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Results:
1-11
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Results: 11
Authors:
Pailloux, F
Gaboriaud, RJ
Champeaux, C
Catherinot, A
Citation: F. Pailloux et al., AFM, SEM, EDX and HRTEM study of the crystalline growth rate anisotropy-induced internal stress and surface roughness of YBaCuO thin film, MATER CHAR, 46(1), 2001, pp. 55-63
Authors:
Fert, A
Barthelemy, A
Ben Youssef, J
Contour, JP
Cros, V
De Teresa, JM
Hamzic, A
George, JM
Faini, G
Grollier, J
Jaffres, H
Le Gall, H
Montaigne, F
Pailloux, F
Petroff, F
Citation: A. Fert et al., Review of recent results on spin polarized tunneling and magnetic switching by spin injection, MAT SCI E B, 84(1-2), 2001, pp. 1-9
Authors:
Pailloux, F
Gaboriaud, RJ
Champeaux, C
Catherinot, A
Citation: F. Pailloux et al., Crystalline growth rate and microstructure in YBaCuO thin films, PHYSICA C, 351(1), 2001, pp. 9-12
Authors:
Pailloux, F
Lyonnet, R
Maurice, JL
Contour, JP
Citation: F. Pailloux et al., Twinning and lattice distortions in the epitaxy of La0.67Sr0.33MnO3 thin films on (001) SrTiO3, APPL SURF S, 177(4), 2001, pp. 263-267
Authors:
Pailloux, F
Gaboriaud, RJ
Citation: F. Pailloux et Rj. Gaboriaud, Electron diffraction (LACBED) and HRTEM Moire fringe pattern study of stress in YBaCuO thin film on MgO, J PHYS IV, 10(P6), 2000, pp. 131-135
Authors:
Gaboriaud, RJ
Pailloux, F
Pacaud, J
Renault, PO
Perriere, J
Huignard, A
Citation: Rj. Gaboriaud et al., Microstructural investigations of Y2O3 thin films deposited by laser ablation on MgO, APPL PHYS A, 71(6), 2000, pp. 675-680
Authors:
Pailloux, F
Gaboriaud, RJ
Champeaux, C
Catherinot, A
Citation: F. Pailloux et al., Epitaxial stress study by large angle convergent beam electron diffractionand high-resolution transmission electron microscopy Moire fringe pattern, MAT SCI E A, 288(2), 2000, pp. 244-247
Authors:
Pailloux, F
Gaboriaud, RJ
Citation: F. Pailloux et Rj. Gaboriaud, Stress relaxation in c(perpendicular to)-c(parallel to) YBaCuO thin films on MgO substrate studied by LACBED, THIN SOL FI, 368(1), 2000, pp. 142-146
Authors:
Gaboriaud, RJ
Pailloux, F
Guerin, P
Paumier, F
Citation: Rj. Gaboriaud et al., Yttrium oxide thin films, Y2O3, grown by ion beam sputtering on Si, J PHYS D, 33(22), 2000, pp. 2884-2889
Authors:
Gaboriaud, RJ
Pailloux, F
Citation: Rj. Gaboriaud et F. Pailloux, Laser deposition of YBaCuO thin films: stress measurements and microstructure investigations, APPL SURF S, 139, 1999, pp. 549-551
Authors:
Branchu, S
Pailloux, F
Garem, H
Rabier, J
Demenet, JL
Citation: S. Branchu et al., Partial dislocation source in InSb: A new mechanism, PHYS ST S-A, 171(1), 1999, pp. 59-65
Risultati:
1-11
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