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Plaza, JL
Hidalgo, P
Mendez, B
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Dieguez, E
Citation: Jl. Plaza et al., Electrical and compositional properties on Bridgman-grown Gd-doped GaSb substrates, MAT SCI E B, 81(1-3), 2001, pp. 157-160
Authors:
Hidalgo, P
Mendez, B
Piqueras, J
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Citation: P. Hidalgo et al., Study of Zn diffusion in n-type GaSb by cathodoluminescence and scanning tunneling spectroscopy, MAT SCI E B, 80(1-3), 2001, pp. 125-129
Authors:
Urbieta, A
Fernandez, P
Piqueras, J
Munoz, V
Citation: A. Urbieta et al., Scanning electron microscopy study of twins in ZnSe single crystals grown by solid-phase recrystallization, MAT SCI E B, 80(1-3), 2001, pp. 130-133
Authors:
Cremades, A
Piqueras, J
Albrecht, M
Stutzmann, M
Strunk, HP
Citation: A. Cremades et al., Study of structural defects limiting the luminescence of InGaN single quantum wells, MAT SCI E B, 80(1-3), 2001, pp. 313-317
Authors:
Garcia, JA
Fernandez, P
Remon, A
Piqueras, J
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Triboulet, R
Citation: Ja. Garcia et al., Cathodoluminescence and photoluminescence study of plastically deformed ZnTe bulk single crystals, SEMIC SCI T, 16(5), 2001, pp. 289-292
Authors:
Cremades, A
Navarro, V
Piqueras, J
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Ambacher, O
Stutzmann, M
Citation: A. Cremades et al., Inhomogeneous incorporation of In and Al in molecular beam epitaxial AlInGaN films, J APPL PHYS, 90(9), 2001, pp. 4868-4870
Citation: Mh. Zaldivar et al., Study of growth hillocks in GaN : Si films by electron beam induced current imaging, J APPL PHYS, 90(2), 2001, pp. 1058-1060
Authors:
Diaz-Guerra, C
Kurdyukov, DA
Piqueras, J
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Zamoryanskaya, MV
Citation: C. Diaz-guerra et al., Defect and nanocrystal cathodoluminescence of synthetic opals infilled with Si and Pt, J APPL PHYS, 89(5), 2001, pp. 2720-2726
Authors:
Pereira, L
Pereira, E
Gomes, H
Rodrigues, A
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Cremades, A
Piqueras, J
Citation: L. Pereira et al., Microelectrical characterisation of diamond films: an attempt to understand the structural influence on electrical transport phenomena, DIAM RELAT, 9(3-6), 2000, pp. 1061-1065
Authors:
Urbieta, A
Fernandez, P
Piqueras, J
Munoz, V
Citation: A. Urbieta et al., Scanning electron microscopy characterization of ZnSe single crystals grown by solid-phase recrystallization, MAT SCI E B, 78(2-3), 2000, pp. 105-108
Authors:
Plaza, JL
Hidalgo, P
Mendez, B
Piqueras, J
Dieguez, E
Citation: Jl. Plaza et al., Polishing, chemical etching and thermal treatment effects on surface and electrical properties of Er and Nd-doped GaSb substrates, MAT SCI E B, 71, 2000, pp. 282-287
Citation: C. Diaz-guerra et J. Piqueras, Current imaging tunneling spectroscopy characterization of YBa2Cu3O7-x andBi2Sr2CaCu2O8+x single crystals, PHYSICA C, 336(3-4), 2000, pp. 170-180
Authors:
Barbadillo, L
Hernandez, MJ
Cervera, M
Piqueras, J
Citation: L. Barbadillo et al., Amorphous SixCyN layers prepared from electron cyclotron resonance plasma enhanced chemical vapor deposition (ECR-PECVD)., B S ESP CER, 39(4), 2000, pp. 453-457
Authors:
Plaza, JL
Hidalgo, P
Piqueras, J
Dieguez, E
Citation: Jl. Plaza et al., Study of the incorporation of the Er and Nd Ions in Gallium Antimonide grown by the Bridgman method, B S ESP CER, 39(4), 2000, pp. 463-467
Authors:
Lucaya, J
Piqueras, J
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Enriquez, G
Garcia-Macias, M
Sotil, J
Citation: J. Lucaya et al., Low-dose high-resolution CT of the chest in children and young adults: Dose, cooperation, artifact incidence, and image quality, AM J ROENTG, 175(4), 2000, pp. 985-992