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Results: 1-25/50
Authors:
Franzo, G
Irrera, A
Moreira, EC
Miritello, M
Iacona, F
Sanfilippo, D
Di Stefano, G
Fallica, PG
Priolo, F
Citation: G. Franzo et al., Electroluminescence of silicon nanocrystals in MOS structures, APPL PHYS A, 74(1), 2002, pp. 1-5
Authors:
Napolitani, E
Carnera, A
Privitera, V
Priolo, F
Citation: E. Napolitani et al., Ultrashallow profiling of semiconductors by secondary ion mass spectrometry: methods and applications, MAT SC S PR, 4(1-3), 2001, pp. 55-60
Authors:
Giannazzo, F
Raineri, V
Privitera, V
Priolo, F
Citation: F. Giannazzo et al., High-resolution scanning capacitance microscopy by angle bevelling, MAT SC S PR, 4(1-3), 2001, pp. 77-80
Authors:
Fraboni, B
Gasparotto, A
Priolo, F
Scamarcio, G
Citation: B. Fraboni et al., High Fe2+/3+ trap concentration in heavily compensated implanted InP, APPL PHYS A, 73(1), 2001, pp. 35-38
Authors:
Dal Negro, L
Pavesi, L
Pucker, G
Franzo, G
Priolo, F
Citation: L. Dal Negro et al., Optical gain in silicon nanocrystals, OPT MATER, 17(1-2), 2001, pp. 41-44
Authors:
Iacona, F
Franzo, G
Vinciguerra, V
Irrera, A
Priolo, F
Citation: F. Iacona et al., Influence of the spatial arrangement on the quantum confinement propertiesof Si nanocrystals, OPT MATER, 17(1-2), 2001, pp. 51-55
Authors:
Troccoli, M
Mazzone, A
Scamarcio, G
Fraboni, B
Priolo, F
Gasparotto, A
Citation: M. Troccoli et al., Mid-infrared (3.5 mu m) electroluminescence from heavily Fe2+ ion-implanted semi-insulating InP, OPT MATER, 17(1-2), 2001, pp. 189-191
Authors:
Priolo, F
Franzo, G
Iacona, F
Pacifici, D
Vinciguerra, V
Citation: F. Priolo et al., Excitation and non-radiative de-excitation processes in Er-doped Si nanocrystals, MAT SCI E B, 81(1-3), 2001, pp. 9-15
Authors:
Scalese, S
Franzo, G
Mirabella, S
Re, M
Terrasi, A
Priolo, F
Rimini, E
Camera, A
Citation: S. Scalese et al., Si : Er : O layers grown by molecular beam epitaxy: structural, electricaland optical properties, MAT SCI E B, 81(1-3), 2001, pp. 62-66
Authors:
Gasparotto, A
Fraboni, B
Priolo, F
Enrichi, F
Mazzone, A
Scamarcio, G
Troccoli, M
Mosca, R
Citation: A. Gasparotto et al., Assessment of electrical and optical properties of heavily Fe-implanted semi-insulating InP, MAT SCI E B, 80(1-3), 2001, pp. 202-205
Authors:
Fioravanti, A
Tofi, C
Cerase, A
Priolo, F
Marcolongo, R
Citation: A. Fioravanti et al., Capillaroscopic findings in erosive and nodal osteoarthritis of the hands, CLIN RHEUMA, 20(3), 2001, pp. 174-176
Authors:
Belli, P
Costantini, M
Mirk, P
Maresca, G
Priolo, F
Marano, P
Citation: P. Belli et al., Role of color Doppler sonography in the assessment of musculoskeletal softtissue masses (vol 19, pg 823, 2000), J ULTR MED, 20(5), 2001, pp. 516-516
Authors:
Troccoli, M
Scamarcio, G
Fraboni, B
Priolo, F
Gasparotto, A
Citation: M. Troccoli et al., Deep-level electroluminescence at 3.5 mu m from semi-insulating InP layersion implanted with Fe, SEMIC SCI T, 16(1), 2001, pp. L1-L3
Authors:
Fraboni, B
Gasparotto, A
Cesca, T
Priolo, F
Scamarcio, G
Mazzone, A
Troccoli, M
Citation: B. Fraboni et al., High Fe solubility in InP by high temperature ion implantation, NUCL INST B, 178, 2001, pp. 275-278
Authors:
Franzo, G
Moreira, EC
Pacifici, D
Priolo, F
Iacona, F
Spinella, C
Citation: G. Franzo et al., Ion beam synthesis of undoped and Er-doped Si nanocrystals, NUCL INST B, 175, 2001, pp. 140-147
Authors:
Re, M
Scalese, S
Mirabella, S
Terrasi, A
Priolo, F
Rimini, E
Berti, M
Coati, A
Drigo, A
Carnera, A
De Salvador, D
Spinella, C
La Mantia, A
Citation: M. Re et al., Structural characterisation and stability of Si1-xGex/Si(100) heterostructures grown by molecular beam epitaxy, J CRYST GR, 227, 2001, pp. 749-755
Authors:
Iacona, F
Franzo, G
Moreira, EC
Priolo, F
Citation: F. Iacona et al., Silicon nanocrystals and Er3+ ions in an optical microcavity, J APPL PHYS, 89(12), 2001, pp. 8354-8356
Authors:
Priolo, F
Franzo, G
Pacifici, D
Vinciguerra, V
Iacona, F
Irrera, A
Citation: F. Priolo et al., Role of the energy transfer in the optical properties of undoped and Er-doped interacting Si nanocrystals, J APPL PHYS, 89(1), 2001, pp. 264-272
Authors:
Giannazzo, F
Priolo, F
Raineri, V
Privitera, V
Citation: F. Giannazzo et al., Two-dimensional profiling and size effects on the transient enhanced diffusion of ultralow-energy B implants in Si, APPL PHYS L, 78(5), 2001, pp. 598-600
Authors:
Schroer, E
Privitera, V
Priolo, F
Napolitani, E
Carnera, A
Citation: E. Schroer et al., Activation annealing of ultra-low-energy implanted boron in silicon: a study combining experiment and process modeling, MAT SC S PR, 3(4), 2000, pp. 303-309
Authors:
Franzo, G
Vinciguerra, V
Priolo, F
Citation: G. Franzo et al., Room-temperature luminescence from rare-earth ions implanted into Si nanocrystals, PHIL MAG B, 80(4), 2000, pp. 719-728
Authors:
Napolitani, E
Carnera, A
Storti, R
Privitera, V
Priolo, F
Mannino, G
Moffatt, S
Citation: E. Napolitani et al., Depth profiling of ultrashallow B implants in silicon using a magnetic-sector secondary ion mass spectrometry instrument, J VAC SCI B, 18(1), 2000, pp. 519-523
Authors:
Schroer, E
Privitera, V
Priolo, F
Napolitani, E
Carnera, A
Moffatt, S
Citation: E. Schroer et al., Clustering of ultra-low-energy implanted boron in silicon during activation annealing, MAT SCI E B, 71, 2000, pp. 219-223
Authors:
Franzo, G
Iacona, F
Vinciguerra, V
Priolo, F
Citation: G. Franzo et al., Enhanced rare earth luminescence in silicon nanocrystals, MAT SCI E B, 69, 2000, pp. 335-339
Authors:
Zoli, A
Priolo, F
Galossi, A
Altomonte, L
Di Gregorio, F
Cerase, A
Mirone, L
Magaro, M
Citation: A. Zoli et al., Craniocervical junction involvement in rheumatoid arthritis: A clinical and radiological study, J RHEUMATOL, 27(5), 2000, pp. 1178-1182