AAAAAA

   
Results: 1-19 |
Results: 19

Authors: GRANGER E SAVARIA Y LAVOIE P CANTIN MA
Citation: E. Granger et al., A COMPARISON OF SELF-ORGANIZING NEURAL NETWORKS FOR FAST CLUSTERING OF RADAR PULSES, Signal processing, 64(3), 1998, pp. 249-269

Authors: NEKILI M BOIS G SAVARIA Y
Citation: M. Nekili et al., PIPELINED H-TREES FOR HIGH-SPEED CLOCKING OF LARGE INTEGRATED SYSTEMSIN PRESENCE OF PROCESS VARIATIONS, IEEE transactions on very large scale integration (VLSI) systems, 5(2), 1997, pp. 161-174

Authors: BELABBES NE GUTERMAN AJ SAVARIA Y DAGENAIS M
Citation: Ne. Belabbes et al., RATIOED VOTER CIRCUIT FOR TESTING AND FAULT-TOLERANCE IN VLSI PROCESSING ARRAYS, IEEE transactions on circuits and systems. 1, Fundamental theory andapplications, 43(2), 1996, pp. 143-152

Authors: STAMAND R SAWAN M SAVARIA Y
Citation: R. Stamand et al., DESIGN AND OPTIMIZATION OF A LOW DC OFFSET CMOS CURRENT-SOURCE DEDICATED TO IMPLANTABLE MINIATURIZED STIMULATORS, Analog integrated circuits and signal processing, 11(1), 1996, pp. 47-61

Authors: BELHAOUANE A SAVARIA Y KAMINSKA B MASSICOTTE D
Citation: A. Belhaouane et al., RECONSTRUCTION METHOD FOR JITTER TOLERANT DATA-ACQUISITION SYSTEM, JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 9(1-2), 1996, pp. 177-185

Authors: ABDERRAHMAN A SAVARIA Y KAMINSKA B
Citation: A. Abderrahman et al., ANALYSIS, ESTIMATION AND REDUCTION OF SIM ULTANEOUS SWITCHING NOISE, Canadian journal of electrical and computer engineering, 21(4), 1996, pp. 133-143

Authors: SAVARIA Y THIBEAULT C IVANOV A
Citation: Y. Savaria et al., IEEE VLSI TEST SYMPOSIUM - MEETING THE QUALITY CHALLENGE, IEEE design & test of computers, 13(3), 1996, pp. 110-112

Authors: BLAQUIERE Y DAGENAIS M SAVARIA Y
Citation: Y. Blaquiere et al., TIMING ANALYSIS SPEED-UP USING A HIERARCHICAL AND A MULTIMODE APPROACH, IEEE transactions on computer-aided design of integrated circuits and systems, 15(2), 1996, pp. 244-255

Authors: BELZILE J SAVARIA Y HACCOUN D CHALIFOUX M
Citation: J. Belzile et al., BOUNDS ON THE PERFORMANCE OF PARTIAL SELECTION NETWORKS, IEEE transactions on communications, 43(2-4), 1995, pp. 1800-1809

Authors: BLAQUIERE T GAGNE G SAVARIA Y EVEQUOZ C
Citation: T. Blaquiere et al., A NEW EFFICIENT ALGORITHMIC-BASED SEU TOLERANT SYSTEM ARCHITECTURE, IEEE transactions on nuclear science, 42(6), 1995, pp. 1599-1606

Authors: BARWICZ A MASSICOTTE D SAVARIA Y PANGO PA MORAWSKI RZ
Citation: A. Barwicz et al., AN APPLICATION-SPECIFIC PROCESSOR DEDICATED TO KALMAN-FILTER-BASED CORRECTION OF SPECTROMETRIC DATA, IEEE transactions on instrumentation and measurement, 44(3), 1995, pp. 720-724

Authors: THIBEAULT C SAVARIA Y HOULE JL
Citation: C. Thibeault et al., EQUIVALENCE PROOFS OF SOME YIELD MODELING METHODS FOR DEFECT-TOLERANTINTEGRATED-CIRCUITS, I.E.E.E. transactions on computers, 44(5), 1995, pp. 724-728

Authors: SOUFI M SAVARIA Y DARLAY F KAMINSKA B
Citation: M. Soufi et al., PRODUCING RELIABLE INITIALIZATION AND TEST OF SEQUENTIAL-CIRCUITS WITH PSEUDORANDOM VECTORS, I.E.E.E. transactions on computers, 44(10), 1995, pp. 1251-1256

Authors: AUDET D SAVARIA Y
Citation: D. Audet et Y. Savaria, AN ARCHITECTURAL APPROACH FOR INCREASING CLOCK FREQUENCY AND COMMUNICATION SPEED IN MONOLITHIC WSI SYSTEMS, IEEE transactions on components, packaging, and manufacturing technology. Part B, Advanced packaging, 17(3), 1994, pp. 362-368

Authors: BELANGER N HACCOUN D SAVARIA Y
Citation: N. Belanger et al., A MULTIPROCESSOR ARCHITECTURE FOR MULTIPLE PATH STACK SEQUENTIAL DECODERS, IEEE transactions on communications, 42(2-4), 1994, pp. 951-957

Authors: LAVOIE P HACCOUN D SAVARIA Y
Citation: P. Lavoie et al., A SYSTOLIC ARCHITECTURE FOR FAST STACK SEQUENTIAL DECODERS, IEEE transactions on communications, 42(2-4), 1994, pp. 324-335

Authors: BARWICZ A MASSICOTTE D SAVARIA Y SANTERRE MA MORAWSKI RZ
Citation: A. Barwicz et al., AN INTEGRATED STRUCTURE FOR KALMAN-FILTER-BASED MEASURAND RECONSTRUCTION, IEEE transactions on instrumentation and measurement, 43(3), 1994, pp. 403-410

Authors: THIBEAULT C SAVARIA Y HOULE JL
Citation: C. Thibeault et al., A FAST METHOD TO EVALUATE THE OPTIMUM NUMBER OF SPARES IN DEFECT-TOLERANT INTEGRATED-CIRCUITS, I.E.E.E. transactions on computers, 43(6), 1994, pp. 687-697

Authors: YOUSSEF M SAVARIA Y KAMINSKA B
Citation: M. Youssef et al., METHODOLOGY FOR EFFICIENTLY INSERTING AND CONDENSING TEST POINTS, IEE proceedings. Part E. Computers and digital techniques, 140(3), 1993, pp. 154-160
Risultati: 1-19 |