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Results: 1-17 |
Results: 17
Reflectance spectrometry of TiO2 optical coatings on c-Si: The real data based simulation
Authors: Brunner, R Pincik, E Mikula, M Zahora, J
Citation: R. Brunner et al., Reflectance spectrometry of TiO2 optical coatings on c-Si: The real data based simulation, ACT PHYS SL, 51(1), 2001, pp. 17-26
Electrical and optical properties of copper nitride thin films prepared byreactive DC magnetron sputtering
Authors: Mikula, M Buc, D Pincik, E
Citation: M. Mikula et al., Electrical and optical properties of copper nitride thin films prepared byreactive DC magnetron sputtering, ACT PHYS SL, 51(1), 2001, pp. 35-43
Coplanar and non-coplanar x-ray reflectivity characterization of lateral W/Si multilayer gratings
Authors: Mikulik, P Jergel, M Baumbach, T Majkova, E Pincik, E Luby, S Ortega, L Tucoulou, R Hudek, P Kostic, I
Citation: P. Mikulik et al., Coplanar and non-coplanar x-ray reflectivity characterization of lateral W/Si multilayer gratings, J PHYS D, 34(10A), 2001, pp. A188-A192
Reactivity of Au with ultrathin Si layers: A photoemission study
Authors: Ivanco, J Kobayashi, H Almeida, J Margaritondo, G Pincik, E
Citation: J. Ivanco et al., Reactivity of Au with ultrathin Si layers: A photoemission study, J APPL PHYS, 90(1), 2001, pp. 345-350
Multilayer gratings for X-UV optics
Authors: Jergel, M Mikulik, P Majkova, E Pincik, E Luby, S Brunel, M Hudek, P
Citation: M. Jergel et al., Multilayer gratings for X-UV optics, ACT PHYS SL, 50(4), 2000, pp. 427-438
Low-energy argon ion beam treatment of a-Si : H/Si structure
Authors: Pincik, E Jergel, M Gmucova, K Gleskova, H Kucera, M Mullerova, J Brunel, M Mikula, M
Citation: E. Pincik et al., Low-energy argon ion beam treatment of a-Si : H/Si structure, APPL SURF S, 166(1-4), 2000, pp. 61-66
On light-related electrical properties of porous silicon/crystalline silicon structure
Authors: Pincik, E Bartos, J Jergel, M Falcony, C Bartos, P
Citation: E. Pincik et al., On light-related electrical properties of porous silicon/crystalline silicon structure, APPL SURF S, 166(1-4), 2000, pp. 67-71
Influence of the plasma pretreatment of GaAs(100) and Si(100) surfaces on the optical and structural properties of Si3N4/GaAs and a-SiGe/Si interfaces
Authors: Pincik, E Jergel, M Kucera, M van Swaaij, RACMM Ivanco, J Senderak, R Zeman, M Mullerova, J Brunel, M
Citation: E. Pincik et al., Influence of the plasma pretreatment of GaAs(100) and Si(100) surfaces on the optical and structural properties of Si3N4/GaAs and a-SiGe/Si interfaces, APPL SURF S, 166(1-4), 2000, pp. 72-76
Defect re-distribution in amorphous silicon below equilibration temperature
Authors: van Swaaij, RACMM Nadazdy, V Zeman, M Pincik, E Metselaar, JW
Citation: Racmm. Van Swaaij et al., Defect re-distribution in amorphous silicon below equilibration temperature, J NON-CRYST, 266, 2000, pp. 553-557
Spatial distribution of dangling bonds in undoped hydrogenated amorphous silicon observed by solid-state voltcoulometry
Authors: Nadazdy, V Durny, R Pincik, E Thurzo, I Kumeda, M Shimizu, T
Citation: V. Nadazdy et al., Spatial distribution of dangling bonds in undoped hydrogenated amorphous silicon observed by solid-state voltcoulometry, J NON-CRYST, 266, 2000, pp. 558-564
Very thin insulating layer formed by low-energy Ar-beam bombardment in thesurface region of undoped hydrogenated amorphous silicon
Authors: Durny, R Pincik, E Nadazdy, V Jergel, M Shimizu, J Kumeda, M Shimizu, T
Citation: R. Durny et al., Very thin insulating layer formed by low-energy Ar-beam bombardment in thesurface region of undoped hydrogenated amorphous silicon, APPL PHYS L, 77(12), 2000, pp. 1783-1785
Modification of the high-doped GaAs surface region by its exposure to 150 keV proton beam
Authors: Pincik, E Jergel, M Kucera, M Brunel, M Cicmanec, P Smatko, V
Citation: E. Pincik et al., Modification of the high-doped GaAs surface region by its exposure to 150 keV proton beam, NUCL INST B, 149(1-2), 1999, pp. 81-88
Complete optical characterization of the SiO2/Si system by spectroscopic ellipsometry, spectroscopic reflectometry and atomic force microscopy
Authors: Ohlidal, I Franta, D Pincik, E Ohlidal, M
Citation: I. Ohlidal et al., Complete optical characterization of the SiO2/Si system by spectroscopic ellipsometry, spectroscopic reflectometry and atomic force microscopy, SURF INT AN, 28(1), 1999, pp. 240-244
The metastability of porous silicon crystalline silicon structure
Authors: Pincik, E Bartos, P Jergel, M Falcony, C Bartos, J Kucera, M Kakos, J
Citation: E. Pincik et al., The metastability of porous silicon crystalline silicon structure, THIN SOL FI, 344, 1999, pp. 277-280
X-ray photoemission and photoreflectance study of Au ultrathin Si/n-GaAs Schottky contacts and hydrogen plasma treated semi-insulating GaAs surfaces
Authors: Pincik, E Ivanco, J Kucera, M Almeida, J Jergel, M Krempasky, M Margaritondo, G Brunel, M
Citation: E. Pincik et al., X-ray photoemission and photoreflectance study of Au ultrathin Si/n-GaAs Schottky contacts and hydrogen plasma treated semi-insulating GaAs surfaces, THIN SOL FI, 344, 1999, pp. 328-331
Structural characterization of lamellar multilayer gratings by x-ray reflectivity and scanning electron microscopy
Authors: Jergel, M Mikulik, P Majkova, E Luby, S Senderak, R Pincik, E Brunel, M Hudek, P Kostic, I Konecnikova, A
Citation: M. Jergel et al., Structural characterization of lamellar multilayer gratings by x-ray reflectivity and scanning electron microscopy, J PHYS D, 32(10A), 1999, pp. A220-A223
Structural characterization of a lamellar W/Si multilayer grating
Authors: Jergel, M Mikulik, P Majkova, E Luby, S Senderak, R Pincik, E Brunel, M Hudek, P Kostic, I Konecnikova, A
Citation: M. Jergel et al., Structural characterization of a lamellar W/Si multilayer grating, J APPL PHYS, 85(2), 1999, pp. 1225-1227
Risultati: 1-17 |