Authors:
Kaminska, E
Piotrowska, A
Barcz, A
Reginski, K
Dluzewski, P
Kozlowski, M
Dynowska, E
Citation: E. Kaminska et al., Study of Zn-related structural transformations at p-GaAs/Ni/Zn interfaces relative to the formation of an ohmic contact, MAT SC S PR, 4(1-3), 2001, pp. 289-291
Authors:
Papis, E
Kudla, A
Piotrowski, TT
Golaszewska, K
Kaminska, E
Piotrowska, A
Citation: E. Papis et al., Ellipsometric investigations of (100) GaSb surface under chemical etching and sulfide treatment, MAT SC S PR, 4(1-3), 2001, pp. 293-295
Authors:
Piotrowski, TT
Piotrowska, A
Kaminska, E
Szopniewski, Z
Kolesnik, S
Wrobel, J
Gierlowski, P
Lewandowski, S
Citation: Tt. Piotrowski et al., Electron beam lithography and reactive ion etching of nanometer size features in niobium films, MAT SCI E C, 15(1-2), 2001, pp. 171-173
Authors:
Papis, E
Piotrowska, A
Kaminska, E
Golaszewska, K
Jung, W
Katcki, J
Kudla, A
Piskorski, M
Piotrowski, TT
Adamczewska, J
Citation: E. Papis et al., Sulfide treatment of GaSb surface: influence on the LPE growth of InGaAsSb/AlGaAsSb heterostructures, VACUUM, 57(2), 2000, pp. 171-178
Authors:
Guziewicz, M
Piotrowska, A
Kaminska, E
Golaszewska, K
Turos, A
Mizera, E
Winiarski, A
Szade, J
Citation: M. Guziewicz et al., Characteristics of sputter-deposited TiN, ZrB2 and W2B diffusion barriers for advanced metallizations to GaAs, SOL ST ELEC, 43(6), 1999, pp. 1055-1061
Authors:
Kaminska, E
Piotrowska, A
Jasinski, J
Kozubowski, J
Barcz, A
Golaszewska, K
Bremser, MD
Davis, RF
Citation: E. Kaminska et al., Interfacial microstructure of Ni/Si-based ohmic contacts to GaN (vol 94, pg 383, 1998), ACT PHY P A, 94(5-6), 1998, pp. 857-857