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MEYERHEIM HL
JEDRECY N
SAUVAGESIMKIN M
PINCHAUX R
Citation: Hl. Meyerheim et al., SURFACE X-RAY-DIFFRACTION ON K SI(001)(2X1) AND CS/SI(001)(2X1)/, Physical review. B, Condensed matter, 58(4), 1998, pp. 2118-2125
Authors:
GIANNINI C
TAPFER L
SAUVAGESIMKIN M
GARREAU Y
JEDRECY N
VERON MB
PINCHAUX R
BURGHARD M
ROTH S
Citation: C. Giannini et al., X-RAY SPECULAR REFLECTIVITY AND GRAZING-INCIDENCE X-RAY-DIFFRACTION OF NEW LANGMUIR-BLODGETT MULTILAYERS, Nuovo cimento della Societa italiana di fisica. D, Condensed matter,atomic, molecular and chemical physics, biophysics, 19(2-4), 1997, pp. 411-417
Authors:
ETGENS VH
RIBEIROTEIXEIRA RM
MORS PM
VERON MB
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SAUVAGESIMKIN M
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Citation: Vh. Etgens et al., 2-LAYER BEHAVIOR DURING LOW-ENERGY ION ABLATION OF CDTE(001) STUDIED BY IN-SITU X-RAY-DIFFRACTION AND BY MONTE-CARLO SIMULATION, Europhysics letters, 36(4), 1996, pp. 271-276
Authors:
SAUVAGESIMKIN M
GARREAU Y
PINCHAUX R
CAVANNA A
VERON MB
JEDRECY N
LANDESMAN JP
NAGLE J
Citation: M. Sauvagesimkin et al., RECONSTRUCTION AND CHEMICAL ORDERING AT THE SURFACE OF STRAINED (IN, GA) AS EPILAYERS, Applied surface science, 104, 1996, pp. 646-651
Authors:
GARREAU Y
SAUVAGESIMKIN M
JEDRECY N
PINCHAUX R
VERON MB
Citation: Y. Garreau et al., ATOMIC-STRUCTURE AND FAULTED BOUNDARIES IN THE GAAS(001) BETA(2X4) SURFACE AS DERIVED FROM X-RAY-DIFFRACTION AND LINE-SHAPE ANALYSIS, Physical review. B, Condensed matter, 54(24), 1996, pp. 17638-17646
Authors:
BELLAICHE L
KUNC K
SAUVAGESIMKIN M
GARREAU Y
PINCHAUX R
Citation: L. Bellaiche et al., LOCAL ASPECTS OF THE AS-STABILIZED 2X3 RECONSTRUCTED (001) SURFACE OFSTRAINED INXGA1-XAS ALLOYS - A FIRST-PRINCIPLES STUDY, Physical review. B, Condensed matter, 53(11), 1996, pp. 7417-7420
Authors:
GIANNINI C
TAPFER L
SAUVAGESIMKIN M
GARREAU Y
JEDRECY N
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Citation: C. Giannini et al., MOLECULAR PACKING IN NEW LANGMUIR-BLODGETT SYSTEMS INVESTIGATED BY X-RAY SPECULAR REFLECTIVITY AND GRAZING-INCIDENCE X-RAY-DIFFRACTION, Thin solid films, 288(1-2), 1996, pp. 272-278
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ETGENS VH
SAUVAGESIMKIN M
TATARENKO S
DAUDIN B
BRUNLECUNFF D
Citation: Mb. Veron et al., RECONSTRUCTION AND STOICHIOMETRY OF CDTE(001) SURFACES - A GRAZING-INCIDENCE X-RAY-DIFFRACTION AND REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION STUDY, Journal of crystal growth, 159(1-4), 1996, pp. 694-702
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RODRIGUES WN
ETGENS VH
SAUVAGESIMKIN M
ROSSI G
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PINCHAUX R
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Citation: Wn. Rodrigues et al., HETEROEPITAXIAL GROWTH OF INAS ON GSAS(100) MEDIATED BY TE AT THE INTERFACE, Solid state communications, 95(12), 1995, pp. 873-877
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PINCHAUX R
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NAGLE J
Citation: M. Sauvagesimkin et al., COMMENSURATE AND INCOMMENSURATE PHASES AT RECONSTRUCTED (IN,GA)AS(001) SURFACES - X-RAY-DIFFRACTION EVIDENCE FOR A COMPOSITION LOCK-IN, Physical review letters, 75(19), 1995, pp. 3485-3488
Authors:
PONCEY C
ROCHET F
DUFOUR G
ROULET H
RODRIGUES WN
SAUVAGESIMKIN M
BOULLIARD JC
SIROTTI F
PANACCIONE G
Citation: C. Poncey et al., A SYNCHROTRON SI2P AND AS3D CORE-LEVEL STUDY OF THE AS-TERMINATED SI(001) SURFACE OXIDATION, Journal of non-crystalline solids, 187, 1995, pp. 40-44
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SAUVAGESIMKIN M
ETGENS VH
TATARENKO S
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Citation: Mb. Veron et al., ATOMIC-STRUCTURE OF THE CDTE(001) C(2X2) RECONSTRUCTED SURFACE - A GRAZING-INCIDENCE X-RAY-DIFFRACTION STUDY, Applied physics letters, 67(26), 1995, pp. 3957-3959
Authors:
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MARIANI C
JEDRECY N
PINCHAUX R
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SAUVAGESIMKIN M
Citation: Mg. Betti et al., EPITAXIAL CONTINUED-LAYER STRUCTURE OF SB ON GAAS(110) AS OBSERVED BYGRAZING-INCIDENCE X-RAY-DIFFRACTION, Physical review. B, Condensed matter, 50(19), 1994, pp. 14336-14339
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RUOCCO A
JEDRECY N
PINCHAUX R
SAUVAGESIMKIN M
WALDHAUER A
BETTI MG
MARIANI C
Citation: A. Ruocco et al., STRUCTURAL-ANALYSIS OF THE (1X1)-BI GAAS(110) INTERFACE/, Physical review. B, Condensed matter, 50(11), 1994, pp. 8004-8007
Authors:
JEDRECY N
WALDHAUER A
SAUVAGESIMKIN M
PINCHAUX R
ZHENG Y
Citation: N. Jedrecy et al., STRUCTURAL CHARACTERIZATION OF EPITAXIAL ALPHA-DERIVED FESI2 ON SI(111), Physical review. B, Condensed matter, 49(7), 1994, pp. 4725-4730
Authors:
ETGENS VH
SAUVAGESIMKIN M
PINCHAUX R
MASSIES J
JEDRECY N
WALDHAUER A
GREISER N
Citation: Vh. Etgens et al., IN-SITU MONITORING OF THE C(4X4) TO THE 2X4 SURFACE PHASE-TRANSFORMATION ON GAAS(001) BY GRAZING-INCIDENCE X-RAY-DIFFRACTION, Surface science, 320(3), 1994, pp. 252-258
Authors:
ETGENS VH
SAUVAGESIMKIN M
PINCHAUX R
MASSIES J
JEDRECY N
WALDHAUER A
TATARENKO S
JOUNEAU PH
Citation: Vh. Etgens et al., ZNTE GAAS(001) - GROWTH MODE AND STRAIN EVOLUTION DURING THE EARLY STAGES OF MOLECULAR-BEAM-EPITAXY HETEROEPITAXIAL GROWTH/, Physical review. B, Condensed matter, 47(16), 1993, pp. 10607-10612