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Results: 1-23 |

Results: 23

ATOMISTIC STUDY OF THE (001), 90-DEGREES TWIST BOUNDARY IN SILICON

Authors: BELOV AY CONRAD D SCHEERSCHMIDT K GOSELE U

Citation: Ay. Belov et al., ATOMISTIC STUDY OF THE (001), 90-DEGREES TWIST BOUNDARY IN SILICON, Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties, 77(1), 1998, pp. 55-65

EMPIRICAL BOND-ORDER POTENTIAL FOR SEMICONDUCTORS

Authors: CONRAD D SCHEERSCHMIDT K

Citation: D. Conrad et K. Scheerschmidt, EMPIRICAL BOND-ORDER POTENTIAL FOR SEMICONDUCTORS, Physical review. B, Condensed matter, 58(8), 1998, pp. 4538-4542

MOLECULAR-DYNAMICS INVESTIGATIONS OF SILVER DIFFUSION IN GLASS

Authors: TIMPEL D SCHEERSCHMIDT K

Citation: D. Timpel et K. Scheerschmidt, MOLECULAR-DYNAMICS INVESTIGATIONS OF SILVER DIFFUSION IN GLASS, Journal of non-crystalline solids, 234, 1998, pp. 245-251

RETRIEVAL OF OBJECT INFORMATION BY INVERSE PROBLEMS IN ELECTRON-DIFFRACTION

Authors: SCHEERSCHMIDT K

Citation: K. Scheerschmidt, RETRIEVAL OF OBJECT INFORMATION BY INVERSE PROBLEMS IN ELECTRON-DIFFRACTION, Journal of Microscopy, 190, 1998, pp. 238-248

MOLECULAR-DYNAMICS MODELING OF SILICON-WAFER BONDING

Authors: SCHEERSCHMIDT K CONRAD D BELOV A GOSELE U

Citation: K. Scheerschmidt et al., MOLECULAR-DYNAMICS MODELING OF SILICON-WAFER BONDING, Computational materials science, 9(1-2), 1997, pp. 108-115

DIRECT PARAMETER AND OBJECT CONSTRUCTION FROM OBJECT WAVES DETERMINEDBY ELECTRON HOLOGRAPHY

Authors: SCHEERSCHMIDT K

Citation: K. Scheerschmidt, DIRECT PARAMETER AND OBJECT CONSTRUCTION FROM OBJECT WAVES DETERMINEDBY ELECTRON HOLOGRAPHY, European journal of cell biology, 74, 1997, pp. 8-8

MOLECULAR-DYNAMICS AND ELECTRON-MICROSCOP Y AT THE INTERFACES OF BONDED SILICON-WAFERS

Authors: SCHEERSCHMIDT K CONRAD D BELOV A GOSELE U

Citation: K. Scheerschmidt et al., MOLECULAR-DYNAMICS AND ELECTRON-MICROSCOP Y AT THE INTERFACES OF BONDED SILICON-WAFERS, European journal of cell biology, 74, 1997, pp. 130-130

SILVER CLUSTERING IN SODIUM-SILICATE GLASSES - A MOLECULAR-DYNAMICS STUDY

Authors: TIMPEL D SCHEERSCHMIDT K GAROFALINI SH

Citation: D. Timpel et al., SILVER CLUSTERING IN SODIUM-SILICATE GLASSES - A MOLECULAR-DYNAMICS STUDY, Journal of non-crystalline solids, 221(2-3), 1997, pp. 187-198

MOLECULAR-DYNAMICS STUDIES OF INTERACTING HYDROGENATED SI(001) SURFACES

Authors: CONRAD D SCHEERSCHMIDT K GOSELE U

Citation: D. Conrad et al., MOLECULAR-DYNAMICS STUDIES OF INTERACTING HYDROGENATED SI(001) SURFACES, Applied physics letters, 71(16), 1997, pp. 2307-2309

MOLECULAR-DYNAMICS SIMULATIONS OF SILICON-WAFER BONDING

Authors: CONRAD D SCHEERSCHMIDT K GOSELE U

Citation: D. Conrad et al., MOLECULAR-DYNAMICS SIMULATIONS OF SILICON-WAFER BONDING, Applied physics A: Materials science & processing, 62(1), 1996, pp. 7-12

MOLECULAR-DYNAMICS SIMULATIONS TO INVESTIGATE WAFER BONDED INTERFACES

Authors: SCHEERSCHMIDT K CONRAD D GOSELE U

Citation: K. Scheerschmidt et al., MOLECULAR-DYNAMICS SIMULATIONS TO INVESTIGATE WAFER BONDED INTERFACES, Computational materials science, 7(1-2), 1996, pp. 40-47

HREM SIMULATIONS OF PARTICLES AND INTERFACES REFINED BY MOLECULAR-DYNAMICS RELAXATIONS

Authors: TIMPEL D SCHEERSCHMIDT K RUVIMOV S

Citation: D. Timpel et al., HREM SIMULATIONS OF PARTICLES AND INTERFACES REFINED BY MOLECULAR-DYNAMICS RELAXATIONS, Materials science & engineering. B, Solid-state materials for advanced technology, 37(1-3), 1996, pp. 101-107

CHARACTERIZATION OF INTERFACE STRUCTURES IN NANOCRYSTALLINE GERMANIUMBY MEANS OF HIGH-RESOLUTION ELECTRON-MICROSCOPY AND MOLECULAR-DYNAMICS SIMULATIONS

Authors: NEUMANN W HOFMEISTER H CONRAD D SCHEERSCHMIDT K RUVIMOV S

Citation: W. Neumann et al., CHARACTERIZATION OF INTERFACE STRUCTURES IN NANOCRYSTALLINE GERMANIUMBY MEANS OF HIGH-RESOLUTION ELECTRON-MICROSCOPY AND MOLECULAR-DYNAMICS SIMULATIONS, Zeitschrift fur Kristallographie, 211(3), 1996, pp. 147-152

STRUCTURAL CHARACTERIZATION OF (IN,GA)AS QUANTUM DOTS IN A GAAS MATRIX

Authors: RUVIMOV S WERNER P SCHEERSCHMIDT K GOSELE U HEYDENREICH J RICHTER U LEDENTSOV NN GRUNDMANN M BIMBERG D USTINOV VM EGOROV AY KOPEV PS ALFEROV ZI

Citation: S. Ruvimov et al., STRUCTURAL CHARACTERIZATION OF (IN,GA)AS QUANTUM DOTS IN A GAAS MATRIX, Physical review. B, Condensed matter, 51(20), 1995, pp. 14766-14769

HREM SIMULATIONS OF AG PARTICLES IN SODIUM-SILICATE GLASSES REFINED BY MOLECULAR DYNAMIC RELAXATIONS

Authors: TIMPEL D SCHEERSCHMIDT K

Citation: D. Timpel et K. Scheerschmidt, HREM SIMULATIONS OF AG PARTICLES IN SODIUM-SILICATE GLASSES REFINED BY MOLECULAR DYNAMIC RELAXATIONS, Physica status solidi. a, Applied research, 150(1), 1995, pp. 51-63

TEM CHARACTERIZATION OF THE INTERFACE QUALITY OF MOVPE GROWN STRAINEDINGAAS GAAS HETEROSTRUCTURES/

Authors: HOPNER A SEITZ H RECHENBERG I BUGGE F PROCOP M SCHEERSCHMIDT K QUEISSER HJ

Citation: A. Hopner et al., TEM CHARACTERIZATION OF THE INTERFACE QUALITY OF MOVPE GROWN STRAINEDINGAAS GAAS HETEROSTRUCTURES/, Physica status solidi. a, Applied research, 150(1), 1995, pp. 427-437

TEM HREM VISUALIZATION OF NM-SCALE COHERENT INAS ISLANDS (QUANTUM DOTS) IN A GAAS MATRIX/

Authors: RUVIMOV S SCHEERSCHMIDT K

Citation: S. Ruvimov et K. Scheerschmidt, TEM HREM VISUALIZATION OF NM-SCALE COHERENT INAS ISLANDS (QUANTUM DOTS) IN A GAAS MATRIX/, Physica status solidi. a, Applied research, 150(1), 1995, pp. 471-478

COMPUTER-GENERATED RANDOM NETWORK MODELS OF ION-EXCHANGED GLASSES

Authors: DUBIEL M SCHMITZ R SCHEERSCHMIDT K HOFMEISTER H

Citation: M. Dubiel et al., COMPUTER-GENERATED RANDOM NETWORK MODELS OF ION-EXCHANGED GLASSES, Journal of non-crystalline solids, 193, 1995, pp. 632-635

HREM STRUCTURE CHARACTERIZATION OF INTERFACES IN SEMICONDUCTING MULTILAYERS USING MOLECULAR-DYNAMICS-SUPPORTED IMAGE INTERPRETATION

Authors: SCHEERSCHMIDT K RUVIMOV S WERNER P HOPNER A HEYDENREICH J

Citation: K. Scheerschmidt et al., HREM STRUCTURE CHARACTERIZATION OF INTERFACES IN SEMICONDUCTING MULTILAYERS USING MOLECULAR-DYNAMICS-SUPPORTED IMAGE INTERPRETATION, Journal of Microscopy, 179, 1995, pp. 214-228

SELF-PROPAGATING ROOM-TEMPERATURE SILICON-WAFER BONDING IN ULTRAHIGH-VACUUM

Authors: GOSELE U STENZEL H MARTINI T STEINKIRCHNER J CONRAD D SCHEERSCHMIDT K

Citation: U. Gosele et al., SELF-PROPAGATING ROOM-TEMPERATURE SILICON-WAFER BONDING IN ULTRAHIGH-VACUUM, Applied physics letters, 67(24), 1995, pp. 3614-3616

TEM STUDY OF THE RAPID DEGRADATION OF PUMP LASER-DIODES

Authors: RUVIMOV S KLEIN A RICHTER U RECHENBERG I SCHEERSCHMIDT K HEYDENREICH J

Citation: S. Ruvimov et al., TEM STUDY OF THE RAPID DEGRADATION OF PUMP LASER-DIODES, Physica status solidi. a, Applied research, 146(1), 1994, pp. 415-424

RETRIEVAL OF OBJECT INFORMATION FROM ELECTRON-DIFFRACTION .1. THEORETICAL PRELIMINARIES

Authors: SCHEERSCHMIDT K KNOLL F

Citation: K. Scheerschmidt et F. Knoll, RETRIEVAL OF OBJECT INFORMATION FROM ELECTRON-DIFFRACTION .1. THEORETICAL PRELIMINARIES, Physica status solidi. a, Applied research, 146(1), 1994, pp. 491-502

BURGERS VECTOR DETERMINATION IN TEM BY USING THE DISLOCATION PARITY ANALYSIS

Authors: RUVIMOV SS SCHEERSCHMIDT K

Citation: Ss. Ruvimov et K. Scheerschmidt, BURGERS VECTOR DETERMINATION IN TEM BY USING THE DISLOCATION PARITY ANALYSIS, Physica status solidi. a, Applied research, 141(2), 1994, pp. 269-284

Risultati: 1-23 |