Authors: Jagar, S Chan, MS Wang, HM Poon, VMC Myasnikov, AM

Citation: S. Jagar et al., Characterization of MOSFETs fabricated on large-grain polysilicon on insulator, SOL ST ELEC, 45(5), 2001, pp. 743-749

Authors: Qin, M Poon, VMC Ho, SCH

Citation: M. Qin et al., Investigation of polycrystalline nickel silicide films as a gate material, J ELCHEM SO, 148(5), 2001, pp. G271-G274

Authors: Qin, M Poon, VMC

Citation: M. Qin et Vmc. Poon, Young's modulus measurement of nickel silicide film on crystal silicon by a surface profiler, J MAT SCI L, 19(24), 2000, pp. 2243-2245

Authors: Wang, HM Chan, MS Jagar, S Poon, VMC Qin, M Wang, YY Ko, PK

Citation: Hm. Wang et al., Super thin-film transistor with SOICMOS performance formed by a novel grain enhancement method, IEEE DEVICE, 47(8), 2000, pp. 1580-1586

Authors: Qin, M Poon, VMC Yuen, CY

Citation: M. Qin et al., Structure and thermal stability of Ni/Si1-xGex contacts for VLSI applications, ELECTR LETT, 36(21), 2000, pp. 1819-1821

Authors: Wang, BP Huang, ZP Sin, JKO Poon, VMC Tang, YM Wang, C Xue, KX Tong, LS

Citation: Bp. Wang et al., A novel emitter-sharpened double-gate race-track-shaped field emitter structure, IEEE ELEC D, 20(12), 1999, pp. 621-623