transactions on magnetics, 30(2), 1994, pp. 645-647

Authors: HANDSTEIN A WENDHAUSEN PAP MULLER KH GEBEL B PITSCHKE W ECKERT D MAYERHOFER O KIRCHMAYR HR
Citation: A. Handstein et al., INFLUENCE OF HOT ISOSTATIC PRESSING ON THE MAGNETIC-PROPERTIES OF MELT-SPUN SM2FE17NX MAGNETS, IEEE transactions on magnetics, 29(6), 1993, pp. 2821-2823

Authors: WENDHAUSEN PAP HU BP HANDSTEIN A ECKERT D PITSCHKE W MULLER KH
Citation: Pap. Wendhausen et al., MODIFIED SM2FE17NY PERMANENT-MAGNETS, IEEE transactions on magnetics, 29(6), 1993, pp. 2824-2826
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