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Results:
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Results: 16
Authors:
MAHL S
NEUMANN M
SCHLETT V
BAALMANN A
Citation: S. Mahl et al., SOME ASPECTS OF THE FITTING OF XPS CORE SPECTRA OF POLYMERS, Surface and interface analysis, 26(3), 1998, pp. 204-212
Authors:
DIECKHOFF S
HOPER R
SCHLETT V
GESANG T
POSSART W
HENNEMANN OD
GUNSTER J
KEMPTER V
Citation: S. Dieckhoff et al., CHARACTERIZATION OF VAPOR-PHASE DEPOSITED ORGANIC-MOLECULES ON SILICON SURFACES, Fresenius' journal of analytical chemistry, 358(1-2), 1997, pp. 258-262
Authors:
MAHL S
NEUMANN M
DIECKHOFF S
SCHLETT V
BAALMANN A
Citation: S. Mahl et al., CHARACTERIZATION OF THE VG ESCALAB INSTRUMENTAL BROADENING FUNCTIONS BY XPS MEASUREMENTS AT THE FERMI-EDGE OF SILVER, Journal of electron spectroscopy and related phenomena, 85(3), 1997, pp. 197-203
Authors:
HARTWIG A
VITR G
SCHLETT V
Citation: A. Hartwig et al., TREATMENT OF AN EPOXY-RESIN BY EXIMER LASER-RADIATION, International journal of adhesion and adhesives, 17(4), 1997, pp. 373-377
SPECTRAL NOISE DISTORTION IN PHOTOELECTRON-SPECTROSCOPY BY ACQUIRING DATA WITH MULTIDETECTOR SYSTEMS
Authors:
MAHL S
NEUMANN M
SCHLETT V
BAALMANN A
Citation: S. Mahl et al., SPECTRAL NOISE DISTORTION IN PHOTOELECTRON-SPECTROSCOPY BY ACQUIRING DATA WITH MULTIDETECTOR SYSTEMS, Surface and interface analysis, 25(10), 1997, pp. 823-826
Authors:
DIECKHOFF S
SCHLETT V
POSSART W
HENNEMANN OD
GUNSTER J
KEMPTER V
Citation: S. Dieckhoff et al., CHARACTERIZATION OF TRIAZINE DERIVATIVES ON SILICON-WAFERS STUDIED BYPHOTOELECTRON-SPECTROSCOPY (XPS, UPS) AND METASTABLE IMPACT ELECTRON-SPECTROSCOPY (MIES), Applied surface science, 103(3), 1996, pp. 221-229
Authors:
MAHL S
LACHNITT J
NIEMANN R
NEUMANN M
BAALMANN A
KRUSE A
SCHLETT V
Citation: S. Mahl et al., INNOVATIVE METHODS FOR A DECONVOLUTION OF XPS SPECTRA FROM PLASMA-OXIDIZED POLYETHYLENE, Surface and interface analysis, 24(6), 1996, pp. 405-410
Authors:
SCHLETT V
BUSCH WB
Citation: V. Schlett et Wb. Busch, AES INVESTIGATIONS OF THE HOT CRACKING OF AN ELECTRON-BEAM WELDED NICKEL-BASE ALLOY FOR TURBINE DISKS, Fresenius' journal of analytical chemistry, 353(5-8), 1995, pp. 544-547
Authors:
DIECKHOFF S
SCHLETT V
POSSART W
HENNEMANN OD
Citation: S. Dieckhoff et al., XPS STUDIES OF THIN POLYCYANURATE FILMS ON SILICON-WAFERS, Fresenius' journal of analytical chemistry, 353(3-4), 1995, pp. 278-281
Authors:
GESANG T
HOPER R
DIECKHOFF S
SCHLETT V
POSSART W
HENNEMANN OD
Citation: T. Gesang et al., ORGANIC FILM FORMATION INVESTIGATED BY ATOMIC-FORCE MICROSCOPY ON THENANOMETER-SCALE, Thin solid films, 264(2), 1995, pp. 194-204
Authors:
POSSART W
SCHLETT V
Citation: W. Possart et V. Schlett, XPS OF THE INTERPHASE BETWEEN PMMA AND METALS - A STUDY OF DEGRADATION AND INTERACTION, The Journal of adhesion, 48(1-4), 1995, pp. 25-46
Authors:
FRIEDRICH S
SCHLETT V
Citation: S. Friedrich et V. Schlett, AES CHARACTERIZATION OF PASSIVE LAYERS ON GASOXINITRIDED STEEL SURFACES AFTER A CORROSIVE ATTACK IN A NACL SOLUTION, Fresenius' journal of analytical chemistry, 349(1-3), 1994, pp. 141-143
Authors:
DIECKHOFF S
SCHLETT V
POSSART W
HENNEMANN OD
Citation: S. Dieckhoff et al., ADSORPTION AND GROWTH OF POLYCYANURTATE FILMS ON SILICON-WAFERS AND ALUMINUM SUBSTRATES, Le Vide, les couches minces, (272), 1994, pp. 430-433
Authors:
KRANZ G
LUSCHEN R
GESANG T
SCHLETT V
HENNEMANN OD
STOHRER WD
Citation: G. Kranz et al., THE EFFECT OF FLUORINATION ON THE SURFACE CHARACTERISTICS AND ADHESIVE PROPERTIES OF POLYETHYLENE AND POLYPROPYLENE, International journal of adhesion and adhesives, 14(4), 1994, pp. 243-253
Authors:
KRUSE A
SCHLETT V
BAALMANN A
HENNECKE M
Citation: A. Kruse et al., STRUCTURAL INVESTIGATIONS OF ELECTRICAL CONDUCTING PLASMA-POLYMERIZEDFILMS FROM 2-IODOTHIOPHENE, Fresenius' journal of analytical chemistry, 346(1-3), 1993, pp. 284-289
Authors:
KRUSE A
BAALMANN A
BUDDEN W
SCHLETT V
HENNECKE M
Citation: A. Kruse et al., THIN CONDUCTIVE COATINGS FORMED BY PLASMA POLYMERIZATION OF 2-IODOTHIOPHENE, Surface & coatings technology, 59(1-3), 1993, pp. 359-364
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