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Results: 1-19 |
Results: 19
Printing meets lithography: Soft approaches to high-resolution patterning (vol 45, pg 697, 2001)
Authors: Michel, B Bernard, A Bietsch, A Delamarche, E Geissler, M Juncker, D Kind, H Renault, JP Rothuizen, H Schmid, H SchmidtWinkel, P Stutz, R Wolf, H
Citation: B. Michel et al., Printing meets lithography: Soft approaches to high-resolution patterning (vol 45, pg 697, 2001), IBM J RES, 45(6), 2001, pp. 870-870
Printing meets lithography: Soft approaches to high-resolution printing
Authors: Michel, B Bernard, A Bietsch, A Delamarche, E Geissler, M Juncker, D Kind, H Renault, JP Rothuizen, H Schmid, H Schmidt-Winkel, P Stutz, R Wolf, H
Citation: B. Michel et al., Printing meets lithography: Soft approaches to high-resolution printing, IBM J RES, 45(5), 2001, pp. 697-719
Atomic force microscope cantilevers for combined thermomechanical data writing and reading
Authors: King, WP Kenny, TW Goodson, KE Cross, G Despont, M Durig, U Rothuizen, H Binnig, GK Vettiger, P
Citation: Wp. King et al., Atomic force microscope cantilevers for combined thermomechanical data writing and reading, APPL PHYS L, 78(9), 2001, pp. 1300-1302
"Millipede" - an AFM data storage system at the frontier of nanotribology
Authors: Durig, U Cross, G Despont, M Drechsler, U Haberle, W Lutwyche, MI Rothuizen, H Stutz, R Widmer, R Vettiger, P Binnig, GK King, WP Goodson, KE
Citation: U. Durig et al., "Millipede" - an AFM data storage system at the frontier of nanotribology, TRIBOL LETT, 9(1-2), 2000, pp. 25-32
VLSI-NEMS chip for parallel AFM data storage
Authors: Despont, M Brugger, J Drechsler, U Durig, U Haberle, W Lutwyche, M Rothuizen, H Stutz, R Widmer, R Binnig, G Rohrer, H Vettiger, P
Citation: M. Despont et al., VLSI-NEMS chip for parallel AFM data storage, SENS ACTU-A, 80(2), 2000, pp. 100-107
A cantilever array-based artificial nose
Authors: Baller, MK Lang, HP Fritz, J Gerber, C Gimzewski, JK Drechsler, U Rothuizen, H Despont, M Vettiger, P Battiston, FM Ramseyer, JP Fornaro, P Meyer, E Guntherodt, HJ
Citation: Mk. Baller et al., A cantilever array-based artificial nose, ULTRAMICROS, 82(1-4), 2000, pp. 1-9
Fabrication of a micromachined magnetic X/Y/Z scanner for parallel scanning probe applications
Authors: Rothuizen, H Drechsler, U Genolet, G Haberle, W Lutwyche, M Stutz, R Widmer, R Vettiger, P
Citation: H. Rothuizen et al., Fabrication of a micromachined magnetic X/Y/Z scanner for parallel scanning probe applications, MICROEL ENG, 53(1-4), 2000, pp. 509-512
Ion projection lithography for resistless patterning of thin magnetic films
Authors: Bruenger, WH Torkler, M Dzionk, C Terris, BD Folks, L Weller, D Rothuizen, H Vettiger, P Stangl, G Fallmann, W
Citation: Wh. Bruenger et al., Ion projection lithography for resistless patterning of thin magnetic films, MICROEL ENG, 53(1-4), 2000, pp. 605-608
Translating biomolecular recognition into nanomechanics
Authors: Fritz, J Baller, MK Lang, HP Rothuizen, H Vettiger, P Meyer, E Guntherodt, HJ Gerber, C Gimzewski, JK
Citation: J. Fritz et al., Translating biomolecular recognition into nanomechanics, SCIENCE, 288(5464), 2000, pp. 316-318
Patterning magnetic films by ion beam irradiation
Authors: Terris, BD Weller, D Folks, L Baglin, JEE Kellock, AJ Rothuizen, H Vettiger, P
Citation: Bd. Terris et al., Patterning magnetic films by ion beam irradiation, J APPL PHYS, 87(9), 2000, pp. 7004-7006
Highly parallel data storage system based on scanning probe arrays
Authors: Lutwyche, MI Despont, M Drechsler, U Durig, U Haberle, W Rothuizen, H Stutz, R Widmer, R Binnig, GK Vettiger, P
Citation: Mi. Lutwyche et al., Highly parallel data storage system based on scanning probe arrays, APPL PHYS L, 77(20), 2000, pp. 3299-3301
Self-aligned 3D shadow mask technique for patterning deeply recessed surfaces of micro-electro-mechanical systems devices
Authors: Brugger, J Andreoli, C Despont, M Drechsler, U Rothuizen, H Vettiger, P
Citation: J. Brugger et al., Self-aligned 3D shadow mask technique for patterning deeply recessed surfaces of micro-electro-mechanical systems devices, SENS ACTU-A, 76(1-3), 1999, pp. 329-334
Microfabricated ultrasensitive piezoresistive cantilevers for torque magnetometry
Authors: Brugger, J Despont, M Rossel, C Rothuizen, H Vettiger, P Willemin, M
Citation: J. Brugger et al., Microfabricated ultrasensitive piezoresistive cantilevers for torque magnetometry, SENS ACTU-A, 73(3), 1999, pp. 235-242
5X5 2D AFM cantilever arrays a first step towards a Terabit storage device
Authors: Lutwyche, M Andreoli, C Binnig, G Brugger, J Drechsler, U Haberle, W Rohrer, H Rothuizen, H Vettiger, P Yaralioglu, G Quate, C
Citation: M. Lutwyche et al., 5X5 2D AFM cantilever arrays a first step towards a Terabit storage device, SENS ACTU-A, 73(1-2), 1999, pp. 89-94
Ultrahigh density, high-data-rate NEMS-based AFM data storage system
Authors: Vettiger, P Brugger, J Despont, M Drechsler, U Durig, U Haberle, W Lutwyche, M Rothuizen, H Stutz, R Widmer, R Binnig, G
Citation: P. Vettiger et al., Ultrahigh density, high-data-rate NEMS-based AFM data storage system, MICROEL ENG, 46(1-4), 1999, pp. 11-17
Ion-beam patterning of magnetic films using stencil masks
Authors: Terris, BD Folks, L Weller, D Baglin, JEE Kellock, AJ Rothuizen, H Vettiger, P
Citation: Bd. Terris et al., Ion-beam patterning of magnetic films using stencil masks, APPL PHYS L, 75(3), 1999, pp. 403-405
Spatial impulse response of lithographic infrared antennas
Authors: Fumeaux, C Boreman, GD Herrmann, W Kneubuhl, FK Rothuizen, H
Citation: C. Fumeaux et al., Spatial impulse response of lithographic infrared antennas, APPL OPTICS, 38(1), 1999, pp. 37-46
Accuracy and efficiency in election beam proximity effect correction
Authors: Wind, SJ Gerber, PD Rothuizen, H
Citation: Sj. Wind et al., Accuracy and efficiency in election beam proximity effect correction, J VAC SCI B, 16(6), 1998, pp. 3262-3268
Tunable polarization response of a planar asymmetric-spiral infrared antenna
Authors: Boreman, GD Fumeaux, C Herrmann, W Kneubuhl, FK Rothuizen, H
Citation: Gd. Boreman et al., Tunable polarization response of a planar asymmetric-spiral infrared antenna, OPTICS LETT, 23(24), 1998, pp. 1912-1914
Risultati: 1-19 |